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公开(公告)号：US10541125B2
公开(公告)日：2020-01-21
申请号：US16226003
申请日：2018-12-19
Applicant: SHIMADZU CORPORATION
Inventor： Hiroyuki Miura , Hideaki Izumi , Kiyoshi Ogawa
Abstract: A microchannel plate (MCP) 41 in an ion detection section 4 multiplies electrons. An anode 42 detects those electrons and produces a current signal. An amplifier 44 converts this signal into a voltage signal. A low-pass filter 5A acting as a smoothing section 5 is located at the output end of the amplifier 44. A waveform-shaping time adjuster 6 adjusts the time constant of the low-pass filter 5A beforehand according to the response time of the MCP 41, mass-to-charge ratio of an ion species to be subjected to the measurement, and duration of the spread of the ion species which depends on device-specific parameters. A plurality of peaks which sequentially appear in the detection signal corresponding to one ion species are thereby smoothed into a single broad peak. Thus, the distinguishability between signal waves and noise components is improved.
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2.发明授权Sample preparation device to form a matrix film for matrix assisted laser desorption/ionization method 有权用于形成基质辅助激光解吸/电离方法的基质膜的样品制备装置公开(公告)号：US09334569B2
公开(公告)日：2016-05-10
申请号：US13674745
申请日：2012-11-12
Applicant: SHIMADZU CORPORATION
Inventor： Kazuteru Takahashi , Kiyoshi Ogawa
CPC classification number: C23C16/52 , C23C14/12 , C23C14/24 , C23C14/54 , C23C14/547 , C23C14/548 , G01B11/0625
Abstract: To provide a sample preparation device that is appropriate for the formation of a matrix film for MALDI through vacuum vapor deposition. A sample preparation device is provided with: a sample substrate support unit 23 for supporting a substance to be analyzed on a substrate S so that the substance faces a vapor deposition source 21 for a matrix substance J; a light amount measurement unit for irradiating a matrix film vapor deposited on the substrate S with measurement light diagonally and detecting the amount of measurement light that has transmitted through or has been reflected from the above-described matrix film diagonally; and an adhesion prevention means 23a for preventing the matrix substance that has flown off from the above-described vapor deposition source 21 from adhering to the above-described light amount measurement unit.
Abstract translation: 提供适于通过真空气相沉积形成用于MALDI的基质膜的样品制备装置。 样品制备装置具有：样品基板支撑单元23，用于在基板S上支撑待分析物质，使得物质面向基质物质J的气相沉积源21; 光量测量单元，其用测量光对角地照射沉积在基板S上的基质膜蒸气并检测已经透射或已经从上述矩阵膜反射的测量光的量; 以及用于防止从上述蒸镀源21流出的基质物质粘附于上述光量测定单元的防附着装置23a。
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公开(公告)号：US10930488B2
公开(公告)日：2021-02-23
申请号：US16814036
申请日：2020-03-10
Applicant: SHIMADZU CORPORATION
Inventor： Osamu Furuhashi , Tomomi Tamura , Kiyoshi Ogawa
Abstract: A mass spectrometer, includes: a sampling probe that irradiates a specimen disposed in the atmosphere with an electron and obtains a sample separated from the specimen; and a measurement unit that performs mass spectrometry of the sample obtained by the sampling probe, wherein the sampling probe comprises: a casing having an opening which is opened to the atmosphere and an outlet through which the sample is discharged to the measurement unit; and a surface emission type electron emission element housed in the casing such that an electron emission surface thereof opposes to the opening.
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