公开(公告)号：US20230205175A1

公开(公告)日：2023-06-29

申请号：US18116279

申请日：2023-03-01

Applicant: NCS Testing Technology CO.,LTD

Inventor： Lei Zhao ,  Haizhou Wang ,  Lixia Yang ,  Lei Yu ,  Xuebin Chen ,  Hui Wang ,  Xuejing Shen ,  Yunhai Jia ,  Dongling Li ,  Xing Yu

IPC: G05B19/4099

CPC classification number: G05B19/4099 ,  G05B2219/49023

Abstract: The present invention discloses an integrated research and development system for high-throughput preparation and statistical mapping characterization of materials, comprising: a high-throughput preparation module, a high-throughput characterization module, an automatic control module and a statistical mapping data processing module; the high-throughput preparation module is used for preparing a multi-component combinatorial-sample; the high-throughput characterization module comprises a plurality of different high-throughput characterization devices; the automatic control module comprises a special sample box, a sample moving platform, an intelligent mechanical arm and a synchronous control system; and the statistical mapping data processing module is used for constructing a statistical mapping constitutive model corresponding to position mapping according to the composition, microstructure and performance data of the combinatorial-sample. The present invention integrates multiple functions, has high automatic control level, improves the experimental speed and experimental efficiency.