公开(公告)号：JP2006503299A

公开(公告)日：2006-01-26

申请号：JP2004545573

申请日：2003-10-17

Applicant: タレース・オプティクス・リミテッド ,  ビーエイイー・システムズ・インフォメーション・アンド・エレクトロニック・システムズ・インテグレイション・インコーポレーテッド

Inventor： カークハム、アンソニー ,  ガイアー、ロバート・シー．

IPC: G01S3/782 ,  G01C21/02 ,  G01C21/24 ,  G02B20060101 ,  G02B7/04 ,  G02B13/16 ,  G02B15/04 ,  G02B27/40 ,  G02B27/64 ,  H01J3/14 ,  H01J5/16 ,  H01J40/14

CPC classification number: G01S3/781 ,  G01S3/786 ,  G01S7/495 ,  G02B13/12 ,  G02B13/16 ,  G02B15/04

Abstract: 【課題】可変視野を提供するために有向妨害（ｄｉｒｅｃｔｅｄ ｃｏｕｎｔｅｒｍｅａｓｕｒｅ）システム内で光学的歪みを使用する方法及び装置【解決手段】光学系の単一のハードマウントセットは、有向妨害（ｄｉｒｅｃｔｅｄ ｃｏｕｎｔｅｒｍｅａｓｕｒｅｓ）のための２つの視野システムを置換するために活用される。 それは、１つの連続しているが歪んだ視野内に、視野の中心で高い目標物忠実度をもって正確に追尾する一方で、視野の端縁において目標物を検出、獲得及び特徴付ける能力を含む。 複数の目標物がある場合、一次目標物の追尾と二次目標物の獲得の両方ともが同時に発生し、妨害の効果を大幅に改善することができる。

公开(公告)号：JP2005345614A

公开(公告)日：2005-12-15

申请号：JP2004163360

申请日：2004-06-01

Applicant: Olympus Corp ,  オリンパス株式会社

Inventor： UENO MAKIO ,  AKITANI AKINORI

IPC: G02B21/00 ,  G02B26/10 ,  H01J3/14

CPC classification number: G02B26/101 ,  G02B21/002 ,  G02F1/11 ,  G02F1/33

Abstract: PROBLEM TO BE SOLVED: To provide a laser scanning type microscope into which a laser beam from a laser beam source is effectively and ideally introduced. SOLUTION: The laser scanning type microscope equipped with an acoustooptical element or an electrooptical element in an illumination optical system for introducing the laser beam from the laser beam source of the laser scanning type microscope into the microscope is equipped with a beam expander (120) arranged between the laser beam source (110) and the acoustooptical element or the electrooptical element (130). COPYRIGHT: (C)2006,JPO&NCIPI

Abstract translation: 要解决的问题：提供一种激光扫描型显微镜，其中有效且理想地引入来自激光束源的激光束。 解决方案：在用于将激光扫描型显微镜的激光束源的激光束引入显微镜的照明光学系统中配备有声光元件或电光元件的激光扫描型显微镜配备有扩束器（ 120）布置在激光束源（110）和声光元件或电光元件（130）之间。 版权所有（C）2006，JPO＆NCIPI

公开(公告)号：JP2005310610A

公开(公告)日：2005-11-04

申请号：JP2004127644

申请日：2004-04-23

Applicant: Shimadzu Corp ,  株式会社島津製作所

Inventor： KAWATO EIZO

IPC: H01J37/05 ,  H01J3/14 ,  H01J49/00 ,  H01J49/42

CPC classification number: H01J49/427

Abstract: PROBLEM TO BE SOLVED: To provide a method for shortening time required to screen ions by simplifying control and adjustment of an ion screening waveform, in an ion storage device. SOLUTION: An ion screening electric field produced in proportion of the product of an ion screening waveform obtained by repetition of a waveform with a fixed magnitude and a constant pattern and a continuously changing magnitude signal waveform is impressed on the ion storage space of this ion storage device, and thereby ions in a range of a specific mass/charge ratio are screened. The continuously changing magnitude waveform is a wave the magnitude of which increases as time elapses. The ion screening waveform obtained by repetition of the waveform with the fixed pattern is produced by a FNF (Filtered Noise Field) method and a SWIFT (Stored Wave Inverse Fourier Transform) method. In addition, in the waveform with the constant pattern, the strength of a frequency component apart from the frequency by which the ions within the range of the specific mass/charge ratio oscillates is strengthened. COPYRIGHT: (C)2006,JPO&NCIPI

Abstract translation: 解决的问题：提供一种通过简化离子屏蔽波形的控制和调整来缩短筛选离子所需时间的方法。 解决方案：按照通过重复具有固定幅度和恒定图案的波形和连续变化的幅度信号波形获得的离子筛选波形的乘积的比例产生的离子屏蔽电场施加在 该离子存储装置，从而在特定质量/电荷比的范围内的离子被筛选。 持续变化的幅度波形是随着时间的推移而增大的波形。 通过重复具有固定图案的波形获得的离子筛选波形通过FNF（滤波噪声场）方法和SWIFT（存储波逆傅立叶变换）方法产生。 此外，在具有恒定图案的波形中，与特定质量/电荷比的范围内的离子振荡的频率之外的频率分量的强度增强。 版权所有（C）2006，JPO＆NCIPI

公开(公告)号：JPWO2003107383A1

公开(公告)日：2005-10-20

申请号：JP2004514109

申请日：2003-06-10

Applicant: 株式会社東京大学Tlo

Inventor： 奥村　勝弥 ,  勝弥 奥村 ,  元介 三好 ,  元介 三好

IPC: H01J37/12 ,  G21K1/08 ,  H01J3/14 ,  H01J3/26 ,  H01J37/147 ,  H01J37/153 ,  H01J37/16

CPC classification number: H01J37/12 ,  H01J37/147 ,  H01J37/153 ,  H01J2237/1215

Abstract: 本発明は、小型化に適する電子光学鏡筒およびその製造方法を提供する。筒体(1)は、内筒(11)と外筒(12)とを備えている。筒体は、全体として高抵抗導電性のセラミックスにより構成されている。内筒の内面(111)には、静電レンズ(21,22,23,24)が、めっき、蒸着その他の手段により取り付けられている。レンズを構成する電極または電極片(211〜213,221,231,232,241〜243)のうち、共通電位のものは、共通の配線により接続されている。これにより、共通電位の電極または電極片を、まとめて、外部配線に接続することができる。

公开(公告)号：JP2005189106A

公开(公告)日：2005-07-14

申请号：JP2003431012

申请日：2003-12-25

Applicant: Denso Corp ,  株式会社デンソー

Inventor： MORIKAWA KENJI

IPC: G01L1/26 ,  G01D9/00 ,  G01D21/00 ,  G01G3/12 ,  G01J1/34 ,  G01L1/18 ,  G01L9/06 ,  H01C10/10 ,  H01C17/065 ,  H01J3/14

CPC classification number: H01C17/065 ,  G01G3/12 ,  G01L1/18

Abstract: PROBLEM TO BE SOLVED: To provide a dynamic quantity sensor element structure, enabling formation of an electrical connection part easy to be electrically connected with the outside, and which will not be influenced by the application of a high dynamic quantity.
SOLUTION: In this dynamic quantity sensor element structure, a detection part 3 for changing and outputting an electrical signal, based on application of a dynamic quantity is nipped by a first insulator 2 and a second insulator 4. The first insulator 2, the detection part 3 and the second insulator 4 are laminated in the dynamic quantity applying direction F, and the detection part 3 has an electric connection surface 3a exposed, without being covered with the first insulator 2 on the main surface on the close contact face side with the first insulator 2.
COPYRIGHT: (C)2005,JPO&NCIPI

Abstract translation: 要解决的问题：为了提供动态量传感器元件结构，能够形成容易与外部电连接的电连接部件，并且不会受到高动态量的应用的影响。 解决方案：在该动态量传感器元件结构中，用于根据动态量的施加来改变和输出电信号的检测部分3被第一绝缘体2和第二绝缘体4夹持。第一绝缘体2， 检测部3和第二绝缘体4层叠在动态施加方向F上，并且检测部3具有暴露的电连接面3a，而不在紧密接触面侧的主表面上被第一绝缘体2覆盖 与第一绝缘体2.版权所有（C）2005，JPO＆NCIPI

公开(公告)号：JP2005174811A

公开(公告)日：2005-06-30

申请号：JP2003415027

申请日：2003-12-12

Applicant: Jeol Ltd ,  日本電子株式会社

Inventor： HOSOKAWA FUMIO

IPC: G21K1/087 ,  G21K1/08 ,  G21K1/093 ,  G21K5/04 ,  H01J3/14 ,  H01J37/153 ,  H01L21/027

CPC classification number: H01J37/153

Abstract: PROBLEM TO BE SOLVED: To provide a supplemental function for a spherical aberration correction optical system 5, simply deciding a control parameter at any time while canceling a deflection field and quadrupole field of a multipolar field generating device.
SOLUTION: In order to provide the spherical aberration correction optical system with a signal continuously changing its amplitude at a frequency f against an actual time t, a period changing circuit 15 is arranged between a control device 14 and a power source 13, the control device 14 for deciding the control parameter of the spherical aberration correction optical system 5 and a parameter for canceling the deflection field and the quadrupole field, and the power source 13 for supplying an electric potential or a magnetic potential to the spherical aberration correction optical system 5 depending on a signal from the control device 14.
COPYRIGHT: (C)2005,JPO&NCIPI

Abstract translation: 要解决的问题：为了提供球面像差校正光学系统5的补充功能，简单地在消除多极场产生装置的偏转场和四极场的同时确定控制参数。 解决方案：为了使球面像差校正光学系统具有以相对于实际时间t在频率f连续地改变其幅度的信号，在控制装置14和电源13之间设置周期改变电路15， 用于确定球面像差校正光学系统5的控制参数的控制装置14和用于抵消偏转场和四极场的参数，以及用于向球面像差校正光学系统提供电位或磁电位的电源13 系统5取决于来自控制装置14的信号。版权所有（C）2005，JPO＆NCIPI

公开(公告)号：JP2005140782A

公开(公告)日：2005-06-02

申请号：JP2004320126

申请日：2004-11-04

Applicant: Pacific Nanotechnology Inc ,  パシフィック・ナノテクノロジー・インコーポレーテッド

Inventor： WEST PAUL E ,  BECKER RICHARD S ,  PENG ZHIQIANG

IPC: G01B21/30 ,  G01Q20/00 ,  G01Q30/02 ,  G01Q60/32 ,  G01Q60/38 ,  G01Q70/04 ,  H01J3/14 ,  H01J5/16 ,  G01N13/10 ,  G01N13/16 ,  G01N13/22

CPC classification number: G01Q10/045 ,  G01Q60/38

Abstract: PROBLEM TO BE SOLVED: To make it easy to align a specimen to be scanned with its area, to make it easy to bring a probe safely and quickly close to the surface of the specimen, and to make it easy to rapidly scan the specimen. SOLUTION: A vibrator is actuated all over a frequency range. The amplitude of an electric current is determined all over the frequency range. A frequency is selected from a current-vs.-frequency curve. An optical microscope is used to position the probe connected to the vibrator at an area on the surface of the specimen to be scanned. The probe is moved toward the specimen as the vibrator vibrates the probe. Further, an acoustic frequency generated by the vibrator is detected when the vibrating probe is moved to approximately within 100 nanometers of the specimen. An atomic force interaction is detected when the probe is moved to the vicinity of the specimen. The specimen is scanned after the presence of the probe is detected in the vicinity of the specimen. COPYRIGHT: (C)2005,JPO&NCIPI

Abstract translation: 要解决的问题：为了使被扫描样本与其区域对准变得容易，使探针安全，快速地靠近样本表面容易，并使其容易快速扫描 标本。 解决方案：振动器在整个频率范围内启动。 在整个频率范围内确定电流的幅度。 频率从电流对频率曲线中选择。 使用光学显微镜将连接到振动器的探针定位在待扫描样品的表面上的区域。 当振动器振动探头时，探头朝向试样移动。 此外，当振动探针移动到样本的大约100纳米内时，检测由振动器产生的声频。 当探针移动到样品附近时，检测原子力相互作用。 在样品附近检测到探针的存在后，扫描样品。 版权所有（C）2005，JPO＆NCIPI

公开(公告)号：JP2004127930A

公开(公告)日：2004-04-22

申请号：JP2003305267

申请日：2003-08-28

Applicant: Hitachi High-Technologies Corp ,  株式会社日立ハイテクノロジーズ

Inventor： OSE YOICHI ,  SATO MITSUGI ,  TODOKORO HIDEO ,  ESUMI MAKOTO ,  ARAI NORIAKI ,  DOI TAKASHI

IPC: G01Q10/00 ,  G01Q20/02 ,  G01Q30/02 ,  H01J3/14 ,  H01J29/70 ,  H01J37/153 ,  H01J37/28

CPC classification number: H01J37/153 ,  H01J2237/1506 ,  H01J2237/1534 ,  H01J2237/28

Abstract: PROBLEM TO BE SOLVED: To provide a charged particle beam apparatus in which there is few degradation of resolution even if the beam is slanted toward a sample.
SOLUTION: The orbit of the primary beam 4 against a plurality of lenses 6, 7 is made to pass through to the outside of axis by means of a deflector or a movable throttling, and by controlling its outside-the-axis orbit, a means is equipped to cancel aberration which is generated at the objective lens 7 at beam tilting by means of aberration of another lens 6.
COPYRIGHT: (C)2004,JPO

公开(公告)号：JP2004126482A

公开(公告)日：2004-04-22

申请号：JP2002319135

申请日：2002-10-31

Applicant: Ricoh Co Ltd ,  株式会社リコー

Inventor： MAKINO HIDEYO

IPC: B41J2/44 ,  G02B26/08 ,  G02B26/10 ,  G02B26/12 ,  H01J3/14 ,  H01J5/16 ,  H04N1/113 ,  H04N1/12 ,  H04N1/191 ,  H04N1/23

CPC classification number: G02B26/123 ,  H04N1/1135 ,  H04N1/12 ,  H04N1/1911

Abstract: PROBLEM TO BE SOLVED: To provide a multiple-beam light source device capable of realizing high recording speed and high recording density, uniformly forming beam spot positions on a recording medium such as a photoreceptor and improving resolution and picture quality.
SOLUTION: In the multiple-beam light source device provided with a plurality of semiconductor laser arrays obtained by arraying light emitting points at the same interval in the same package and a deflector for deflecting laser beams emitted from these semiconductor laser arrays onto the recording medium, a sub-scanning beam pitch between an optional point on a virtual straight line X connecting respective light emitting points of preceding beams and a point of a beam adjacent to the preceding beam which corresponds to the optional point on the virtual straight line is P - (A/VM) × VS + C, where the interval of recording density is P, a main scanning speed is VM, a sub-scanning speed of the recording medium is VS, a main scanning interval between semiconductor laser arrays on the recording medium is A, and a beam pitch correction value is C.
COPYRIGHT: (C)2004,JPO

公开(公告)号：JP2004013078A

公开(公告)日：2004-01-15

申请号：JP2002170013

申请日：2002-06-11

Applicant: TOSHIBA TEC KK ,  TOSHIBA CORP

Inventor： ISHIKAWA DAISUKE ,  TANIMOTO KOJI ,  KOMIYA KENICHI ,  KAWAI HIROSHI

IPC: B41J2/44 ,  G02B26/10 ,  H01J3/14 ,  H04N1/036 ,  H04N1/113

Abstract: PROBLEM TO BE SOLVED: To prevent image quality from deteriorating by performing exact and accurate control. SOLUTION: A main control part 51 controls a movable beam (a) so that the passing position thereof is at the center position of the gap between a sensor SK and a sensor SJ, and measures a differential output of a sensor SP and a sensor SO, but then the main control part 51 measures a differential output of the sensor SP and the sensor SO at any time while driving the movable beam (a) to the center position of the gap between the sensor SK and the sensor SJ, and similarly controls the movable beam so as to be at the center position between the sensor SJ and the sensor SI. COPYRIGHT: (C)2004,JPO