Device for reducing contamination in immersion lithography, wafer chuck assembly, and method
    1.
    发明专利
    Device for reducing contamination in immersion lithography, wafer chuck assembly, and method 有权
    用于减少渗透光刻中的污染的装置,散热器组件和方法

    公开(公告)号:JP2007201452A

    公开(公告)日:2007-08-09

    申请号:JP2006351657

    申请日:2006-12-27

    Abstract: PROBLEM TO BE SOLVED: To prevent the formation of air bubbles and reduce contamination in immersion lithography. SOLUTION: This device comprises a wafer chuck assembly 200 having a wafer chuck 202 constituted to hold a semiconductor wafer 104 on the supporting face of itself. This wafer chuck 202 has a gap 108 inside, and this gap 108 is located adjacent to the outer edge of the wafer 104. This gap 104 contains an immersion lithography liquid of a certain volume inside. A liquid circulation path is formed in the wafer chuck 202 in such a manner as to facilitate the radially outward transfer of the immersion lithography liquid in the gap, and thereby maintain the meniscus of the immersion lithography liquid at a selected height to the upper surface of the semiconductor wafer 104. COPYRIGHT: (C)2007,JPO&INPIT

    Abstract translation: 要解决的问题:防止气泡的形成和减少浸没式光刻中的污染。 解决方案:该装置包括晶片卡盘组件200,其具有构造成将半导体晶片104保持在其本身的支撑面上的晶片卡盘202。 该晶片卡盘202在内部具有间隙108,并且该间隙108位于晶片104的外边缘附近。该间隙104包含内部一定体积的浸没式光刻液。 液晶循环路径形成在晶片卡盘202中,以便于浸没式光刻液体在间隙中的径向向外转移,从而将浸没式光刻液体的弯液面保持在选定高度至 半导体晶片104.版权所有(C)2007,JPO&INPIT

    Method for forming image in resist, topcoat layer material (immersion lithography contamination gettering layer)
    2.
    发明专利
    Method for forming image in resist, topcoat layer material (immersion lithography contamination gettering layer) 有权
    用于形成耐蚀图像的方法,顶层材料(渗透层析污染捕获层)

    公开(公告)号:JP2006338002A

    公开(公告)日:2006-12-14

    申请号:JP2006142379

    申请日:2006-05-23

    CPC classification number: G03F7/2041 G03F7/11 Y10S430/162

    Abstract: PROBLEM TO BE SOLVED: To prevent interaction between a photoresist layer and an immersion fluid in a immersion lithography system and to prevent contaminants in the immersion fluid from contaminating an integrated circuit being fabricated.
    SOLUTION: The method for forming an image in a photoresist layer includes: a step of providing a substrate; a step (S12) of forming a photoresist layer over the substrate; a step (S16) of forming a contamination gettering topcoat layer over the photoresist layer, the contamination gettering topcoat layer including contains one or more polymers and one or more cation complexing agents; a step of exposing the photoresist layer to actinic radiation; and a step of removing an exposed region of the photoresist layer or an unexposed region of the photoresist layer. The contamination gettering topcoat layer includes one or more polymers, one or more cation complexing agents, and a casting solvent.
    COPYRIGHT: (C)2007,JPO&INPIT

    Abstract translation: 要解决的问题:为了防止浸没式光刻系统中的光致抗蚀剂层和浸没流体之间的相互作用并且防止浸没流体中的污染物污染正在制造的集成电路。 解决方案:在光致抗蚀剂层中形成图像的方法包括:提供基板的步骤; 在衬底上形成光致抗蚀剂层的步骤(S12); 在光致抗蚀剂层上形成污染吸气外涂层的步骤(S16),包含吸污顶层的污染物包含一种或多种聚合物和一种或多种阳离子络合剂; 将光致抗蚀剂层暴露于光化辐射的步骤; 以及除去光致抗蚀剂层的曝光区域或光致抗蚀剂层的未曝光区域的步骤。 污染吸附顶涂层包括一种或多种聚合物,一种或多种阳离子络合剂和流延溶剂。 版权所有(C)2007,JPO&INPIT

    Method of fabricating dual damascene structure
    3.
    发明专利
    Method of fabricating dual damascene structure 有权
    制备双重结构的方法

    公开(公告)号:JP2007173826A

    公开(公告)日:2007-07-05

    申请号:JP2006343493

    申请日:2006-12-20

    CPC classification number: G03F7/094 G03F1/50

    Abstract: PROBLEM TO BE SOLVED: To provide a method of fabricating a dual damascene structure. SOLUTION: The method of fabricating a dual damascene structure comprises a step of forming a multilayer photoresist stack including a first photoresist layer and a second photoresist layer, wherein each photoresist layer has a distinct dose-to-clear value. The method also comprises a step of exposing the photoresist stack to one or more predetermined patterns of light, and a step of developing the photoresist layers to form a multistage structure in the photoresist layers. COPYRIGHT: (C)2007,JPO&INPIT

    Abstract translation: 要解决的问题:提供一种制造双镶嵌结构的方法。 解决方案:制造双镶嵌结构的方法包括形成包括第一光致抗蚀剂层和第二光致抗蚀剂层的多层光致抗蚀剂层的步骤,其中每个光致抗蚀剂层具有不同的剂量到清除值。 该方法还包括将光致抗蚀剂叠层暴露于一种或多种预定图案的光的步骤,以及在光阻层中形成多层结构的光致抗蚀剂层的显影步骤。 版权所有(C)2007,JPO&INPIT

    NEAR-INFRARED ABSORBING FILM COMPOSITIONS
    4.
    发明申请
    NEAR-INFRARED ABSORBING FILM COMPOSITIONS 审中-公开
    近红外吸收膜组合物

    公开(公告)号:WO2011022221A3

    公开(公告)日:2011-06-30

    申请号:PCT/US2010044631

    申请日:2010-08-06

    CPC classification number: G03F7/091 G03F9/7026

    Abstract: A curable liquid formulation containing at least (i) one or more near-infrared absorbing triphenylamine -based dyes, and (ii) one or more casting solvents. The invention is also directed to solid near- infrared absorbing films composed of crosslinked forms of the curable liquid formulation. The invention is also directed to a microelectronic substrate containing a coating of the solid near-infrared absorbing film as well as a method for patterning a photoresist layer coated on a microelectronic substrate in the case where the near-infrared absorbing film is between the microelectronic substrate and a photoresist film.

    Abstract translation: 包含至少(i)一种或多种近红外吸收性三苯胺类染料的可固化液体制剂,和(ii)一种或多种浇铸溶剂。 本发明还涉及由可固化液体制剂的交联形式组成的固体近红外吸收膜。 本发明还涉及含有固体近红外吸收膜的涂层的微电子基板以及在近红外线吸收膜位于微电子基板之间的情况下图案化涂布在微电子基板上的光刻胶层的方法 和光刻胶膜。

    NEAR-INFRARED ABSORBING FILM COMPOSITIONS
    5.
    发明申请
    NEAR-INFRARED ABSORBING FILM COMPOSITIONS 审中-公开
    近红外吸收膜组合物

    公开(公告)号:WO2011031396A3

    公开(公告)日:2011-06-30

    申请号:PCT/US2010044630

    申请日:2010-08-06

    CPC classification number: G03F7/0388 G03F7/038 G03F7/091 G03F7/11 H01L51/447

    Abstract: A curable liquid formulation comprising: (i) one or more near-infrared absorbing polymethine dyes; (ii) one or more crosslinkable polymers; and (iii) one or more casting solvents. The invention is also directed to solid near-infrared absorbing films composed of crosslinked forms of the curable liquid formulation. The invention is also directed to a microelectronic substrate containing a coating of the solid near-infrared absorbing film as well as a method for patterning a photoresist layer coated on a microelectronic substrate in the case where the near-infrared absorbing film is between the microelectronic substrate and a photoresist film.

    Abstract translation: 一种可固化液体制剂,其包含:(i)一种或多种近红外吸收聚甲炔染料; (ii)一种或多种可交联聚合物; 和(iii)一种或多种浇铸溶剂。 本发明还涉及由可固化液体制剂的交联形式组成的固体近红外吸收膜。 本发明还涉及一种含有固体近红外线吸收膜的涂层的微电子衬底,以及在近红外吸收膜位于微电子衬底之间的情况下,用于图案化涂覆在微电子衬底上的光刻胶层的方法 和光刻胶膜。

    Near-infrared absorbing film compositions

    公开(公告)号:GB2486102A

    公开(公告)日:2012-06-06

    申请号:GB201203634

    申请日:2010-08-06

    Applicant: IBM

    Abstract: A curable liquid formulation comprising: (i) one or more near-infrared absorbing polymethine dyes; (ii) one or more crosslinkable polymers; and (iii) one or more casting solvents. The invention is also directed to solid near-infrared absorbing films composed of crosslinked forms of the curable liquid formulation. The invention is also directed to a microelectronic substrate containing a coating of the solid near-infrared absorbing film as well as a method for patterning a photoresist layer coated on a microelectronic substrate in the case where the near-infrared absorbing film is between the microelectronic substrate and a photoresist film.

    Nahinfrarot absorbierende Dünnschichtzusammensetzungen

    公开(公告)号:DE112010003331T5

    公开(公告)日:2012-07-05

    申请号:DE112010003331

    申请日:2010-08-06

    Applicant: IBM

    Abstract: Härtbare flüssige Formulierung, welche das Folgende umfasst: (i) einen oder mehrere Nahinfrarot absorbierende Polymethinfarbstoffe; (ii) ein oder mehrere vernetzbare Polymere und (iii) ein oder mehrere Gießlösungsmittel. Die Erfindung betrifft auch Nahinfrarot absorbierende feste Dünnschichten, die aus vernetzten Formen der härtbaren flüssigen Formulierung zusammengesetzt sind. Die Erfindung betrifft ferner ein mikroelektronisches Substrat, welches eine Beschichtung der Nahinfrarot absorbierenden festen Dünnschicht enthält, sowie ein Verfahren zum Strukturieren einer Photoresistschicht, die auf ein mikroelektronisches Substrat geschichtet wird, für den Fall, dass die Nahinfrarot absorbierende Dünnschicht zwischen dem mikroelektronischen Substrat und einer Photoresist-Dünnschicht angeordnet ist.

    Nahinfrarot-Absorbierende Dünnschichtzusammensetzungen

    公开(公告)号:DE112010003326T5

    公开(公告)日:2012-06-06

    申请号:DE112010003326

    申请日:2010-08-06

    Applicant: IBM

    Abstract: Härtbare flüssige Formulierung, umfassend wenigstens (i) einen oder mehrere Nahinfrarot-absorbierende Farbstoffe auf Triphenylaminbasis, und (ii) ein oder mehrere Gießlösungsmittel. Die Erfindung betrifft auch Nahinfrarotabsorbierende Dünnschichten, die aus vernetzten Formen der härtbaren flüssigen Formulierung zusammengesetzt sind. Die Erfindung betrifft auch ein mikroelektronisches Substrat, das eine Schicht der festen, Nahinfrarot-absorbierenden Dünnschicht umfasst, und ein Verfahren zum Strukturieren einer Fotolackschicht, die auf ein mikroelektronisches Substrat geschichtet ist, falls die nahinfrarot-absorbierende Dünnschicht zwischen dem mikroelektronischen Substrat und einer Fotolack-Dünnschicht angeordnet ist.

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