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    114.
    发明专利
    未知

    公开(公告)号：DE10121732A1

    公开(公告)日：2002-11-07

    申请号：DE10121732

    申请日：2001-05-04

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN ,  HOFFMANN JUERGEN

    IPC: G02B21/00 ,  G02B21/24

    Abstract: The present invention concerns a microscope and a method for operating a microscope, in particular a confocal or double confocal scanning microscope, having an optical beam path (9) extending between a light source (1), a specimen (2), and a detector (7) and/or a detection optical system, in which context intentional and unintentional relative motions occur between the specimen (2) and the optical beam path (9), undesired relative motions of the microscope components in optical beam path (9) are intended to result in no (or only minor) image defects, and method steps are provided which eliminate or minimize the image defects brought about by undesired relative motions between the specimen (2) and optical beam path (9); and is characterized in that a first device (8) detects relative motions; and a second device (22) compensates for unintentional relative motions.

    117.
    发明专利
    未知

    公开(公告)号：DE10058100A1

    公开(公告)日：2002-06-06

    申请号：DE10058100

    申请日：2000-11-23

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN ,  KNEBEL WERNER

    IPC: G02B21/00

    Abstract: A portion of a specimen region to be examined with scan field, is scanned. The specimen stage in the X-Y plane is moved to scan the remaining portions of the specimen region, such that the entire specimen region is located within the scan fields. The specimen data obtained from all the scan fields are combined. An Independent claim is included for microscopic specimen scanning arrangement.

    118.
    发明专利
    未知

    公开(公告)号：DE10043986A1

    公开(公告)日：2002-03-14

    申请号：DE10043986

    申请日：2000-09-05

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN ,  HOFFMANN JUERGEN ,  KNEBEL WERNER

    IPC: G01N21/64 ,  G02B21/00

    Abstract: A method for examining a specimen (11) by means of a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for the specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11) comprises, in the interest of reliable definition of details or regions of interest of the specimen (11), the following method steps: Firstly a preview image is acquired. Then at least one region of interest in the preview image is marked. This is followed by allocation of individual illuminating light beam wavelengths and/or illuminating light beam power levels to the region or regions. Illumination of the region or regions of the specimen (11) in accordance with the allocation is then accomplished, at least one manipulation in at least one region (25) being performed by means of the illumination. Also described is a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for a specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11), means for acquiring a preview image and means for marking at least one region of interest in the preview image being provided, such that individual illuminating light beam wavelengths and/or illuminating light beam power levels can be allocated to the region or regions, and the region or regions of the specimen (11) can be illuminated in accordance with the allocation, and such that at least one manipulation in at least one region (25) can be performed by means of the illumination.

    119.
    发明专利
    未知

    公开(公告)号：DE10038622A1

    公开(公告)日：2002-02-21

    申请号：DE10038622

    申请日：2000-08-03

    Applicant: LEICA MICROSYSTEMS

    Inventor： ENGELHARDT JOHANN ,  HOFFMANN JUERGEN

    IPC: G02B5/10 ,  G02B7/198 ,  G02B21/00 ,  G02B21/06 ,  G02B26/10 ,  G02B21/04

    Abstract: A scanning microscope, in particular a confocal scanning microscope, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is, with a view to fast and reliable image-data acquisition and a compact structure, configured and refined in such a way that the scanning device has at least one micromirror (16). An optical arrangement with a light source (1), preferably a laser, for generating a light beam and at least one micromirror (16) for deflecting the light beam is furthermore provided, in which an adaptive lens (22) is provided for correcting for mirror defects or deformation of the mirror surface. Lastly, a method for imaging in scanning microscopy, in particular in confocal scanning microscopy, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is provided, in which at least one micromirror (16) is used in the scope of the scanning device.

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