Invention Grant
- Patent Title: Particle optical system
- Patent Title (中): 粒子光学系统
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Application No.: US14481823Application Date: 2014-09-09
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Publication No.: US09349571B2Publication Date: 2016-05-24
- Inventor: Thomas Kemen , Pascal Anger , Dirk Zeidler , Gerd Benner
- Applicant: Carl Zeiss Microscopy GmbH
- Applicant Address: DE Jena
- Assignee: CARL ZEISS MICROSCOPY GMBH
- Current Assignee: CARL ZEISS MICROSCOPY GMBH
- Current Assignee Address: DE Jena
- Agency: Alston & Bird LLP
- Priority: DE102013014976 20130909
- Main IPC: H01J37/26
- IPC: H01J37/26 ; G21K5/04 ; H01J37/10 ; H01J37/147 ; H01J37/20 ; H01J37/244 ; H01J37/28 ; H01J37/04

Abstract:
A particle optical system comprises a beam generating system (3) configured to generate a plurality of particle beams (5) and to direct the plurality of particle beams (5) onto an object plane (7), a first deflector arrangement (35) arranged in the beam path of the particle beams (5) upstream of the object plane (7) and configured to deflect the plurality of particle beams (5) before they are incident on the object plane (7), an object holder (15) configured to hold an object (17) to be inspected in the object plane (7), a plurality of detectors (27) configured to receive and to detect the plurality of particle beams (5) having traversed the object plane (7), wherein the detectors are arranged in a detection plane (21) on a side of the object plane (7) opposite to the beam generating system (3), at least one first particle optical lens (19) configured to collect particles of the particle beams emanating from the object plane on the detectors (27), and a controller (31) configured to control the first deflector arrangement (35) in order to deflect locations of incidence (9) of the particle beams (5) on the object plane (7) by deflecting the particle beams (5).
Public/Granted literature
- US20150069235A1 Particle Optical System Public/Granted day:2015-03-12
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