Invention Grant
- Patent Title: Mass spectrometer, sampling probe, and analysis method
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Application No.: US16814036Application Date: 2020-03-10
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Publication No.: US10930488B2Publication Date: 2021-02-23
- Inventor: Osamu Furuhashi , Tomomi Tamura , Kiyoshi Ogawa
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- Priority: JPJP2019-075777 20190411
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/08 ; H01J49/04

Abstract:
A mass spectrometer, includes: a sampling probe that irradiates a specimen disposed in the atmosphere with an electron and obtains a sample separated from the specimen; and a measurement unit that performs mass spectrometry of the sample obtained by the sampling probe, wherein the sampling probe comprises: a casing having an opening which is opened to the atmosphere and an outlet through which the sample is discharged to the measurement unit; and a surface emission type electron emission element housed in the casing such that an electron emission surface thereof opposes to the opening.
Public/Granted literature
- US20200328071A1 MASS SPECTROMETER, SAMPLING PROBE, AND ANALYSIS METHOD Public/Granted day:2020-10-15
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