Abstract:
A boosting circuit supplied by a first voltage level (Vcc) and a second voltage level (Gnd), and having an output line (13) capable of taking a third voltage level, characterized by comprising at least two distinct circuits (A1,11,A2,12) for generating said third voltage level, the at least two circuits selectively activatable for generating said third voltage level and selectively couplable to said output line (13).
Abstract:
A programmable logic array (PLA) has at least an AND plane comprising an array of transistors arranged in rows and columns, the transistors belonging to a same column being connected in series with each other, the two end current terminals of said series of transistors being coupled to the supply voltage rail (VDD) and to a reference (GND), respectively, the transistors of the first row and of the last row of the array having their control terminals coupled to respective opposite enabling/disabling potentials. To each row of said array, with the exception of the first and the last row, are associated three control lines, the first line being coupled to a first input value, the second line being coupled to the inverted logic value of the first input value and the third line being coupled to a voltage sufficient to keep in a state of conduction the transistors of the row connected to it. Each transistor of each row except the first and the last row has its control terminal connected to one of the three control lines associated to the row. An OR plane comprises at least an array of transistors arranged in rows and columns, the transistors belonging to a same column having their respective control terminals connected to a control line and a first current terminal coupled to a reference potential (GND), each transistor of each row of the array having a second current terminal connected or not to a respective output line. The second current terminal of each transistor of the array that is not connected to a respective output line is short-circuited to the first current terminal of the same transistor.
Abstract:
The invention relates to a row decoding circuit for an electronic memory cell device, particularly in low supply voltage applications, being of the type adapted to boost, through at least one boost capacitor (Cboost), a read voltage to be applied to a memory column containing a memory cell to be read. The circuit is powered between a first supply voltage reference (Vpcx) and a second ground potential reference (GND), and comprises a hierarchic structure (13) of cascade connected inverters (15,16) and a circuit means of progressively raising the read voltage level dynamically. First means (Cboost0,D1) are provided for raising the read voltage level to a value equal to the supply voltage (Vpcx) plus a threshold voltage (Vtp), and second means (Cboost1,D2) are provided for raising the read voltage level to a value equal to the supply voltage (Vpcx) plus twice said threshold voltage (Vtp).
Abstract:
The invention relates to a row decoding circuit for an electronic memory cell device, particularly in low supply voltage applications, being of the type adapted to boost, through at least one boost capacitor (Cboost), a read voltage to be applied to a memory column containing a memory cell to be read. The circuit is powered between a first supply voltage reference (Vpcx) and a second ground potential reference (GND), and comprises a hierarchic structure (13) of cascade connected inverters (15,16) and a circuit means of progressively raising the read voltage level dynamically. First means (Cboost0,D1) are provided for raising the read voltage level to a value equal to the supply voltage (Vpcx) plus a threshold voltage (Vtp), and second means (Cboost1,D2) are provided for raising the read voltage level to a value equal to the supply voltage (Vpcx) plus twice said threshold voltage (Vtp).
Abstract:
The invention relates to a method and a circuit for regulating a pulse synchronization signal (ATD) for the memory cell read phase in semiconductor integrated electronic memory devices. The pulse signal (ATD) is generated upon detection of a change in logic state of at least one of a plurality of address input terminals of the memory cells, so as to also generate an equalization signal (SAEQ) to a sense amplifier. The SAEQ pulse is blocked (STOP) upon the row voltage reaching a predetermined sufficient value to provide reliable reading. Advantageously, the pulse blocking is produced by a logic signal (STOP) activated upon a predetermined voltage value being exceeded during the overboost phase of the addressed memory row.