Abstract:
PROBLEM TO BE SOLVED: To prevent the formation of air bubbles and reduce contamination in immersion lithography. SOLUTION: This device comprises a wafer chuck assembly 200 having a wafer chuck 202 constituted to hold a semiconductor wafer 104 on the supporting face of itself. This wafer chuck 202 has a gap 108 inside, and this gap 108 is located adjacent to the outer edge of the wafer 104. This gap 104 contains an immersion lithography liquid of a certain volume inside. A liquid circulation path is formed in the wafer chuck 202 in such a manner as to facilitate the radially outward transfer of the immersion lithography liquid in the gap, and thereby maintain the meniscus of the immersion lithography liquid at a selected height to the upper surface of the semiconductor wafer 104. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To prevent interaction between a photoresist layer and an immersion fluid in a immersion lithography system and to prevent contaminants in the immersion fluid from contaminating an integrated circuit being fabricated. SOLUTION: The method for forming an image in a photoresist layer includes: a step of providing a substrate; a step (S12) of forming a photoresist layer over the substrate; a step (S16) of forming a contamination gettering topcoat layer over the photoresist layer, the contamination gettering topcoat layer including contains one or more polymers and one or more cation complexing agents; a step of exposing the photoresist layer to actinic radiation; and a step of removing an exposed region of the photoresist layer or an unexposed region of the photoresist layer. The contamination gettering topcoat layer includes one or more polymers, one or more cation complexing agents, and a casting solvent. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method of fabricating a dual damascene structure. SOLUTION: The method of fabricating a dual damascene structure comprises a step of forming a multilayer photoresist stack including a first photoresist layer and a second photoresist layer, wherein each photoresist layer has a distinct dose-to-clear value. The method also comprises a step of exposing the photoresist stack to one or more predetermined patterns of light, and a step of developing the photoresist layers to form a multistage structure in the photoresist layers. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
A curable liquid formulation containing at least (i) one or more near-infrared absorbing triphenylamine -based dyes, and (ii) one or more casting solvents. The invention is also directed to solid near- infrared absorbing films composed of crosslinked forms of the curable liquid formulation. The invention is also directed to a microelectronic substrate containing a coating of the solid near-infrared absorbing film as well as a method for patterning a photoresist layer coated on a microelectronic substrate in the case where the near-infrared absorbing film is between the microelectronic substrate and a photoresist film.
Abstract:
A curable liquid formulation comprising: (i) one or more near-infrared absorbing polymethine dyes; (ii) one or more crosslinkable polymers; and (iii) one or more casting solvents. The invention is also directed to solid near-infrared absorbing films composed of crosslinked forms of the curable liquid formulation. The invention is also directed to a microelectronic substrate containing a coating of the solid near-infrared absorbing film as well as a method for patterning a photoresist layer coated on a microelectronic substrate in the case where the near-infrared absorbing film is between the microelectronic substrate and a photoresist film.
Abstract:
A curable liquid formulation comprising: (i) one or more near-infrared absorbing polymethine dyes; (ii) one or more crosslinkable polymers; and (iii) one or more casting solvents. The invention is also directed to solid near-infrared absorbing films composed of crosslinked forms of the curable liquid formulation. The invention is also directed to a microelectronic substrate containing a coating of the solid near-infrared absorbing film as well as a method for patterning a photoresist layer coated on a microelectronic substrate in the case where the near-infrared absorbing film is between the microelectronic substrate and a photoresist film.
Abstract:
Härtbare flüssige Formulierung, welche das Folgende umfasst: (i) einen oder mehrere Nahinfrarot absorbierende Polymethinfarbstoffe; (ii) ein oder mehrere vernetzbare Polymere und (iii) ein oder mehrere Gießlösungsmittel. Die Erfindung betrifft auch Nahinfrarot absorbierende feste Dünnschichten, die aus vernetzten Formen der härtbaren flüssigen Formulierung zusammengesetzt sind. Die Erfindung betrifft ferner ein mikroelektronisches Substrat, welches eine Beschichtung der Nahinfrarot absorbierenden festen Dünnschicht enthält, sowie ein Verfahren zum Strukturieren einer Photoresistschicht, die auf ein mikroelektronisches Substrat geschichtet wird, für den Fall, dass die Nahinfrarot absorbierende Dünnschicht zwischen dem mikroelektronischen Substrat und einer Photoresist-Dünnschicht angeordnet ist.
Abstract:
Härtbare flüssige Formulierung, umfassend wenigstens (i) einen oder mehrere Nahinfrarot-absorbierende Farbstoffe auf Triphenylaminbasis, und (ii) ein oder mehrere Gießlösungsmittel. Die Erfindung betrifft auch Nahinfrarotabsorbierende Dünnschichten, die aus vernetzten Formen der härtbaren flüssigen Formulierung zusammengesetzt sind. Die Erfindung betrifft auch ein mikroelektronisches Substrat, das eine Schicht der festen, Nahinfrarot-absorbierenden Dünnschicht umfasst, und ein Verfahren zum Strukturieren einer Fotolackschicht, die auf ein mikroelektronisches Substrat geschichtet ist, falls die nahinfrarot-absorbierende Dünnschicht zwischen dem mikroelektronischen Substrat und einer Fotolack-Dünnschicht angeordnet ist.