Abstract:
Un analizador de espectroscopia de plasma inducido por laser (LIBS) comprende una trayectoria optica P (mostrada por la linea de rayas P1 y la linea de rayas- puntos P2) y un sistema de enfoque (o seguimiento) automatico. La trayectoria optica P enfoca un rayo laser emitido desde un laser sobre una porcion de una muestra S que va a ser analizada por el analizador, y enfoca la radiacion emitida por la muestra S cuando es irradiada por el rayo laser a un detector. El sistema de enfoque automatico es capaz de variar una longitud de la trayectoria optica P para mantener una relacion espacial constante (es decir, una distancia) entre un punto de enfoque del rayo laser y la muestra S; asi como mantener un campo de vision instantaneo constante (IFOV) del detector sobre el punto focal del laser
Abstract:
An assembly for spectroscopy in a gas turbine comprises a laser for emitting an ignition laser pulse, an optical detector, and an optical probe. The probe (100) comprises a body (110) having a passageway (120) arranged therethrough to define an optical path P, an optical focussing member (130) arranged in the passageway (120) to define an optical focal point FP in a region R therebeyond, a first optical window (140) arranged in the passageway (120) between the optical focussing member (130) and the optical focal point FP, a first sealing member (150) arranged between the first optical window (140) and the body (110) to isolate the passageway (120) from the region R, a second window (160) arranged in the passageway at an opposite end of the probe to the first optical window, and a second sealing member (152) located between the second optical member and the end of the body.
Abstract:
Disclosed herein are embodiments of a novel method and system to analyze films using plasma to produce spectral data and analyzing the spectral data. A method of analyzing a film comprising: contacting the film with plasma to produce spectral lines; and analyzing the spectral lines.
Abstract:
A method for determining geochemistry of at least one geological sample with laser-induced breakdown spectral measurements performed on the geological sample in a time variant manner with spectral acquisitions made after each of a plurality of measurement shots, spectral preprocessing performed as necessary, and subsequent analysis is applied to the collected data to determine at least one geochemistry parameter of the sample. The method can provide a rapid method to estimate thermal maturity of a sample, which does not require sample preparation, and which can be non-destructive with respect to portions of the sample. A system for performing the method also is provided.
Abstract:
La présente invention concerne un système de spectrométrie de décharge luminescente comprenant une lampe à décharge luminescente adaptée pour recevoir un échantillon (10) solide et former un plasma (19) de gravure par décharge luminescente. Selon l'invention, un système (100) de mesure in situ ôe la profondeur du cratère d'érosion généré par gravure de l'échantillon (10) comporte un séparateur optique (3) des moyens optiques (4) adaptés pour diriger, respectivement, un premier faisceau incident (21 ) vers une première zone (1 1 ) de l'échantillon exposée au plasma de gravure et un deuxième faisceau incident (22) vers une deuxième zone (12) de la même face de l'échantillon protégée vis-à-vis du plasma de gravure et un dispositif de recombinaison optique (3) adapté pour former un faisceau interférométrique (30) de manière à déterminer la profondeur (d) du cratère d'érosion.
Abstract:
The quantitative analysis method for analyzing the composition of materials of the invention is based on a functional relationship (curve Cσ) between line intensity and the concentration of the element in the material. The method comprises: obtaining characteristic parameters, selecting the spectral lines of neutral atoms and ions of the elements of interest, obtaining their atomic data; calculating, for the selected lines, a line crosssection; measuring line intensities; determining the concentrations of the elements of interest by means of fitting two graphs Cσ, one for neutral atoms and another for ions with a unit charge, the fitting being performed by means of an iterative algorithm which compares the experimental graphs with the curves Cσ calculated with a plasma model; calculating, for the data of the graphs Cσ, the product of line optical depth by Lorentzian width; evaluating, for the data of the graphs Cσ, a condition on the validity limit of the model, the datum for which the mentioned product is greater being eliminated if the condition is not complied with; repeating the three preceding steps until all data comply with the mentioned condition. The invention has the advantage of not requiring prior calibrations.
Abstract:
A laser ablation system and methods are disclosed for performing material analysis. The laser ablation system includes a sample chamber which holds and encloses a sample material to be ablated; a laser source that produces a laser beam which is directed into the sample chamber to a surface of the sample material to cause laser ablation; a laser measuring device which is physically attached to the sample chamber to measure a power/energy value of the laser beam; and a material analyzing module that is coupled to the sample chamber to receive the ablated material from laser ablation of the sample material.
Abstract:
A laser-based spectroscopy system that combines a distance/proximity standoff sensor, a high-repetition rate laser spectroscopy system, and software with a decision-making algorithm embedded in a processing unit which in combination performs selective firing of the laser when the target object is within an interrogation zone. In a related embodiment, the system provides selective sorting of spectroscopic signals based on information from the standoff signal and from information contained in the spectral signals themselves. The laser emission can be actively controlled while keeping the laser firing, thereby preserving the thermal stability and hence the power of the laser; and the standoff sensor information and the spectral information can be combined to determine the proper relative weighting or importance of each piece of spectral information.