光谱分析方法和系统
    112.
    发明公开

    公开(公告)号:CN1065337A

    公开(公告)日:1992-10-14

    申请号:CN92102131.3

    申请日:1992-03-21

    CPC classification number: G01N21/67 G01J3/30 G01J3/443 G01N21/718

    Abstract: 一种利用光谱分析,对样品中依组分状态而分类的各组分进行定量分析,其步骤如下,多次激励样品,使之辐射,检测每次辐射中样品的组分元素和非组分元素的谱线光强度数据,存储谱线的光强度数据,依据存储的数据,认定组分元素和非组分元素含量在预定含量之上的辐射,确定在样品上对应于认定的辐射的区域中存在组分元素和非组分元素的复合物。

    ANALIZADOR DE ESPECTROSCOPIA DE PLASMA INDUCIDO POR LASER

    公开(公告)号:PE07912015A1

    公开(公告)日:2015-06-19

    申请号:PE0007682013

    申请日:2013-04-19

    Abstract: Un analizador de espectroscopia de plasma inducido por laser (LIBS) comprende una trayectoria optica P (mostrada por la linea de rayas P1 y la linea de rayas- puntos P2) y un sistema de enfoque (o seguimiento) automatico. La trayectoria optica P enfoca un rayo laser emitido desde un laser sobre una porcion de una muestra S que va a ser analizada por el analizador, y enfoca la radiacion emitida por la muestra S cuando es irradiada por el rayo laser a un detector. El sistema de enfoque automatico es capaz de variar una longitud de la trayectoria optica P para mantener una relacion espacial constante (es decir, una distancia) entre un punto de enfoque del rayo laser y la muestra S; asi como mantener un campo de vision instantaneo constante (IFOV) del detector sobre el punto focal del laser

    METHOD FOR DETECTING AND ANALYZING SURFACE FILMS
    115.
    发明申请
    METHOD FOR DETECTING AND ANALYZING SURFACE FILMS 审中-公开
    检测和分析表面膜的方法

    公开(公告)号:WO2016057990A3

    公开(公告)日:2016-08-18

    申请号:PCT/US2015055102

    申请日:2015-10-12

    Applicant: ORTHOBOND INC

    CPC classification number: G01J3/443 G01N21/73 G01N21/8422

    Abstract: Disclosed herein are embodiments of a novel method and system to analyze films using plasma to produce spectral data and analyzing the spectral data. A method of analyzing a film comprising: contacting the film with plasma to produce spectral lines; and analyzing the spectral lines.

    Abstract translation: 本文公开了一种用等离子体分析膜以产生光谱数据并分析光谱数据的新颖方法和系统的实施例。 一种分析薄膜的方法,包括:使薄膜与等离子体接触以产生光谱线; 并分析谱线。

    METHOD AND SYSTEM FOR OBTAINING GEOCHEMISTRY INFORMATION FROM PYROLYSIS INDUCED BY LASER INDUCED BREAKDOWN SPECTROSCOPY
    116.
    发明申请
    METHOD AND SYSTEM FOR OBTAINING GEOCHEMISTRY INFORMATION FROM PYROLYSIS INDUCED BY LASER INDUCED BREAKDOWN SPECTROSCOPY 审中-公开
    用激光诱导的断裂光谱诱导的热解获得地球化学信息的方法和系统

    公开(公告)号:WO2016028658A1

    公开(公告)日:2016-02-25

    申请号:PCT/US2015/045451

    申请日:2015-08-17

    Applicant: INGRAIN, INC.

    Abstract: A method for determining geochemistry of at least one geological sample with laser-induced breakdown spectral measurements performed on the geological sample in a time variant manner with spectral acquisitions made after each of a plurality of measurement shots, spectral preprocessing performed as necessary, and subsequent analysis is applied to the collected data to determine at least one geochemistry parameter of the sample. The method can provide a rapid method to estimate thermal maturity of a sample, which does not require sample preparation, and which can be non-destructive with respect to portions of the sample. A system for performing the method also is provided.

    Abstract translation: 一种确定至少一个地质样品的地球化学的方法,所述地质学样品具有激光诱发的击穿光谱测量,以时变方式在多个测量射击之后进行光谱采集,根据需要进行光谱预处理,随后进行分析 应用于收集的数据以确定样品的至少一个地球化学参数。 该方法可以提供用于估计样品的热成熟度的快速方法,其不需要样品制备,并且对于样品的部分可以是非破坏性的。 还提供了一种用于执行该方法的系统。

    SYSTEME ET PROCEDE DE SPECTROMETRIE DE DECHARGE LUMINESCENTE ET DE MESURE IN SITU DE LA PROFONDEUR DE GRAVURE D'UN ECHANTILLON
    117.
    发明申请
    SYSTEME ET PROCEDE DE SPECTROMETRIE DE DECHARGE LUMINESCENTE ET DE MESURE IN SITU DE LA PROFONDEUR DE GRAVURE D'UN ECHANTILLON 审中-公开
    用于测量样品表面深度的玻璃放电光谱法和系统

    公开(公告)号:WO2015166186A1

    公开(公告)日:2015-11-05

    申请号:PCT/FR2015/051156

    申请日:2015-04-28

    Abstract: La présente invention concerne un système de spectrométrie de décharge luminescente comprenant une lampe à décharge luminescente adaptée pour recevoir un échantillon (10) solide et former un plasma (19) de gravure par décharge luminescente. Selon l'invention, un système (100) de mesure in situ ôe la profondeur du cratère d'érosion généré par gravure de l'échantillon (10) comporte un séparateur optique (3) des moyens optiques (4) adaptés pour diriger, respectivement, un premier faisceau incident (21 ) vers une première zone (1 1 ) de l'échantillon exposée au plasma de gravure et un deuxième faisceau incident (22) vers une deuxième zone (12) de la même face de l'échantillon protégée vis-à-vis du plasma de gravure et un dispositif de recombinaison optique (3) adapté pour former un faisceau interférométrique (30) de manière à déterminer la profondeur (d) du cratère d'érosion.

    Abstract translation: 本发明涉及一种辉光放电光谱系统,其包括适于接收固体样品(10)并形成辉光放电蚀刻等离子体(19)的辉光放电灯。 根据本发明,用于原位测量通过蚀刻样品(10)产生的侵蚀坑的深度的系统(100)包括光学分离器(3),适于引导第一入射光束的光学装置(4) 21)朝向样品的第一区域(11),该区域暴露于蚀刻等离子体,以及朝向样品的同一侧的第二区域(12)的第二入射光束(22),该区域被保护 蚀刻等离子体和适于形成干涉光束(30)的光学重组装置(3),以便确定侵蚀坑的深度(d)。

    QUANTITATIVE ANALYSIS METHOD FOR ANALYZING THE ELEMENTAL COMPOSITION OF MATERIALS BY MEANS OF LIBS TECHNIQUE
    118.
    发明申请
    QUANTITATIVE ANALYSIS METHOD FOR ANALYZING THE ELEMENTAL COMPOSITION OF MATERIALS BY MEANS OF LIBS TECHNIQUE 审中-公开
    用LIBS技术分析材料元素组成的定量分析方法

    公开(公告)号:WO2015104049A1

    公开(公告)日:2015-07-16

    申请号:PCT/EP2014/050224

    申请日:2014-01-08

    CPC classification number: G01N21/718 G01J3/443

    Abstract: The quantitative analysis method for analyzing the composition of materials of the invention is based on a functional relationship (curve Cσ) between line intensity and the concentration of the element in the material. The method comprises: obtaining characteristic parameters, selecting the spectral lines of neutral atoms and ions of the elements of interest, obtaining their atomic data; calculating, for the selected lines, a line crosssection; measuring line intensities; determining the concentrations of the elements of interest by means of fitting two graphs Cσ, one for neutral atoms and another for ions with a unit charge, the fitting being performed by means of an iterative algorithm which compares the experimental graphs with the curves Cσ calculated with a plasma model; calculating, for the data of the graphs Cσ, the product of line optical depth by Lorentzian width; evaluating, for the data of the graphs Cσ, a condition on the validity limit of the model, the datum for which the mentioned product is greater being eliminated if the condition is not complied with; repeating the three preceding steps until all data comply with the mentioned condition. The invention has the advantage of not requiring prior calibrations.

    Abstract translation: 用于分析本发明材料组成的定量分析方法基于线强度与材料中元素浓度之间的函数关系(曲线Cσ)。 该方法包括:获得特征参数,选择感兴趣元素的中性原子和离子的光谱线,获得其原子数据; 对于所选择的线,计算线路横截面; 测量线强度; 通过拟合两个曲线Cσ,一个用于中性原子,另一个用于具有单位电荷的离子来确定感兴趣元素的浓度,该拟合通过迭代算法进行,该迭代算法将实验图与用C 等离子体模型; 对于曲线Cσ的数据,计算线光学深度乘以洛伦兹宽度的乘积; 对图形Cσ的数据进行评估,如果条件不符合则消除模型的有效期限的条件,所述产品更大的数据被消除; 重复上述三个步骤,直到所有数据符合上述条件。 本发明具有不需要事先校准的优点。

    LASER-ABLATION-BASED MATERIAL ANALYSIS SYSTEM WITH A POWER/ENERGY DETECTOR
    119.
    发明申请
    LASER-ABLATION-BASED MATERIAL ANALYSIS SYSTEM WITH A POWER/ENERGY DETECTOR 审中-公开
    具有功率/能量检测器的基于激光雷达的材料分析系统

    公开(公告)号:WO2015103492A1

    公开(公告)日:2015-07-09

    申请号:PCT/US2015/010062

    申请日:2015-01-02

    Abstract: A laser ablation system and methods are disclosed for performing material analysis. The laser ablation system includes a sample chamber which holds and encloses a sample material to be ablated; a laser source that produces a laser beam which is directed into the sample chamber to a surface of the sample material to cause laser ablation; a laser measuring device which is physically attached to the sample chamber to measure a power/energy value of the laser beam; and a material analyzing module that is coupled to the sample chamber to receive the ablated material from laser ablation of the sample material.

    Abstract translation: 公开了用于进行材料分析的激光烧蚀系统和方法。 激光烧蚀系统包括:样品室,其保持和封闭待烧蚀的样品材料; 产生激光束的激光源,所述激光束被引导到样品室到样品材料的表面以引起激光烧蚀; 激光测量装置,物理地附接到样品室以测量激光束的功率/能量值; 以及材料分析模块,其耦合到所述样品室以从所述样品材料的激光烧蚀接收所述烧蚀材料。

    HIGH SPEED SPECTROSCOPIC SENSOR ASSEMBLY AND SYSTEM
    120.
    发明申请
    HIGH SPEED SPECTROSCOPIC SENSOR ASSEMBLY AND SYSTEM 审中-公开
    高速光谱传感器组件和系统

    公开(公告)号:WO2015017623A1

    公开(公告)日:2015-02-05

    申请号:PCT/US2014/049062

    申请日:2014-07-31

    Applicant: TSI, INC.

    Abstract: A laser-based spectroscopy system that combines a distance/proximity standoff sensor, a high-repetition rate laser spectroscopy system, and software with a decision-making algorithm embedded in a processing unit which in combination performs selective firing of the laser when the target object is within an interrogation zone. In a related embodiment, the system provides selective sorting of spectroscopic signals based on information from the standoff signal and from information contained in the spectral signals themselves. The laser emission can be actively controlled while keeping the laser firing, thereby preserving the thermal stability and hence the power of the laser; and the standoff sensor information and the spectral information can be combined to determine the proper relative weighting or importance of each piece of spectral information.

    Abstract translation: 一种基于激光的光谱系统,其将距离/接近距离传感器,高重复率激光光谱系统和软件与嵌入在处理单元中的决策算法组合,该组合方法在目标物体上组合执行激光的选择性点火 在询问区内。 在相关实施例中,系统基于来自间隔信号的信息和从包含在频谱信号本身中的信息提供对光谱信号的选择性分类。 可以在保持激光烧制的同时主动地控制激光发射,从而保持激光的热稳定性和因此的功率; 并且可以组合对立传感器信息和光谱信息以确定每条光谱信息的适当的相对权重或重要性。

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