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公开(公告)号：US12042865B2
公开(公告)日：2024-07-23
申请号：US17992447
申请日：2022-11-22
Applicant: NCS Testing Technology CO., LTD
Inventor： Lei Zhao , Hui Wang , Lixia Yang , Haizhou Wang , Xuejing Shen , Yunhai Jia , Dongling Li , Xing Yu , Suran Liu
Abstract: A high-throughput 3D printing system for preparing multi-component, small sized samples, includes a raw material supply module, providing a various kinds of metal powders for printing small sized samples; the first mixer module, mixing the metal powders obtained from the raw material supply module to generate the first blended metal powders; the second mixer module, mixing the first mixed metal powders, in order to generate the second blended metal powders for printing small sized samples; the first printing module, printing the secondary blended metal powder into a small-sized sample; a control module, controlling other functional modules of the high-throughput 3D printing system for generating small-size samples.
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公开(公告)号：US11927511B2
公开(公告)日：2024-03-12
申请号：US17586729
申请日：2022-01-27
Inventor： Dongling Li , Lei Zhao , Haizhou Wang , Xuejing Shen , Qingqing Zhou , Weihao Wan , Haozhou Feng
IPC: G01N1/28 , G01N23/223 , G01N33/204
CPC classification number: G01N1/286 , G01N23/223 , G01N33/204 , G01N2001/2866 , G01N2001/2893
Abstract: The present application relates to a method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy, and relates to the technical field of analysis of metal material composition and microstructure, comprising the following steps: step 1, processing a to-be-tested sample and determining a calibration coefficient; step 2, obtaining a two-dimensional element content distribution map of the to-be-tested sample; and step 3, determining the number and average spacing of primary dendrites. A composition distribution region analyzed in the present application is larger than the area of a distribution region of the traditional microscopic analysis method, and the sample preparation is simple. The distribution, number and average spacing of the primary dendrites can be obtained without metallographic corrosion sampling. Therefore, the present invention has the advantages of large statistical field of view, high efficiency and complete information, and the statistical data is more accurate and reliable.
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3.发明公开公开(公告)号：US20240068936A1
公开(公告)日：2024-02-29
申请号：US17962602
申请日：2022-10-10
Applicant: NCS Testing Technology CO., LTD.
Inventor： Jia Liu , Feipeng Cui , Xiaopeng Li , Ling Liu , Hongwei Shi , Feifei Guo , Ying Zhao , Xuejing Shen , Haizhou Wang
CPC classification number: G01N21/3103 , G06K9/0051 , G06K9/6235 , G06N3/126 , G06K2009/6237
Abstract: An adaptive characteristic spectral line screening method and system based on atomic emission spectrum are provided, the method includes: using a set characteristic screening optimization method to perform a plurality of optimization rounds of characteristic screening, obtaining an initialized spectral dataset of each round of the characteristic screening and initialized characteristic population genes; obtaining an optimal characteristic population gene of each round by a set analysis method, a fitness function, and an iteration of a genetic algorithm; obtaining an optimized characteristic spectral information set when the plurality of optimization rounds reach set optimization rounds; performing combination statistics and discriminant analyses on the optimized characteristic spectral information set to complete an adaptive characteristic spectral line screening. The disclosure can efficiently and automatically screen out the characteristic spectral lines that meet the analysis requirements in the complex atomic emission spectrum, thus ensuring the effectiveness and accuracy of screening the characteristic spectral lines.
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公开(公告)号：US20240066602A1
公开(公告)日：2024-02-29
申请号：US17992447
申请日：2022-11-22
Applicant: NCS Testing Technology CO.,LTD
Inventor： Lei Zhao , Hui Wang , Lixia Yang , Haizhou Wang , Xuejing Shen , Yunhai Jia , Dongling Li , Xing Yu , Suran Liu
Abstract: A high-throughput 3D printing system for preparing multi-component, small sized samples, includes a raw material supply module, providing a various kinds of metal powders for printing small sized samples; the first mixer module, mixing the metal powders obtained from the raw material supply module to generate the first blended metal powders; the second mixer module, mixing the first mixed metal powders, in order to generate the second blended metal powders for printing small sized samples; the first printing module, printing the secondary blended metal powder into a small-sized sample; a control module, controlling other functional modules of the high-throughput 3D printing system for generating small-size samples.
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公开(公告)号：US10804073B2
公开(公告)日：2020-10-13
申请号：US16669274
申请日：2019-10-30
Applicant: THE NCS TESTING TECHNOLOGY CO., LTD.
Inventor： Haizhou Wang , Xing Yu , Xuejing Shen , Yunhai Jia , Xiaojia Li , Yuhua Lu , Weihao Wan , Jianqiu Luo , Dongling Li , Lei Zhao
Abstract: An apparatus and method for a large-scale high-throughput quantitative characterization and three-dimensional reconstruction of a material structure. The apparatus having a glow discharge sputtering unit, a sample transfer device, a scanning electron microscope unit and a GPU computer workstation. The glow discharge sputtering unit can achieve large size (cm order), nearly flat and fast sample preparation, and controllable achieve layer-by-layer ablation preparation along the depth direction of the sample surface; rapid scanning electron microscopy (SEM) can achieve large-scale and high-throughput acquisition of sample characteristic maps. The sample transfer device is responsible for transferring the sample between the glow discharge sputtering source and the scanning electron microscope in an accurately positioning manner. The GPU computer workstation performs splicing, processing, recognition and quantitative distribution characterization on the acquired sample characteristic maps, and carries out three-dimensional reconstruction of the structure of the sample prepared by layer-by-layer sputtering.
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Patent Agency Ranking
公开(公告)号：US12146845B2
公开(公告)日：2024-11-19
申请号：US17902952
申请日：2022-09-05
Inventor： Lixia Yang , Haizhou Wang , Lizhi Ren , Danqi Huang , Lei Zhao , Xuejing Shen , Dongling Li , Zongxin Liu , Changwang Zhu , Yang Wang , Yunhai Jia
IPC: G01N23/20025 , G01N23/207
Abstract: A component residual stress testing platform based on neutron diffraction and experimental method thereof are provided, the testing platform includes a component support, a rotating mainshaft, a first thrust cylindrical roller bearing, a first cylindrical roller bearing, a bearing spacing sleeve, a second cylindrical roller bearing, a sleeve, and a first fixed baffle. The rotating mainshaft is disposed on the component support. The first thrust cylindrical roller bearing, the first cylindrical roller bearing, the bearing spacing sleeve and the second cylindrical roller bearing are sleeved on the rotating mainshaft, the sleeve is sleeved outside the first cylindrical roller bearing, the bearing spacing sleeve and the second cylindrical roller bearing, a component to be tested is sleeved on the sleeve. The testing platform can support, move, tilt and rotate the component to be tested in a process of a residual stress testing.
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公开(公告)号：US12019025B2
公开(公告)日：2024-06-25
申请号：US17315235
申请日：2021-05-07
Applicant: NCS Testing Technology CO., LTD
Inventor： Xing Yu , Haizhou Wang , Xuejing Shen , Xiaojia Li , Yifei Zhu , Weihao Wan , Yuhua Lu , Hui Wang , Qun Ren , Yongqing Wang , Zhenzhen Wan
CPC classification number: G01N21/67 , C23C14/3435 , H01J49/0459 , H01J49/06 , H01J49/12
Abstract: An apparatus and a method for preparing glow discharge sputtering samples for materials microscopic characterization are provided. The apparatus includes a glow discharge sputtering unit, a glow discharge power supply, a gas circuit automatic control unit, a spectrometer, and a computer. The structure of the glow discharge sputtering unit is optimized to be more suitable for sample preparation by simulation. By adding a magnetic field to the glow discharge plasma, uniform sample sputtering is realized within a large size range of the sample surface. The spectrometer monitors multi-element signal in a depth direction of the sample sputtering, so that precise preparation of different layer microstructures is realized. In conjunction with the acquisition of the sample position marks and the precise spatial coordinates (x, y, z) information, the correspondence between the surface space coordinates and the microstructure of the sample is conveniently realized.
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公开(公告)号：US20240105370A1
公开(公告)日：2024-03-28
申请号：US18530485
申请日：2023-12-06
Inventor： Haizhou Wang , Runqiu Lang , Haiyang Chen , Yandong Wang , Lei Zhao , Changwang Zhu , Xiaofen Zhang , Lixia Yang , Dongling Li , Xuejing Shen , Yunhai Jia
CPC classification number: H01F1/153 , C22C1/02 , C22C30/00 , C22C33/04 , C22C38/02 , C22C38/06 , C22C38/10 , C22C38/105 , C22C2202/02
Abstract: The present invention discloses a high-entropy soft magnetic alloy with 900 K high-temperature resistance, comprising Fe, Co, Ni, Si and Al, and the atomic percent of the alloy composition is expressed as FexCoyNizSimAln, wherein x=40%-80%, y=20%-60%, z=0-30%, m=0-20%, n=0-20%, and x+y+z+m+n=100%; the atomic percent of other doping elements is p=0-5%, and 0.5≤m/n≤3; the performance indexes of the material include: at room temperature, saturation magnetization Ms=90-150 emu/g, and coercive force Hc=0.1-15 Oe; and at 900 K, saturation magnetization Ms=70-130 emu/g, and coercive force Hc=0.1-25 Oe. The high-entropy soft magnetic alloy with 900 K high-temperature resistance of the present invention realizes the continuously diffuse distribution of nano-scale precipitates in the matrix structure by comprehensively regulating the microstructure configuration of the multi-principal element alloy, thus improving the soft magnetic properties of the alloy to a certain extent, and the processing route is simple and reliable, with high repeatability.
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公开(公告)号：US20230205175A1
公开(公告)日：2023-06-29
申请号：US18116279
申请日：2023-03-01
Applicant: NCS Testing Technology CO.,LTD
Inventor： Lei Zhao , Haizhou Wang , Lixia Yang , Lei Yu , Xuebin Chen , Hui Wang , Xuejing Shen , Yunhai Jia , Dongling Li , Xing Yu
IPC: G05B19/4099
CPC classification number: G05B19/4099 , G05B2219/49023
Abstract: The present invention discloses an integrated research and development system for high-throughput preparation and statistical mapping characterization of materials, comprising: a high-throughput preparation module, a high-throughput characterization module, an automatic control module and a statistical mapping data processing module; the high-throughput preparation module is used for preparing a multi-component combinatorial-sample; the high-throughput characterization module comprises a plurality of different high-throughput characterization devices; the automatic control module comprises a special sample box, a sample moving platform, an intelligent mechanical arm and a synchronous control system; and the statistical mapping data processing module is used for constructing a statistical mapping constitutive model corresponding to position mapping according to the composition, microstructure and performance data of the combinatorial-sample. The present invention integrates multiple functions, has high automatic control level, improves the experimental speed and experimental efficiency.
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公开(公告)号：US11506650B2
公开(公告)日：2022-11-22
申请号：US17009117
申请日：2020-09-01
Applicant: The NCS Testing Technology Co., Ltd.
Inventor： Dongling Li , Weihao Wan , Jie Li , Haizhou Wang , Lei Zhao , Xuejing Shen , Yunhai Jia
Abstract: The invention belongs to the technical field of quantitative statistical distribution analysis for micro-structures of metal materials, and relates to a method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials. According to the method based on deep learning in the present invention, dendrite structure feature maps are marked and trained to obtain a corresponding object detection model, so as to carry out automatic identification and marking of dendrite structure centers in a full view field; and in combination with an image processing method, feature parameters in the full view field such as morphology, position, number and spacing of all dendrite structures within a large range are obtained quickly, thereby achieving quantitative statistical distribution characterization of dendrite structures in the metal material. The method is accurate, automatic and efficient, involves a large amount of quantitative statistical distribution information, and is statistically more representative as compared with the traditional measurement of feature sizes of dendrite structures in a single view field.
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