Abstract:
The invention relates to a row decoding circuit for an electronic memory cell device, particularly in low supply voltage applications, being of the type adapted to boost, through at least one boost capacitor (Cboost), a read voltage to be applied to a memory column containing a memory cell to be read. The circuit is powered between a first supply voltage reference (Vpcx) and a second ground potential reference (GND), and comprises a hierarchic structure (13) of cascade connected inverters (15,16) and a circuit means of progressively raising the read voltage level dynamically. First means (Cboost0,D1) are provided for raising the read voltage level to a value equal to the supply voltage (Vpcx) plus a threshold voltage (Vtp), and second means (Cboost1,D2) are provided for raising the read voltage level to a value equal to the supply voltage (Vpcx) plus twice said threshold voltage (Vtp).
Abstract:
A removable storage device is described comprising at least one substrate (1) whereon a plurality of components (2, 3) are arranged. Advantageously, the removable storage device (10) comprises a casing (4) of the package type suitable to completely cover these components (2, 3) and to form, together with the substrate (1), an external coating of the removable storage device (10). Moreover, a method is described for assembling at least one removable storage device (10) thus realised.
Abstract:
The present invention relates to a semiconductor memory device with an improved address signal generator. The memory device comprises an array of memory elements (10), first decoding circuit means (8,15) for decoding a first set of address signals (7,14) for the selection of said memory elements, and second circuit means (4) for the generation internally to the memory of a sequence of values for said address signals (3,11). The second circuit means (4) generates said sequence so that successive values in the sequence differ for the logic state of only one of said address signals (3,11).