Abstract:
An image sensor is provided to reduce cross talk and increase the sensitivity of the image sensor by reducing the amount of light flow out from the photoelectric conversion element. An image sensor comprises a substrate(100), a reflector(102a), a photoelectric conversion element, and a hole basin(104a). The reflector is located on a surface of the substrate. The photoelectric conversion element is located on a surface of the reflector. The hole basin is positioned in the lower region of the photoelectric conversion element. The hole basin is positioned around the reflector. The hole basin is the area in which the high density P type impurity ion is injected.
Abstract:
An imaging device capable of preventing leakage current of a pixel is provided to prevent leakage current flowing into the pixel when all pixels connected to a column line are not selected. An imaging device(1000) comprises an active pixel sensor array(100), a leakage current suppression part(200), a reciprocity double sampling circuit(300), an analog-to-digital converting circuit(ADC)(400) and a raw driver(500). A plurality of pixels is connected to a column line. The leakage current suppression part comprises a leak current cut-off circuit. The leak current cut-off circuit blocks leakage current of the plurality of pixels. If all of the plural pixels are not selected, the leak current cut-off circuit provides leakage current suppression voltage to the column line. The leak current cut-off circuit is connected to the column line. The leak current cut-off circuit comprises an MOS transistor connected between a power terminal and the column line.
Abstract:
An image sensor which receives the light to the backplane is provided to improve the photo-charge transmission rate to the floating diffusion node from the photo diode. An image sensor comprises the semiconductor substrate(P), the floating diffusion node(FDN), the photo diode(PD), the transfer channel region(CH_T), and the photo transmission gate line. The floating diffusion node is formed on the first side(FRONT) of the semiconductor substrate. The photo diode is formed within the semiconductor substrate. The photo diode produces the photo-charges corresponding to the light which is income to the second side of the semiconductor substrate. The transfer channel region transmits the photo-charge generated in the photo diode to the floating diffusion node in response to the transmission control signal. The photo transmission gate line is arranged on the domain corresponded to the photo diode and transfer channel region on the first side of the semiconductor substrate.
Abstract:
CMOS 이미지 센서 회로가 개시된다.상기 CMOS 이미지 센서는 2개의 단위 픽셀들로 이루어진 다수의 단위 블록들을 구비한다. 상기 단위 픽셀들은 플로팅 디퓨전, 리셋 트랜지스터, 드라이브 트랜지스터, 및 셀렉션 트랜지스터를 공유한다. 상기 단위 픽셀들 각각은 육각형 구조의 포토 다이오드, 상기 포토 다이오드로부터 발생되는 광전하의 상기 플로팅 디퓨전으로의 전송을 제어하는 트랜스퍼 트랜지스터, 및 상기 포토 다이오드로 입사되는 빛을 필터링하기 위한 컬러 필터를 더 구비한다. 상기 단위 픽셀들 각각의 필터는 동일한 색을 필터링하는 컬러 필터이다. 상기 CMOS 이미지 센서 회로는 디지털 카메라, 모바일 기기, 컴퓨터용 카메라 등에 구비될 수 있다. 육각형 포토 다이오드, 허니콤, 공유 플로팅 디퓨전
Abstract:
컬러 보정 블럭을 구비하는 CMOS이미지 센서 및 그 이미지 센싱 방법이 개시된다. 상기 CMOS이미지 센서는 로우 디코더, 픽셀 어레이, CDS 블럭, 아날로그 디지털 변환기, 및 컬럭 보정 블럭을 구비하며, 상기 컬럭 보정 블럭은 상기 아날로그 디지털 변환기에서 출력된 이미지 데이터, 컬러 보정 파라미터들, 및 줌 배율의 정보를 가지는 신호에 기초하여 CMOS이미지 센서의 출력 이미지의 Gr과 Gb차이를 보정하여 이미지의 쉐이딩 현상 및 색조 불량을 개선할 수 있다. 이미지 센서, 컬러 보정
Abstract:
A CMOS(Complementary Metal Oxide Semiconductor) image sensor and an image sensing method using the same are provided to improve resolution by improving a degree of integration through floating diffusion for sharing a circuit between unit pixels, support a pixel summation mode, and implement overflow drain which is generated at high illumination. A CMOS(Complementary Metal Oxide Semiconductor) image sensor include plural unit blocks configured with two unit pixels. Each of the unit blocks comprises the followings. Two photo diodes(130,140) have a hexagon structure. The two unit pixels share floating diffusion(135). First and second transfer transistors(131,141) are installed between the photo diodes and the floating diffusion. A reset transistor(134) is connected with the floating diffusion. A drive transistor is connected with the floating diffusion and a gate. A selection transistor is serially connected with the drive transistor.
Abstract:
A CMOS(Complementary Metal-Oxide Semiconductor) image sensor for reducing size of an optical black area is provided to reduce whole area of the CMOS image sensor by reducing the size of the optical black area. An active pixel array(110) includes a plurality of active pixel rows each of which includes a plurality of active pixels. An optical black area(120) includes one optical black pixel row which includes one or more optical black pixels. A video signal processing part(140) removes offsets of video signals outputted from the active pixel rows based on an optical black signal outputted from the optical black pixel row, and generates corrected video signals. The video signal processing part uses the optical black signal in order to remove the offsets of the video signals outputted from the active pixel rows.
Abstract:
A pixel circuit having a boosting capacitor, a method for driving the pixel circuit, and an image sensor including the pixel circuit are provided to improve the rate of photocharge transfer from a photodiode to a floating diffusion node by boosting the voltage of the floating diffusion node to a voltage higher than a power supply voltage by using the boosting capacitor. A pixel circuit includes a photodiode(PD), a transfer transistor(TTr), a reset transistor(RTr), a signal output unit(302), and a boosting capacitor(Cb). The photodiode generates photocharges corresponding to incident light. The transfer transistor transfers the photocharges to a floating diffusion node(FDN) in response to a transfer control signal. The reset transistor transfers a power supply voltage to the floating diffusion node in response to a reset control signal. The signal output unit outputs a voltage signal corresponding to the voltage of the floating diffusion node in response to a select control signal. The boosting capacitor is connected between the gate of the transfer transistor and the floating diffusion node.
Abstract:
A CMOS(Complementary Metal Oxide Semiconductor) image sensor removing flicker noise and a method of removing flicker noise in a CMOS image sensor are provided to improve picture quality of the CMOS image sensor by removing the flicker noise. A CMOS image sensor(300) includes a pixel unit(310) and a signal processor(320). The pixel unit includes a plurality of pixel lines respectively having a plurality of pixels and sequentially exposes the pixel lines to external light for a predetermined time to sequentially generate initial image signals of the pixel lines. The signal processor calculates the average value of each initial image signal and an initial image signal prior to the initial image signal by a half period of the external light and outputs the average value as a corrected image signal of the pixel line outputting the initial image signal when the predetermined time is shorter than the half period of the external light. When the predetermined time is longer than the half period of the external light, the signal processor calculates the average value of each initial image signal and an initial image signal prior to the initial image signal by one and a half period and outputs the average value as a corrected image signal of the pixel line outputting the initial image signal.
Abstract:
이미지 센서의 수광부를 확장하여 크로스토그(crosstalk) 현상 또는 차광 현상을 감소시키고 광을 효과적으로 집중시킴으로써 광감도를 높일 수 있는 이미지 센서가 개시된다. 광축상에 렌즈, 복수의 마이크로 렌즈들이 소정의 패턴으로 형성되는 마이크로 렌즈 어레이, 소정의 패턴으로 형성되는 컬러필터 어레이, 소정의 패턴으로 형성되는 메탈 어레이 및 복수의 수광소자들이 소정의 패턴으로 형성되는 수광소자 어레이 순으로 배열되는 이미지 센서에 있어서, 마이크로 렌즈 어레이는 중심에 위치한 마이크로 렌즈로부터 멀어질수록 입사각에 반비례하여 간격이 좁아지고, 수광소자 어레이는 중심에 위치한 수광소자로부터 멀어질수록 입사각에 비례하여 간격이 넓어지는 것을 특징으로 한다.