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    1.
    发明专利
    未知

    公开(公告)号：DE60138121D1

    公开(公告)日：2009-05-07

    申请号：DE60138121

    申请日：2001-09-17

    Applicant: TORAY INDUSTRIES

    Inventor： UEHARA MASATSUGU ,  NAKAI YASUHIRO ,  HIRATA HAJIME

    IPC: B29C48/92 ,  B29C47/00 ,  B29C48/31

    Abstract: A method of manufacturing a sheet by extruding and forming a polymer by using a plurality of mouthpieces each having a thickness adjusting means, comprising the steps of varying the amount of operation applied to the thickness adjusting means along a specified time series pattern, measuring a thickness distribution in the lateral direction of the sheet, and rapidly and accurately determining the corresponding relation between the thickness adjusting means and a thickness measurement position based on the results of comparison between a variation in sheet thickness variation distribution thus obtained or the standard time series pattern of the variation in sheet thickness distribution and the time series pattern of the measured values of the thickness distribution.

    2.
    发明专利
    未知

    公开(公告)号：DE60138399D1

    公开(公告)日：2009-05-28

    申请号：DE60138399

    申请日：2001-09-17

    Applicant: TORAY INDUSTRIES

    Inventor： HIRATA HAJIME ,  UEHARA MASATSUGU ,  NAKAI YASUHIRO ,  TERAO JIRO

    IPC: B29C48/92 ,  B29C47/88 ,  B29C48/31 ,  B29C55/12 ,  G05B13/04

    Abstract: A sheet (1) obtained by extruding and molding a raw material using a die (4) with plural thickness adjusting means (10), characterized in that the power spectrum (90) of the thickness profile of the sheet (1) in the transverse direction expressed by the following formula P = F É �¢ F �¢ É ° F É = ˆ« - ˆžˆž f x �¢ e - jÉx �¢ dx (where f(x) is the thickness profile of the sheet in the transverse direction (in ¼ m), F(É) is the Fourier transform of f(x), x is a position in the transverse direction of the sheet (in m), É is a wave number (in m -1 ) , and F(É)* is the conjugate complex number of F(É) ; and j is an imaginary number, and j 2 = -1) and the mean sheet thickness T (¼ m) satisfy the following relation: The mean value X1 of the powers of smaller than a predetermined wave number a is 0.2 x T 2 or less and is smaller than the mean value X2 of the powers of wave number a and larger.

    DEFECT DETECTOR FOR SHEET
    5.
    发明专利
    DEFECT DETECTOR FOR SHEET 审中-公开

    公开(公告)号：JP2003240726A

    公开(公告)日：2003-08-27

    申请号：JP2002036351

    申请日：2002-02-14

    Applicant: TORAY INDUSTRIES

    Inventor： NAKAI YASUHIRO ,  KURAMATA OSAMU ,  HIRATA HAJIME

    IPC: G01B11/30 ,  G01N21/892

    Abstract: PROBLEM TO BE SOLVED: To provide a defect detector for a sheet capable of accurately detecting even an infinitesimal defect and to provide a method of manufacturing the sheet. SOLUTION: The defect detector for the sheet to detect the defect of the sheet to be detected is provided with a light source for emitting a linear light beam to the sheet on one surface of the sheet, and a photodetecting means having photodetectors opposed to one or another surface of the sheet and provided at a position in which the main beam of the illuminated linear light beams is not incident and aligned in parallel, and the light source and the photodetecting means are provided at an angle θ° of 0 COPYRIGHT: (C)2003,JPO

    SHEET MANUFACTURING METHOD AND SHEET THICKNESS CONTROL UNIT
    6.
    发明专利
    SHEET MANUFACTURING METHOD AND SHEET THICKNESS CONTROL UNIT 审中-公开

    公开(公告)号：JP2003089146A

    公开(公告)日：2003-03-25

    申请号：JP2001288401

    申请日：2001-09-21

    Applicant: TORAY INDUSTRIES

    Inventor： UEHARA MASATSUGU ,  HIRATA HAJIME ,  NAKAI YASUHIRO

    IPC: B29C48/92 ,  B29C48/31 ,  B29L7/00 ,  B29C47/92 ,  B29C47/16

    Abstract: PROBLEM TO BE SOLVED: To provide a sheet manufacturing method capable of rapidly controlling the thickness of a sheet to a desired thickness profile with high accuracy, and a control unit for the thickness of the sheet. SOLUTION: The sheet manufacturing method uses a die equipped with a plurality of thickness adjusting means to extrude a raw material and molding the extrudate to form a sheet and controlling the thickness of the sheet, while controlling the operation quantity applied to the thickness adjusting means. A step for measuring the thickness distribution in the width direction of the sheet; a sep for leading out an operation quantity time series, wherein a predetermined evaluation function for evaluating a sheet thickness forecast formula calculated, on the basis of a process model expressing the relation between the operation quantity and the thickness of the sheet and the measured value becomes an extreme value; and a step for outputting at least the first operation quantity in the operation quantity time series to the thickness adjusting means are repeated in predetermined timing.

    SPECTROSCOPIC METHOD AND METHOD FOR FORMING FILM
    7.
    发明专利
    SPECTROSCOPIC METHOD AND METHOD FOR FORMING FILM 失效

    公开(公告)号：JP2001356050A

    公开(公告)日：2001-12-26

    申请号：JP2000178061

    申请日：2000-06-14

    Applicant: TORAY INDUSTRIES

    Inventor： ISHIKAWA KOJI ,  HIRATA HAJIME

    IPC: G01B11/06 ,  B29C48/30 ,  B29C48/92 ,  G01J3/02 ,  G01J3/18 ,  G01J3/36 ,  B29C47/12 ,  B29C47/92

    Abstract: PROBLEM TO BE SOLVED: To provide a spectroscopic method with small errors, a method for measuring a thickness and a method using these methods for forming films. SOLUTION: An incident light is brought into a light dispersion means to split the light for each wavelength. The split light of each wavelength is brought into a conversion means for converting the light to an electrical signal corresponding to an intensity of the light. In obtaining a spectroscopic spectrum from the obtained electrical signal, the wavelength of the light entering a specific position on the conversion means is determined by a calibration expression derived from characteristics of the light dispersion means.

    SENSOR FOR DETECTING LIQUID BODY AND MANUFACTURE OF FRP STRUCTURAL BODY
    8.
    发明专利
    SENSOR FOR DETECTING LIQUID BODY AND MANUFACTURE OF FRP STRUCTURAL BODY 失效

    公开(公告)号：JP2001027678A

    公开(公告)日：2001-01-30

    申请号：JP19873699

    申请日：1999-07-13

    Applicant: TORAY INDUSTRIES

    Inventor： TAKAMURA RYOJI ,  HIRATA HAJIME ,  SEKIDO SHUNEI

    IPC: B29C70/06 ,  G01J1/02 ,  G01J1/28 ,  G01V8/10 ,  G02B6/00

    Abstract: PROBLEM TO BE SOLVED: To provide a high-quality and efficient manufacturing method of an FRP structural material wherein a liquid body impregnated in a fiber reinforced base can be detected when reaching a predetermined position by surely and simply detecting the liquid body and generation of impregnation failures can be prevented. SOLUTION: The sensor for detecting a liquid body comprises a first optical fiber having a light emitting end 4 set to a leading end or to the vicinity of the leading end, and a second optical fiber having an incidence face 5 for receiving the light emitted from the first optical fiber set to a leading end or to the vicinity of the leading end. An FRP structural material is manufactured with the use of the detection method, and the FRP structural material is provided.

    DEVICE AND METHOD FOR DETECTING DEFECT OF YARN
    9.
    发明专利
    DEVICE AND METHOD FOR DETECTING DEFECT OF YARN 失效

    公开(公告)号：JPH11316196A

    公开(公告)日：1999-11-16

    申请号：JP12325898

    申请日：1998-05-06

    Applicant: TORAY INDUSTRIES

    Inventor： TANAKA HIDEHARU ,  HIRATA HAJIME ,  TORIKAI JUN

    IPC: G01N21/89 ,  D06H3/08 ,  G01N21/892 ,  G01N21/952

    Abstract: PROBLEM TO BE SOLVED: To provide a device and method for detecting defect of yarn, which can automatically detect the defect of the yarn by using the degree of dyeing power even in the case of modified cross-section yarn. SOLUTION: A dyed yarn Y is given false twist while travelling, light L including visible light and infrared ray is irradiated from a light irradiation means 5 to the travelling yarn Y which is given false twist a light receiving means 4 receives the visible light component and the infrared ray component contained in transmitted diffusion light which is transmitted through the travelling line of thread and diffused, and the defect of the line of thread is detected by measuring the degree of dyeing power.

    METHOD AND DEVICE FOR MEASURING THICKNESS OF THIN FILM, AND MANUFACTURE OF OPTICAL FILTER AND HIGH POLYMER FILM
    10.
    发明专利
    METHOD AND DEVICE FOR MEASURING THICKNESS OF THIN FILM, AND MANUFACTURE OF OPTICAL FILTER AND HIGH POLYMER FILM 失效

    公开(公告)号：JPH07280520A

    公开(公告)日：1995-10-27

    申请号：JP7223894

    申请日：1994-04-11

    Applicant: TORAY INDUSTRIES

    Inventor： TORIKAI JUN ,  HIRATA HAJIME ,  MOTOCHIKA NAGAKAZU ,  KOJIMA HIDEYUKI ,  YAMAMOTO MICHIYO

    IPC: G01B11/02 ,  G01B11/06 ,  G02B5/20

    Abstract: PURPOSE:To measure a thickness of a thin film with high accuracy by correcting the effect of distortion spectroscopy intensity of an interference light due to the thin film in accordance with the spectroscopy penetration characteristic of a thin film material. CONSTITUTION:A white measurement light from a light source 11 is emitted on a color filter film 5 with a color liquid crystal to be measured, a measurement light which is reflected thereby to become an interference light is introduced into a spectroscopy section 3 to be separated by a plane diffraction grating 34 so that components in a prescribed wavelength range are focused on an image sensor 36 to form an image 35. An image sensor drive circuit 37 reads an optical intensity of the image 35 by each image to transmit to an operation section 4 via a buffer amplifier 38 as a voltage signal so that the measurement spectroscopy intensity F (lambda) is obtained. A ratio (modulation signal) X (lambda) between intensity F (lambda) and an average spectroscopy intensity G (lambda) that was obtained beforehand by the same measurement order in terms of a plurality of samples with thin films of which kinds are the same as the coating film 5 having different thickness, is obtained, then in the peak values of plural wavelengths (maximum wavelength and minimum wavelength), the thickness is calculated from the adjacent maximum wavelengths or minimum wavelengths.

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