公开(公告)号：GB2390937B

公开(公告)日：2005-08-24

申请号：GB0306967

申请日：2003-03-26

Applicant: BRUKER DALTONIK GMBH

Inventor： TSYBIN YOURI O ,  BAYKUT GOEKHAN

IPC: H01J49/08 ,  H01J49/10 ,  H01J49/14 ,  H01J49/16 ,  H01J49/38 ,  H01J49/42

Abstract: The present invention relates to a method and a device for irradiating ions in a ion cyclotron resonance (ICR) trap with photons and/or electrons. For electron irradiation a hollow electron emitter is used, through the hole of which a light beam can be sent into the ICR trap. The emitter generates a hollow, tubular electron beam. In a special application low energy ions within the tubular electron beam are irradiated with photons. The ions can be cyclotron-excited mass selectively, by which they enter the electron beam and interact with electrons.

公开(公告)号：GB2397435B

公开(公告)日：2005-05-18

申请号：GB0328446

申请日：2003-12-08

Applicant: MICROMASS LTD

Inventor： BATEMAN ROBERT HAROLD ,  BROWN JEFF ,  KENNY DANIEL JAMES

IPC: G01N15/00 ,  G01N27/00 ,  H01J43/06 ,  H01J43/12 ,  H01J43/24 ,  H01J49/02 ,  H01J49/08 ,  H01J49/10 ,  H01J49/26 ,  H01J49/40

公开(公告)号：GB2391695A

公开(公告)日：2004-02-11

申请号：GB0309510

申请日：2003-04-25

Applicant: BRUKER DALTONIK GMBH

Inventor： SCHWEIKHARD LUTZ ,  BAYKUT GOEKHAN

IPC: B01D59/44 ,  H01J1/88 ,  H01J3/02 ,  H01J27/00 ,  H01J37/065 ,  H01J49/00 ,  H01J49/08 ,  H01J49/10 ,  H01J49/14

Abstract: A electron source 52 for a mass spectrometer which produces electrons 54 by the application of an electrical current, directly through a filament or indirectly through a filament heater, is movable to an operating position (fig 6a) from a parking position (fig 6b) by the Lorentz force created by the interaction of the current and a magnetic field 12. Return of the source to the parking position may be by gravity, by a spring or by reversing the current. The electron source may be pivotally mounted on a frame or slidable along rails. The electron source is for use in a mass spectrometer, e.g. an ICR mass spectrometer, having an ion trap 55 with an entrance opening through which an ion or laser beam 57 may be introduced when the electron source is in its parking position. The electron source may also be part of an electron impact ion source.

公开(公告)号：GB0309510D0

公开(公告)日：2003-06-04

申请号：GB0309510

申请日：2003-04-25

Applicant: BRUKER DALTONIK GMBH

IPC: B01D59/44 ,  H01J1/88 ,  H01J3/02 ,  H01J27/00 ,  H01J37/065 ,  H01J49/00 ,  H01J49/08 ,  H01J49/10 ,  H01J49/14

Abstract: A mass spectrometer has an assembly which generates electrons in a magnetic field. The assembly has an electrically-powered electron emitter secured by a fixture. The fixture is preferably movable. The electron source is a filament conducting electricity, or an indirectly heated electron source. The movable fixture is redirected by Fourier transform ion cyclotron resonance mass spectrometer requiring no further supplementary magnetic field. The magnetic field is generated either by a permanent magnet, or by a normal-conducting or superconducting electro-magnet. Return of the electron source from the operating position to the parked position is effected either by gravity or a return-spring, or by reversed operating current. The electron source is fixed to a swivel or sliding fixture. An Independent claim states that the Lorentz force which is generated in the magnetic field by the electrical current, redirects the electron source between an operating position and a parked position.

公开(公告)号：RU2113033C1

公开(公告)日：1998-06-10

申请号：RU97102904

申请日：1997-02-20

Applicant: ROSSIJSKIJ FEDERAL NYJ JADERNY ,  SKIJ NI SKIJ I EHKSPERIME ,  NTAL NOJ FIZ ,  MIN ROSSIJSKOJ FEDERATSII ATOM

Inventor： KUTSYK I M ,  BABICH L P ,  MOZGOVOJ A L

IPC: H01J49/08

Abstract: FIELD: generation of accelerated charge particle beams for quantum electronics, plasma chemistry, etc. SUBSTANCE: space pulse discharge is initiated in gas-filled gap between electrodes. Electron beam is shaped by avalanche breeding of initial electron beam in discharge at pressure close to atmospheric value with discharge current chosen to ensure compensation for space charge formed in discharge during development of electron avalanches; electric field strength is chosen to exceed threshold value for developing avalanches of running electrons. EFFECT: improved quantity and energy of beam electrons, lifetime of beam, and pressure at which beam- shaping discharge occurs.

公开(公告)号：DE69115150T2

公开(公告)日：1996-05-15

申请号：DE69115150

申请日：1991-07-26

Applicant: TOSHIBA KK

Inventor： YAMAZAKI YUICHIRO ,  MIYOSHI MOTOSUKE ,  OKUMURA KATSUYA

IPC: G21K5/04 ,  H01J37/02 ,  H01J37/05 ,  H01J37/073 ,  H01J37/252 ,  H01J37/30 ,  H01J37/317 ,  H01J49/08

Abstract: There is disclosed a method of irradiating low-energy electrons that has the steps of irradiating a primary electron beam from a primary electron beam irradiation portion onto a secondary electron emission portion to emit a secondary electron beam, accelerating the emitted secondary electron beam, removing high-energy components from the accelerated secondary beam, and decelerating the secondary electron beam without the high-energy components into a focus. And there is also disclosed an apparatus for irradiating low-energy electrons that has a primary electron beam irradiating section (101), a secondary electron emitting section (107) which receives the primary electron beam and emits a secondary electron beam, a secondary electron beam accelerating section (109), energy analyzing section (110) which removes high-energy components from the accelerated secondary electron beam, to obtain low-energy secondary electrons, and deceleration section (114, 115) for decelerating the low-energy secondary electrons into a focus.

公开(公告)号：DE69115150D1

公开(公告)日：1996-01-18

申请号：DE69115150

申请日：1991-07-26

Applicant: TOSHIBA KAWASAKI KK

Inventor： YAMAZAKI YUICHIRO ,  MIYOSHI MOTOSUKE ,  OKUMURA KATSUYA

IPC: G21K5/04 ,  H01J37/02 ,  H01J37/05 ,  H01J37/073 ,  H01J37/252 ,  H01J37/30 ,  H01J37/317 ,  H01J49/08

Abstract: There is disclosed a method of irradiating low-energy electrons that has the steps of irradiating a primary electron beam from a primary electron beam irradiation portion onto a secondary electron emission portion to emit a secondary electron beam, accelerating the emitted secondary electron beam, removing high-energy components from the accelerated secondary beam, and decelerating the secondary electron beam without the high-energy components into a focus. And there is also disclosed an apparatus for irradiating low-energy electrons that has a primary electron beam irradiating section (101), a secondary electron emitting section (107) which receives the primary electron beam and emits a secondary electron beam, a secondary electron beam accelerating section (109), energy analyzing section (110) which removes high-energy components from the accelerated secondary electron beam, to obtain low-energy secondary electrons, and deceleration section (114, 115) for decelerating the low-energy secondary electrons into a focus.

公开(公告)号：DE3866076D1

公开(公告)日：1991-12-12

申请号：DE3866076

申请日：1988-09-02

Applicant: SIEMENS AG

Inventor： LISCHKE BURKHARD PROF DR ,  WINKLER DIETER DIPL ING

IPC: H01J37/06 ,  H01J1/18 ,  H01J37/07 ,  H01J49/08

Abstract: The beam generation system has an acceleration electrode (A), a control electrode (W) and a directly heated boride cathode (BK). The latter is supported by a cathode holder (4) within a central opening of the control electrode (W), with an associated clamping device (K,S) comprising a pair of metal clamps (K) and setting screws (S) exerting the required clamping force on a graphite support device (G) directly beneath the electron-emitting zone of the boride cathode (BK). Pref. the cathode uses a LaB6 crystal supported between a pair of graphite elements within a high vacuum of between 10 power -6 and 10 power -7 Torr, operated at a temp. of between 1200 and 1800 deg. C.

公开(公告)号：DE3619454A1

公开(公告)日：1987-12-17

申请号：DE3619454

申请日：1986-06-10

Applicant: BOC GROUP PLC

Inventor： EVRARD ROBERT

IPC: G01N27/62 ,  G01M3/20 ,  H01J49/14 ,  H01J49/20 ,  H01J49/30 ,  G01M3/40 ,  H01J49/08

公开(公告)号：DE3345573A1

公开(公告)日：1985-06-27

申请号：DE3345573

申请日：1983-12-16

Applicant: WOLLNIK HERMANN

Inventor： VERZICHT DES ERFINDERS AUF NENNUNG

IPC: H01J3/12 ,  H01J37/04 ,  H01J3/04 ,  B01D59/44 ,  H01J3/02 ,  H01J29/48 ,  H01J37/06 ,  H01J37/08 ,  H01J49/08 ,  H01J49/10

Abstract: The device for reducing the divergence angle for continuous or pulsed sources of charged particles contains coils and/or permanent magnets through which current flows in accordance with Fig. 1 and which possibly produce a magnetic field via ferromagnetic or ferrimagnetic pole shoes. During the formation of a free ion or electron, this magnetic field should be high, but should fall rapidly during or after its acceleration. This magnetic field drop then causes an electrostatic rotational field which reduces the transverse speed components of the beam of charged particles so that the originally divergent particle flight paths are largely parallel.