Abstract:
Ensemble spectromètre synchrone à phases multiples appliqué à une source modulée de rayonnement optique à plusieurs longueurs d'onde, procédés et utilisations associés La présente invention a pour objet un ensemble spectromètre synchrone à phases multiples (1) appliqué à une source modulée de rayonnement optique à plusieurs longueurs d'onde (1b) dans lequel le faisceau provenant de la source est divisé en deux faisceaux identiques modulés en quadrature, les deux faisceaux étant acquis par au moins un spectromètre pour calculer le spectre d'amplitude et le spectre de phase de la source modulée de rayonnement optique à plusieurs longueurs d'onde (1b). L'invention porte également sur des procédés et utilisations associés.
Abstract:
본 발명은 입사되는 대상체의 광스펙트럼의 일부 파장대역의 광을 광흡수하거나 광반사하는 제1 단위분광필터와, 상기 일부 파장대역과 다른 파장대역의 광을 광흡수하거나 광반사하는 제2단위분광필터와, 상기 제 1단위분광필터를 투과하는 제1 광스펙트럼을 검출하기 위한 제 1광검출기와, 상기 제 2단위분광필터를 투과하는 제2 광스펙트럼을 검출하기 위한 제 2광검출기와, 상기 제 1광검출기 및 제 2광검출기로부터 검출된 광의 스펙트럼으로부터 입사한 상기 대상체의 광 스펙트럼을 재구성하는 기능을 수행하는 프로세싱 유닛을 구비하는 분광기를 개시한다.
Abstract:
Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising a sample receiving location (2) for receiving a sample (3) for analysis; an illumination arrangement (4) for directing light towards a received sample; a detector (6) for detecting light reflected by a received sample; and collection optics (5) for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer (42) and a half beam block (45a, 45b) which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from reentering the interferometer. A half beam block (45a) may be disposed in the optical path between the interferometer and the light source (41) for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam block (45b) may be disposed in the optical path on the opposite side of the interferometer than the light source.
Abstract:
A multi-channel infrared spectrometer for detecting an infrared spectrum of light received from an object. The spectrometer comprises a wavelength converter system comprising a nonlinear material and having an input side and an output side. The wavelength converter system comprises at least a first up-conversion channel and a second up-conversion channel, and is arranged such that light traversing the wavelength converter system at different angles in the nonlinear material is imaged into different positions in an image plane. The first up- conversion channel is configurable for phase-matching infrared light in a first input wavelength range incident on the first side and light in a first output wavelength range output on the second side, and correspondingly, the second up-conversion channel is configurable for phase-matching infrared light in a second input wavelength range incident on the first side into light in a second output wavelength range output on the second side. The spectrometer further comprises a demultiplexer configured for demultiplexing light in the first up-conversion channel and light in the second up-conversion channel. The demultiplexer is located on the first side or the second side of the wavelength converter system. Finally, the spectrometer comprises a spatially resolved detector arranged in the image plane to detect light in the first output wavelength range and second output wavelength range output of the wavelength converter system.
Abstract:
Methods and designs for providing reduced sensitivity to mirror tilt in Fourier transform spectrometers are disclosed. According to an embodiment for two-directional tilt compensation, the FT spectrometer can include a beam splitter positioned to receive an incoming beam from a light source and split the incoming beam into a first sub-beam and a second sub-beam, a comer-cube retroreflector positioned to receive the first sub-beam from the beam splitter, a dual reflective mirror positioned to receive the first sub-beam from the corner-cube retroreflector at one surface and the second sub-beam at the other surface. An optical path delay can be created using a set of mirrors, tilting the beam splitter and/or a glass cube.
Abstract:
A multifunctional infrared spectrometer system (20) has an interferometer (27) which receives the infrared beam from a source (22) and provides a modulated output beam on beam paths to multiple spatially separated infrared detectors (77, 88). A multi-position mirror element (64) mounted at a junction position (63) receives the beam on a main beam path and directs it on branch beam paths to sample positions, with the beam then being directed on the branch beam path to one of the detectors (77, 88). One of the branch beam paths may include a sample holder (80) at the sample position which can index between a position at which a sample is analyzed, to a reference material position, or to a pass-through position for calibration purposes. The multi-position mirror element (64) may also be indexed to direct the beam on a branch path to a fiber optic cable (70, 76) including a probe (71). The multi-position mirror element (64) may be moved to a position at which the beam is directed on a beam path to and through an integrating sphere to a sample.
Abstract:
The invention relates to a miniaturised spectrometer, especially in the form of a probe, for detecting the contents of a gaseous or liquid fluid. The invention comprises a light source (3) and a spectrometer (2), at least one measuring beam and at least one reference beam. The invention is characterised in that the light of the light source (3) is optionally spread and bundled by means of at least one optical lens (8) to form an essentially parallel beam, in that at least one measuring beam is guided through a light-permeable aperture out of the probe and into the fluid to be examined and through an additional light-permeable aperture back into the probe, in that at least one reference beam is guided inside the probe, in that collecting optics (14) consisting of at least one lens that guides beams to the point of impact or the inlet of the spectrometer (2) are provided and in that a beam selector (7) is provided in the area of the collecting optics (14), whereby said point of impact pertains to a light conductor (5) and said selector accepts one of the partial beams respectively and interrupts the remaining beams.