Abstract:
PROBLEM TO BE SOLVED: To provide a slurry collection device which can save the quantity of the slurry to be disposed and can suppress any stuffing of a discharge pipe to discharge the slurry, and also to provide a method therefor. SOLUTION: The slurry collection device 1 includes an annular shielding member 2 disposed around a turntable T of a grinding device E, and an annular slurry collector 3 disposed around the shielding member 2. The turntable T is connected to an upper end of a main rotary shaft T1 protruded from a bottom part of a sink S of the grinding device E, and raised from the bottom part of the sink S. The slurry collection device 1 is inserted between the entire circumference of the turntable T and the inner surface of the sink S. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a slurry supply pipe and a retention preventing method which can reduce costs for CMP by reducing the amount of slurry to be discarded and by reducing a process time for CMP. SOLUTION: This slurry supply pipe 1 comprises a T-shaped joint 2 connected in the middle of a circulation path L, a movable pipe 3 rotatably connected to a branch pipe 20 of the T-shaped joint 2, and a driving means 4 for rotating the movable pipe 3. The driving means 4 rotates each of two rollers 40 supporting the outer circumferential face of the movable pipe 3 from below clockwise to have the movable pipe driven in the same direction. Each of the rollers 40 is connected to a rotating machine. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide an illumination device for macroinspection, by which whether a defocus defect or the like is contained on the face to be fine worked of a resist pattern or the like formed on a semiconductor substrate such as a wafer or the like can be inspected especially visually and clearly, and to provide an apparatus and a method for inspection in which the obtained illumination device for macroinspection is used. SOLUTION: This macroinspection apparatus 10 comprises an illumination device 12 for macroinspection, which is equipped with a light source used to irradiate coherent light 14. The macroinspection apparatus comprises a support means 20 used to support a substrate 18 which is irradiated with the coherent light 14 from the illumination device 12 for macroinspection and on which the face 16 to be fine worked of a prescribed pattern is formed. The macroinspection apparatus comprises a judgment means 24 in which whether a pattern formed on the substrate 18 is deformed from the prescribed pattern is judged by diffracted light 22 from the face 16 to be fine worked. The illumination device 12 for macroinspection is constituted of a device which irradiates light containing coherent light in two colors in the relationship of complementary colors.
Abstract:
PROBLEM TO BE SOLVED: To visually inspect film thickness unevenness with high accuracy by improving the coherence between light rays reflected by the surfaces of a film and a substrate by projecting light having an intensity peak having a specific half-value width or smaller upon the substrate. SOLUTION: A light source section S the intensity peak of which has a half-value width of
Abstract:
PROBLEM TO BE SOLVED: To give a flat light reflection face to reduce the loss of reflected light due to diffraction. SOLUTION: An active matrix type reflection liquid crystal element is provided with an array substrate having switching elements corresponding to picture elements and an array of picture element electrodes 32 connected to switching elements, and a counter substrate which has a transparent electrode facing the array of picture element electrodes 32 with a liquid crystal layer between them. Each picture element electrode 32 is formed so as to have an array of electrode studs, namely, split electrodes 68, Areas between studs are filled with an insulating material 64. The surface of the stud array is smoothed by chemical and mechanical polishing treatment. A dielectric light reflection film is provided on the flat surface of the stud array, and a liquid crystal molecule orienting film is provided on this film. COPYRIGHT: (C)1999,JPO
Abstract:
PURPOSE: To provide a liquid crystal display device improved in display luminance by improving the numerical aperture of a sub-pixel and a manufacturing method for the device in the projection type liquid crystal display device using a reflection type liquid crystal light valve and a manufacturing method for the device. CONSTITUTION: According to the above manufacturing method, the liquid crystal display device is constructed by forming a light absorbing layer 26 on a semiconductor substrate 1, forming plural light reflecting films 32 on the light absorbing layer 26 through an insulating film 28, forming an insulating film 36 on the whole surface, applying positive photoresist to the whole surface on the insulating film 36 to form a resist layer, applying exposure to the resist layer from above to form a mask, with the resist layer left on the areas among plural self-aligning light reflecting films 32, and etching the insulating film 36 by the mask to form a column-like spacer 34 on the plural light reflecting films 32.
Abstract:
PROBLEM TO BE SOLVED: To effectively shield incident light from a gap part of a light reflection layer in a liquid crystal light valve of a liquid crystal display device, especially of a reflective liquid crystal display device. SOLUTION: In the liquid crystal display device having a semiconductor substrate, a counter substrate, the light reflection layer and a liquid crystal, the liquid crystal light valve provided with an effective light shielding means is constructed by arranging a light absorption body layer and a light shielding body placed between the light absorption body layer and the light reflection layer.