Abstract:
Die Erfindung betrifft ein Verfahren zur Herstellung von Prägewerkzeugen (3, 3'), die aus einem Substrat (3, 3') bestehen, in dessen Oberfläche Prägestrukturen für Mikrostrukturelemente, wie Hologramme, Nanostrukturen oder dergleichen, eingebracht werden. Erfindungsgemäß werden die Prägestrukturen für die Mikrostrukturelemente in die Oberfläche des Substrats (3, 3') mittels ultrakurzer Laserpulse aus polarisierten elektromagnetischen Wellen bzw. polarisierter elektromagnetischer Strahlung eingebracht. Es wird somit ein Verfahren der Oberflächenstrukturierung benutzt, um Prägewerkzeuge (3, 3') für Mikrostrukturelemente herzustellen. Damit kann die Originalstruktur direkt auf die Oberfläche eines Prägewerkzeugs übertragen und davon Folienabzüge angefertigt werden.
Abstract:
A MEMS device is described that has a body with a component bonded to the body. The body has a main surface and a side surface adjacent to the main surface and smaller than the main surface. The body is formed of a material and the side surface is formed of the material and the body is in a crystalline structure different from the side surface. The body includes an outlet in the side surface and the component includes an aperture in fluid connection with the outlet.
Abstract:
The present disclosure relates to methods of treating a silicon substrate with an ultra-fast laser to create a getter material for example in a substantially enclosed MEMS package. In an embodiment, the laser treating comprises irradiating the silicon surface with a plurality of laser pulses adding gettering microstructure to the treated surface. Semiconductor based packaged devices, e.g. MEMS, are given as examples hereof.
Abstract:
The invention relates to a method for manufacturing nanometer-scale apertures, wherein, in an object, in a conventional manner, at least one aperture is provided with a nanometer-scale surface area, after which, by means of an electron beam, energy is supplied to at least the edge of said at least one aperture, such that the surface area of the respective aperture is adjusted, wherein the surface area of the aperture is controlled during adjustment and the supply of energy is regulated on the basis of the surface area change.
Abstract:
A micromachining method using an ionbeam, characterized in that it comprises injecting an Ga ion controlled to have a predetermined ion beam diameter and ion current density into the surface of a Ga x In 1−x As y P 1−y (0 ≤ x, y ≤ 1) layer, including a GaAs and InP substrate, in a condition wherein an oxide film is formed on its surface or the surface is being irradiated with oxygen molecules, to thereby convert the oxide selectively to Ga 2 O 3 or Ga 2 O or form the gallium oxide, and then subjecting the surface of the Ga x In 1−x As y P 1−y layer to a dry etching on one atomic layer basis by the use of a bromide to remove the above oxide film formed on the surface and the Ga x In 1−x As y P 1−y layer which have not converted to Ga 2 O 3 or Ga 2 O.
Abstract translation:一种使用离子束的微加工方法,其特征在于,其包括将控制的具有预定离子束直径和离子电流密度的Ga离子注入到Ga x Sb 1-x < / sb> As y sb> P 1-y sb>(0≤x,y≤1)层,包括GaAs和InP衬底,在形成氧化物膜的条件下 在其表面或表面上被氧分子照射,从而将氧化物选择性地转化为Ga 2 O 3 s 3或Ga 2 S 2 O 3,或 形成氧化镓,然后使Ga x Sb 1-x Sb的表面经受1 / sb>层通过使用溴化物去除在表面上形成的上述氧化膜和Ga x Sb 1-x Seb的一个原子层的干法蚀刻。 作为尚未转换为Ga sb> O 3 b>或Ga sb> 2的 y sb> P 1-y sb>层 SB> 0。
Abstract:
A microelectromechanical device (MEMD) defined within a substrate of a MEMS includes a mass element defining an area of interest. The device also includes a support beam supporting the mass element in spaced-apart relationship from the substrate. The support beam includes a first beam member defined by a first fixed end connected to the substrate, and a first free end connected to the mass element. The support beam further includes a second beam member defined by a second fixed end connected to the substrate, and a second free end connected to the mass element. The beam members are in spaced-apart relationship from one another. A first cross member connects the first beam member and the second beam member. Preferably, the support beam includes a plurality of cross members. Two such support beams can be used to support a mass element in a MEMD in a bridge configuration.
Abstract:
A process for fabricating a suspended microelectromechanical system (MEMS) structure comprising epitaxial semiconductor functional layers that are partially or completely suspended over a substrate. A sacrificial release layer and a functional device layer are formed on a substrate. The functional device layer is etched to form windows in the functional device layer defining an outline of a suspended MEMS device to be formed from the functional device layer. The sacrificial release layer is then etched with a selective release etchant to remove the sacrificial release layer underneath the functional layer in the area defined by the windows to form the suspended MEMS structure.
Abstract:
The present invention relates to methods for joining materials as well as articles manufactured using such processes. The invention pertains to a process for joining a first substrate to a second substrate. The process includes irradiating a portion of a first substrate with a laser beam having a first wavelength and intensity sufficient to increase the absorbance of the first substrate to light having a second, different wavelength. The laser beam may carbonize at least a portion of the irradiated portion of the first substrate imparting a higher absorbance to light than non-irradiated portions of the first substrate. A second substrate is then placed in contact with the irradiated portion of the first substrate. The first substrate is then irradiated with a second laser having a second wavelength, different to the first wavelength; with a sufficient intensity to heat and, preferably melt, the irradiated portion of the first substrate.
Abstract:
A patterned circuit, including a hydrophilic substrate, a hydrophobic layer formed on the hydrophilic substrate, and a pattern formed in the hydrophobic layer to expose the hydrophilic substrate.