Abstract:
A programmable logic array (PLA) has at least an AND plane comprising an array of transistors arranged in rows and columns, the transistors belonging to a same column being connected in series with each other, the two end current terminals of said series of transistors being coupled to the supply voltage rail (VDD) and to a reference (GND), respectively, the transistors of the first row and of the last row of the array having their control terminals coupled to respective opposite enabling/disabling potentials. To each row of said array, with the exception of the first and the last row, are associated three control lines, the first line being coupled to a first input value, the second line being coupled to the inverted logic value of the first input value and the third line being coupled to a voltage sufficient to keep in a state of conduction the transistors of the row connected to it. Each transistor of each row except the first and the last row has its control terminal connected to one of the three control lines associated to the row. An OR plane comprises at least an array of transistors arranged in rows and columns, the transistors belonging to a same column having their respective control terminals connected to a control line and a first current terminal coupled to a reference potential (GND), each transistor of each row of the array having a second current terminal connected or not to a respective output line. The second current terminal of each transistor of the array that is not connected to a respective output line is short-circuited to the first current terminal of the same transistor.
Abstract:
This invention relates to a non-volatile memory device (20) with configurable row redundancy, comprising:
a non-volatile memory (11) comprising of at least one matrix (11') of memory cells and at least one matrix (11") of redundant memory cells, both organised into rows and columns; row and column decoding circuits (12,13); read and modify circuits for reading and modifying data stored in the memory cells; and at least one associative memory matrix (14), also organised into rows and columns, able to store the addresses of faulty rows, and control circuits for controlling the associative memory matrix.
The memory device (20) of this invention further comprises:
at least one circuit for recognising and comparing selected row addresses (ADr) with faulty row addresses (ADrr) contained in the associative memory matrix (14), such as to produce de-selection of the faulty row and selection of the corresponding redundant cell row in the event of a valid recognition; and at least one configuration register (17), also comprising a matrix of non-volatile memory cells, and associated control circuits.