Silicon pressure micro-sensing device and the fabrication process
    121.
    发明授权
    Silicon pressure micro-sensing device and the fabrication process 失效
    硅压敏元件及其制造工艺

    公开(公告)号:US06541834B1

    公开(公告)日:2003-04-01

    申请号:US09975125

    申请日:2001-10-09

    Abstract: The invention is a silicon pressure micro-sensing device and the fabrication process thereof. The silicon pressure micro-sensing device includes a pressure chamber, and is constituted of a P-type substrate with a taper chamber and an N-type epitaxial layer thereon. On the N-type epitaxial layer are a plurality of piezo-resistance sensing units which sense deformation caused by pressure. The fabrication pressure of the silicon pressure micro-sensing device includes a step of first making a plurality of holes on the N-type epitaxial layer to reach the P-type substrate beneath. Then, by an anisotropic etching stop technique, in which etchant pass through the holes, a taper chamber is formed in the P-type substrate. Finally, an insulating material is applied to seal the holes, thus attaining the silicon pressure micro-sensing device that is able to sense pressure differences between two ends thereof.

    Abstract translation: 本发明是一种硅压力微型感测装置及其制造方法。 硅压力微型感测装置包括压力室,由具有锥形室的P型衬底和其上的N型外延层构成。 在N型外延层上是感测由压力引起的变形的多个压电感测单元。 硅压力微型感测装置的制造压力包括首先在N型外延层上制造多个孔以到达下面的P型衬底的步骤。 然后,通过各向异性蚀刻停止技术,其中蚀刻剂穿过孔,在P型衬底中形成锥形室。 最后,施加绝缘材料以密封孔,从而获得能够感测其两端之间的压力差的硅压力微检测装置。

    LAYER SYSTEM COMPRISING A SILICON LAYER AND A PASSIVATION LAYER, METHOD FOR PRODUCING A PASSIVATION LAYER ON A SILICON LAYER AND THE USE OF SAID SYSTEM AND METHOD
    123.
    发明申请
    LAYER SYSTEM COMPRISING A SILICON LAYER AND A PASSIVATION LAYER, METHOD FOR PRODUCING A PASSIVATION LAYER ON A SILICON LAYER AND THE USE OF SAID SYSTEM AND METHOD 审中-公开
    具有产生钝化层上的硅层及其用途的硅层和钝化层,工艺层SYSTEM

    公开(公告)号:WO2004018348A3

    公开(公告)日:2004-12-02

    申请号:PCT/DE0301437

    申请日:2003-05-06

    Abstract: The invention relates to a layer system comprising a silicon layer (11), at least some sections of whose surface are provided with a passivation layer (17), the latter (17) consisting of a first, at least predominantly inorganic sub-layer (14) and a second sub-layer (15). The latter (15) is composed of an organic compound comprising silicon or a similar material. The second sub-layer (15) in particular takes the form of a self-assembled monolayer. The invention also relates to a method for producing a passivation layer (17) on a silicon layer (11), whereby a first inorganic sub-layer (14) is produced on said layer (11) and a second sub-layer (15), containing an organic compound containing silicon or consisting of said compound, is produced on at least some sections of the first sub-layer (14), whereby the sub-layers form the passivation layer (17). The inventive layer system or the inventive method are particularly suitable for producing cantilever structures in silicon.

    Abstract translation: 它是具有硅层,提出了被施加到至少部分表面上的钝化层(17),层系统(11),其特征在于,具有第一,至少基本上无机的局部层(14)和第二局部层的钝化层(17)(15), 其中,所述第二子层(15)由包含有机硅化合物,或含有这样的材料。 特别地,所述第二局部层(15)被构造在一个所谓的“自组装monolyer”的形式。 此外,用于生产硅层上的钝化层(17)(11)提出一种方法,其中第一无机部分层(14)和所述第一部分层(14)上至少部分地一个第二硅层(11)上,有机化合物 用含硅的或由它们的子层(15)被创建,其形成钝化层(17)。 所提出的涂层系统或所提出的方法特别适合于在硅生产自支撑结构。

    LAYER SYSTEM WITH A SILICON LAYER AND A PASSIVATION LAYER, METHOD FOR PRODUCTION OF A PASSIVATION LAYER ON A SILICON LAYER AND USE THEREOF
    124.
    发明申请
    LAYER SYSTEM WITH A SILICON LAYER AND A PASSIVATION LAYER, METHOD FOR PRODUCTION OF A PASSIVATION LAYER ON A SILICON LAYER AND USE THEREOF 审中-公开
    具有产生钝化层上的硅层及其用途的硅层和钝化层,工艺层SYSTEM

    公开(公告)号:WO2004016546A3

    公开(公告)日:2004-09-02

    申请号:PCT/DE0301436

    申请日:2003-05-06

    CPC classification number: B81C1/00571 B81B2203/033 B81C2201/016 H01L21/0332

    Abstract: A layer system with a silicon layer (11) is disclosed, on which a surface passivation layer (17) is at least partly applied. The passivation layer (17) comprises a first at least extensively inorganic partial layer (14) and a second at least extensively polymeric partial layer (15). A method for production of a passivation layer (17) on a silicon layer (11) is also disclosed, whereby a first inorganic partial layer (14) is applied to the silicon layer (11), an intermediate layer applied to the above and on the intermediate layer a second polymeric partial layer (15) is applied to form the passivation layer (17). The production of the intermediate layer is achieved, whereby in the surface region thereof adjacent to the first partial layer (14), the composition thereof is the same as the first partial layer (14) and in the surface region thereof adjacent to the second partial layer (15) the composition thereof is the same as the second partial layer (15) and that the composition of the intermediate layer varies continuously or stepwise from the composition corresponding to the first partial layer to the composition corresponding to the second partial layer. The disclosed layer system or the disclosed method are particularly suitable for the production of self-supporting structures in silicon.

    Abstract translation: 公开的是具有硅层的层系统(11)被施加在至少部分所述表面上形成钝化层(17),其中,所述钝化层(17)(第一,至少基本上无机的局部层(14)和第二,至少基本上聚合部分层上 15)。 此外,用于生产硅层上的钝化层(17)(11)的方法之前撞击,其特征在于,在硅层上(11)包括该中间层上的第一无机局部层(14),并且该第二聚合物部分层上(15 )被产生,形成钝化层(17)。 中间层的产生是这样的,所述中间层是在其所述的第一相邻子层(14)相邻的表面区域作为第一局部层(14)和在其第二部分层(15)表面区域作为第二局部层(15)组成,并且 中间层的组成是由所述第一部分层到第二局部层的组合物的组合物连续地或逐步地。 所提出的涂层系统或所提出的方法特别适合于在硅生产自支撑结构。

    SCHICHTSYSTEM MIT EINER SILIZIUMSCHICHT UND EINER PASSIVIERSCHICHT, VERFAHREN ZUR ERZEUGUNG EINER PASSIVIERSCHICHT AUF EINER SILIZIUMSCHICHT UND DEREN VERWENDUNG
    125.
    发明申请
    SCHICHTSYSTEM MIT EINER SILIZIUMSCHICHT UND EINER PASSIVIERSCHICHT, VERFAHREN ZUR ERZEUGUNG EINER PASSIVIERSCHICHT AUF EINER SILIZIUMSCHICHT UND DEREN VERWENDUNG 审中-公开
    具有硅层和被动层的层系统,用于在硅层上产生被动层的方法及其用途

    公开(公告)号:WO2004018348A2

    公开(公告)日:2004-03-04

    申请号:PCT/DE2003/001437

    申请日:2003-05-06

    Abstract: Es wird ein Schichtsystem mit einer Siliziumschicht (11) vorgeschlagen, auf der zumindest bereichsweise oberflächlich eine Passivierschicht (17) aufgebracht ist, wobei die Passivierschicht (17) eine erste, zumindest weitgehend anorganische Teilschicht (14) und eine zweite Teilschicht (15) aufweist, wobei die zweite Teilschicht (15) aus einer organischen Verbindung mit Silizium besteht oder ein derartiges Material enthält. Insbesondere ist die zweite Teilschicht (15) in Form einer sogenannten "self assembled monolyer" aufgebaut. Weiter wird ein Verfahren zur Erzeugung einer Passivierschicht (17) auf einer Siliziumschicht (11) vorgeschlagen, wobei auf der Siliziumschicht (11) eine erste, anorganische Teilschicht (14) und auf der ersten Teilschicht (14) zumindest bereichsweise eine zweite, eine organische Verbindung mit Silizium enthaltende oder daraus bestehende Teilschicht (15) erzeugt wird, die die Passivierschicht (17) bilden. Das vorgeschlagene Schichtsystem oder das vorgeschlagene Verfahren eignet sich besonders bei der Erzeugung von freitragenden Strukturen in Silizium.

    Abstract translation: 提出了一种具有硅层(11)的层系统,其上在至少一些区域上施加钝化层(17),其中钝化层(17)包括第一至少基本无机的分层(14) )和第二子层(15),其中第二子层(15)由具有硅的有机化合物或包含这种材料组成。 特别地,第二子层(15)是所谓的“自组装单层”的形式。 成立。 此外,用于生产硅层上的钝化层(17)(11)提出一种方法,其中第一无机部分层(14)和所述第一部分层(14)上至少部分地一个第二硅层(11)上,有机化合物 由含硅或由构成钝化层(17)的子层(15)构成。 所提出的层系或所提出的方法特别适用于硅中自支撑结构的制造。

    ADHÄSIONSVERMINDERTE MIKROMECHANISCHE BAUELEMENTE
    126.
    发明申请
    ADHÄSIONSVERMINDERTE MIKROMECHANISCHE BAUELEMENTE 审中-公开
    粘合 - 减少微机械组分

    公开(公告)号:WO2003031319A2

    公开(公告)日:2003-04-17

    申请号:PCT/DE2002/003317

    申请日:2002-09-06

    CPC classification number: B81B3/0008 B81C2201/016

    Abstract: Es werden adhäsionsverminderte mikromechanische Bauelemente (4';40) rnit einer Größe von in der Regel weniger als 1 mn, derartige Bauelemente enthaltende Einrichtungen, die Herstellung und Verwendung dieser Bauelemente sowie ein Verfahren zur Behandlung der Oberflächen von mikromechanischen Bauelementen(4';40) bereitgestellt, wobei das Verfahren den Schritt umfasst, dass die elektronischen Störstellen des verwendeten Halbleitermaterials im Wege einer Oberflächenbehandlung verändert werden. Derartige Bauelemente werden beispielsweise in Beschleunigungssensoren verwendet.

    Abstract translation:

    是ADHÄ锡永降低微机械部件(4“; 40)与GRÖ通常小于1万的道,容纳装置,制备和使用这些成分的,以及一个这样的装置 用于治疗的微型机械装置的表面BEAR表面处理(4“; 40)提供,该方法包括使电子圣&ouml步骤;穿心莲中使用的半导体材料,通过表面BEAR chenbehandlung版本BEAR的方式来改变。 这些组件用于例如加速度传感器。

    METHOD FOR IMPROVING THE POLYSILICON STRUCTURES OF A MEMS DEVICE BY MASKING TO INHIBIT ANODIC ETCHING OF THE MEMS POLYSILICON STRUCTURES
    127.
    发明申请
    METHOD FOR IMPROVING THE POLYSILICON STRUCTURES OF A MEMS DEVICE BY MASKING TO INHIBIT ANODIC ETCHING OF THE MEMS POLYSILICON STRUCTURES 审中-公开
    通过掩蔽抑制MEMS多晶硅结构的阳极蚀刻来改善MEMS器件的多晶硅结构的方法

    公开(公告)号:WO02048023A2

    公开(公告)日:2002-06-20

    申请号:PCT/US2001/051334

    申请日:2001-10-25

    CPC classification number: B81C1/00801 B81C2201/0133 B81C2201/016

    Abstract: A method is provided for fabricating a MEMS device on a workpiece by forming a mercaptain mask (306) on a gold structure (309). The mask (306) is used to inhibit anodic etching of polysilicon structures (303) during the acid etch process that is used to remove the oxide dielectric layer from the workpiece to expose the polysilicon structures of the MEMS device (303) to allow their movement. The mercaptain can be utilised to adhere to the exposed gold surface (309) to form a self-mask (306) on the gold surface (309). As such, a workpiece having numerous gold surfaces, such as numerous optomechanical switches, each having various types of gold structures, can be placed in a mercaptain solution. The mercaptain selectively coats the gold surfaces to form self-adhering mercaptain masks on all the exposed gold surfaces.

    Abstract translation: 提供了一种通过在金结构(309)上形成巯基掩模(306)来在工件上制造MEMS器件的方法。 掩模(306)用于在酸蚀刻工艺期间抑制多晶硅结构(303)的阳极蚀刻,所述酸蚀刻工艺用于从工件去除氧化物介电层以暴露MEMS器件(303)的多晶硅结构以允许其移动 。 可以使用巯基粘附到暴露的金表面(309)以在金表面(309)上形成自掩模(306)。 因此,可以将具有多个金表面的工件,例如各种具有各种类型的金结构的多个光学机械开关放置在巯基溶液中。 巯基选择性地涂覆金表面以在所有暴露的金表面上形成自粘的巯基掩模。

    표시장치 및 표시장치의 제조방법
    128.
    发明公开
    표시장치 및 표시장치의 제조방법 有权
    显示装置及其制造方法

    公开(公告)号:KR1020120140616A

    公开(公告)日:2012-12-31

    申请号:KR1020120065569

    申请日:2012-06-19

    Abstract: PURPOSE: A display device and method thereof are provided to improve throughput by removing an insulation film on a terminal using typically used dry etching process without using any special process. CONSTITUTION: Multiple pixels are disposed in a matrix shape on a substrate, and include a switching device and a MEMS shutter. The MEMS shutter is operated with a switching device. Multiple terminals are disposed on a substrate, and connect to an external terminal. A MEMS shutter has a shutter having an opening, a first spring connected to a shutter, a first anchor connected to a first spring, a second spring and a second anchor connected to a second spring.

    Abstract translation: 目的:提供一种显示装置及其方法,以通过使用通常使用的干蚀刻工艺在终端上去除绝缘膜而不使用任何特殊工艺来提高产量。 构成:将多个像素以矩阵形状设置在基板上,并且包括开关装置和MEMS快门。 MEMS快门用开关装置操作。 多个端子设置在基板上,并连接到外部端子。 MEMS闸门具有闸门,其具有开口,连接到闸门的第一弹簧,连接到第一弹簧的第一锚杆,第二弹簧和连接到第二弹簧的第二锚杆。

    실리콘층 및 패시베이션층을 갖는 층 시스템, 실리콘층 상에 패시베이션층을 생성하기 위한 방법 및 그 용도
    129.
    发明公开
    실리콘층 및 패시베이션층을 갖는 층 시스템, 실리콘층 상에 패시베이션층을 생성하기 위한 방법 및 그 용도 无效
    包含硅层和钝化层的层系统,用于在硅层上生产钝化层的方法和使用系统和方法

    公开(公告)号:KR1020050044905A

    公开(公告)日:2005-05-13

    申请号:KR1020057002703

    申请日:2003-05-06

    Abstract: The invention relates to a layer system comprising a silicon layer (11), at least some sections of whose surface are provided with a passivation layer (17), the latter (17) consisting of a first, at least predominantly inorganic sub-layer (14) and a second sub- layer (15). The latter (15) is composed of an organic compound comprising silicon or a similar material. The second sub-layer (15) in particular takes the form of a self-assembled monolayer. The invention also relates to a method for producing a passivation layer (17) on a silicon layer (11), whereby a first inorganic sub-layer (14) is produced on said layer (11) and a second sub-layer (15), containing an organic compound containing silicon or consisting of said compound, is produced on at least some sections of the first sub-layer (14), whereby the sub-layers form the passivation layer (17). The inventive layer system or the inventive method are particularly suitable for producing cantilever structures in silicon.

    Abstract translation: 本发明涉及包括硅层(11)的层系统,其表面的至少一些部分设置有钝化层(17),后者(17)由第一至少主要是无机的子层 14)和第二子层(15)。 后者(15)由包含硅或类似材料的有机化合物组成。 第二子层(15)特别采取自组装单层的形式。 本发明还涉及一种在硅层(11)上制造钝化层(17)的方法,由此在所述层(11)和第二子层(15)上产生第一无机子层(14) ,含有含硅的有机化合物或由所述化合物组成的化合物,在第一子层(14)的至少一些部分上产生,由此子层形成钝化层(17)。 本发明的层系统或本发明的方法特别适用于在硅中产生悬臂结构。

    실리콘층 및 패시베이션층을 갖는 층 시스템, 실리콘층상에 패시베이션층을 생성하기 위한 방법 및 그 용도
    130.
    发明公开
    실리콘층 및 패시베이션층을 갖는 층 시스템, 실리콘층상에 패시베이션층을 생성하기 위한 방법 및 그 용도 失效
    具有硅层和钝化层的层系统,用于在硅层上生产钝化层的方法及其用途

    公开(公告)号:KR1020050026048A

    公开(公告)日:2005-03-14

    申请号:KR1020057001619

    申请日:2003-05-06

    CPC classification number: B81C1/00571 B81B2203/033 B81C2201/016 H01L21/0332

    Abstract: A layer system with a silicon layer (11) is disclosed, on which a surface passivation layer (17) is at least partly applied. The passivation layer (17) comprises a first at least extensively inorganic partial layer (14) and a second at least extensively polymeric partial layer (15). A method for production of a passivation layer (17) on a silicon layer (11) is also disclosed, whereby a first inorganic partial layer (14) is applied to the silicon layer (11), an intermediate layer applied to the above and on the intermediate layer a second polymeric partial layer (15) is applied to form the passivation layer (17). The production of the intermediate layer is achieved, whereby in the surface region thereof adjacent to the first partial layer (14), the composition thereof is the same as the first partial layer (14) and in the surface region thereof adjacent to the second partial layer (15) the composition thereof is the same as the second partial layer (15) and that the composition of the intermediate layer varies continuously or stepwise from the composition corresponding to the first partial layer to the composition corresponding to the second partial layer. The disclosed layer system or the disclosed method are particularly suitable for the production of self-supporting structures in silicon.

    Abstract translation: 公开了一种具有硅层(11)的层系统,其上至少部分地施加表面钝化层(17)。 钝化层(17)包括第一至少广泛无机的部分层(14)和第二至少广泛聚合的部分层(15)。 还公开了一种在硅层(11)上制造钝化层(17)的方法,其中将第一无机部分层(14)施加到硅层(11)上,施加到上述和第 中间层施加第二聚合物部分层(15)以形成钝化层(17)。 实现中间层的制造,由此在与第一部分层(14)相邻的表面区域中,其组成与第一部分层(14)相同,并且在与第二部分层(14)相邻的表面区域中 层(15)的组成与第二部分层(15)相同,并且中间层的组成从对应于第一部分层的组成到对应于第二部分层的组成连续或逐步变化。 公开的层系统或所公开的方法特别适用于在硅中生产自支撑结构。

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