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公开(公告)号：EP1784622A2
公开(公告)日：2007-05-16
申请号：EP05790851.9
申请日：2005-08-19
Applicant: Headwall Photonics, Inc.
Inventor： JULIAN, Jason, P. , DIDONA, Kevin, M. , MILNER, Darrin, P. , MIKES, Thomas, L. , MILLIGAN, Scott, D. , BANNON, David, P.
IPC: G01J3/28
CPC classification number: G01J3/02 , G01J3/0202 , G01J3/0205 , G01J3/0208 , G01J3/021 , G01J3/0218 , G01J3/0237 , G01J3/0291 , G01J3/0294 , G01J3/0297 , G01J3/04 , G01J3/18 , G01J3/2823
Abstract: A multi-spectrum, multi-channel imaging spectrometer includes two or more input slits or other input for each input channel. The input slits are vertically and horizontally displaced from each other. The vertical displacements cause spectra from the channels to be vertically displaced on a single image sensor on a stationary image plane. The horizontal displacements cause light beams from the input channels to strike a convex grating at different incidence angles and produce separate spectra having different spectral ranges. A retroflective spectrometer includes a convex grating that, by diffraction, disperses wavelengths of light at different angles and orders approximately back along an incident light beam. A single concave mirror reflects both the input channel and the dispersed spectrum. A prism, set of mirrors, beam splitters or other optical element(s) folds the input channel(s) of a spectrometer to enable the input(s) to be moved away from the plan of the image sensor.
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122.发明公开ENCODER SPECTROGRAPH FOR ANALYZING RADIATION USING SPATIAL MODULATION OF RADIATION DISPERSED BY WAVELENGTH 审中-公开用波长分散辐射的空间调制分析辐射的编码器光谱
公开(公告)号：EP1766345A2
公开(公告)日：2007-03-28
申请号：EP05786254.2
申请日：2005-06-28
Applicant: Aspectrics, Inc.
Inventor： HAGLER, Thomas, W.
CPC classification number: G01N21/552 , G01J3/02 , G01J3/0202 , G01J3/0208 , G01J3/0229 , G01J3/0291 , G01J3/0294 , G01J3/18 , G01J3/28 , G01J3/42 , G01N21/274 , G01N21/31 , G01N2021/317 , G01N2201/129
Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator.
Abstract translation: 编码器摄谱仪用于分析来自一个或多个不同配置样本的辐射。 在辐射通过波长分散或沿线成像之后，通过对辐射进行空间调制来分析辐射。 双编码器光谱仪可用于使用单个调制器对辐射进行编码。
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公开(公告)号：EP1432967A1
公开(公告)日：2004-06-30
申请号：EP02728506.3
申请日：2002-03-19
Applicant: University Of Delaware
Inventor： ELMORE, Douglas, L. , TSAO, Mei-Wei , RABOLT, John, F.
IPC: G01J3/40
CPC classification number: G01J3/14 , G01J3/02 , G01J3/0216 , G01J3/0218 , G01J3/0224 , G01J3/0294 , G01J3/28 , G01J3/2803 , G01J3/42 , G01N21/35 , G01N21/3563 , G01N21/3577
Abstract: An apparatus (300') and method capable of providing spatially multiplexed IR spectral information simultaneously in real-time for multiple samples or multiple spatial areas of one sample using IR absorption phenomena requires no moving parts or Fourier Transform during operation, and self-compensates for background spectra and degradation of component performance over time. IR spectral information and chemical analysis of the samples is determined by using one or more IR sources (310, 311), one or more sampling accessories (330, 331) for positioning the sample volumes, one or more optically dispersive elements (350), a focal plane array (FPA) (370) arranged to detect the dispersed light beams, and a processor (380) and display (390) to control the FPA (370), and display(390) to control the FPA (370) and display IR spectrograph.
Abstract translation: 能够使用IR吸收现象对一个样本的多个样本或多个空间区域同时实时同时提供空间复用IR光谱信息的设备（300'）和方法在操作期间不需要移动部件或傅里叶变换，并且自补偿 背景光谱和组件性能随时间的退化。 通过使用一个或多个IR源（310,311），用于定位样品体积的一个或多个采样附件（330,331），一个或多个光学色散元件（350），以及一个或多个光学色散元件 （370）和用于控制FPA（370）的处理器（380）和显示器（390），以及控制FPA（370）的显示器（390）以及用于控制FPA 显示红外光谱仪。
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公开(公告)号：EP1002220B1
公开(公告)日：2002-12-18
申请号：EP99920416.7
申请日：1999-05-10
Applicant: Raytheon Company
Inventor： ANSLEY, David, A. , COOK, Lacy, G.
IPC: G01J3/28
CPC classification number: G01J3/02 , G01J3/0208 , G01J3/0294 , G01J3/04 , G01J3/2823
Abstract: A multi-slit spectrometer is combined with a two-dimensional detector array (D) to enable simultaneous spectral analysis of several objects, improving the signal-to-noise ratio of multispectral imagery. The multi-slit spectrometer includes a multi-slit structure defining a plurality of parallel thin slits (S, S'), and a first lens (L) for directing object light onto the multi-slit structure. A second lens (C) collimates and directs light which has passed through the slits of the multi-slit structure onto a light dispersing element (P) such as a dispersing prism or a diffraction grating. A third lens (L>1
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公开(公告)号：EP1106979B1
公开(公告)日：2001-11-14
申请号：EP99115789.2
申请日：1999-08-11
Applicant: Acterna Eningen GmbH
Inventor： Benzel, Karl , Conzelmann, Andreas , Fuhrmann, Thomas , Löcklin, Eberhard
IPC: G01J3/12
CPC classification number: G01J3/12 , G01J3/0224 , G01J3/0294
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Patent Agency Ranking
公开(公告)号：EP1002220A1
公开(公告)日：2000-05-24
申请号：EP99920416.7
申请日：1999-05-10
Applicant: Raytheon Company
Inventor： ANSLEY, David, A. , COOK, Lacy, G.
IPC: G01J3/28
CPC classification number: G01J3/02 , G01J3/0208 , G01J3/0294 , G01J3/04 , G01J3/2823
Abstract: A multi-slit spectrometer is combined with a two-dimensional detector array (D) to enable simultaneous spectral analysis of several objects, improving the signal-to-noise ratio of multispectral imagery. The multi-slit spectrometer includes a multi-slit structure defining a plurality of parallel thin slits (S, S'), and a first lens (L) for directing object light onto the multi-slit structure. A second lens (C) collimates and directs light which has passed through the slits of the multi-slit structure onto a light dispersing element (P) such as a dispersing prism or a diffraction grating. A third lens (L1) focuses light which has passed through the light dispersing element onto the two-dimensional detector array at an image plane (A). A two-dimensional detector array (D) of detector elements is placed at the image plane. The slits are separated by a separation distance equal to an integral multiple of the detector width dimension, where the multiple is equal to (N times the number of slits) plus or minus one, where N is an integer. In an airborne sensor, a mirror (M) which rotates at an angular velocity related to the velocity of the airborne platform directs object light onto the first lens, freezing the image from one or more objects onto the multi-slit structure for an integration time.
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公开(公告)号：EP0205050B1
公开(公告)日：1990-09-12
申请号：EP86107340.1
申请日：1986-05-30
Applicant: MILES INC.
Inventor： Brunsting, Albert
CPC classification number: G01N21/31 , G01J3/0294 , G01J3/12 , G01J3/32 , G01J2003/1234 , G01N21/4738 , G01N21/59
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公开(公告)号：EP4392185A1
公开(公告)日：2024-07-03
申请号：EP22859695.3
申请日：2022-08-25
Applicant: Avicena Systems Limited
Inventor： STEVENS, Anthony Malcolm , WATT, Paul , OSTERGAARD, Paul , HEINRICH, Tatjana , DEWHURST, Robert
CPC classification number: G01J3/50 , G01N21/6452 , G01N21/253 , G01N2201/082620130101 , G01N2201/062620130101 , G01J3/10 , G01J2003/10420130101 , G01J2003/10220130101 , G01J2003/10620130101 , G01J3/0294 , G01J3/4406 , G01J3/501
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公开(公告)号：EP2694932B1
公开(公告)日：2018-02-21
申请号：EP12782796.2
申请日：2012-04-05
Applicant: The UWM Research Foundation, Inc
Inventor： RAICU, Valerica , BIENER, Gabriel , MOZER, Thomas John , MULLER, Uwe Richard , STONEMAN, Michael
CPC classification number: G01J3/2803 , G01J3/027 , G01J3/0294 , G01J3/06 , G01J3/4406 , G01N15/1434 , G01N15/1463 , G01N15/1475 , G01N2015/1006 , G02B21/002 , G02B21/0076 , G02B21/16 , G02B27/0927 , G02B27/0983
Abstract: A system and method of high-speed microscopy using a two-photon microscope with spectral resolution. The microscope is operable to provide two- to five-dimensional fluorescence images of samples, including two or three spatial dimensions, a spectral dimension (for fluorescence emission), and a temporal dimension (on a scale of less than approximately one second). Two-dimensional (spatial) images with a complete wavelength spectrum are generated from a single scan of a sample. The microscope may include one of a multi-beam point scanning microscope, a single beam line scanning microscope, and a multi-beam line scanning microscope. The line scans may be formed using one or more of curved mirrors and lenses. The multiple beams may be formed using one of a grating, an array of lenses, and a beam splitter.
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公开(公告)号：EP3104148A1
公开(公告)日：2016-12-14
申请号：EP15746187.2
申请日：2015-02-03
Applicant: Hamamatsu Photonics K.K.
Inventor： YOKINO Takafumi , SHIBAYAMA Katsumi
CPC classification number: G01J3/0208 , G01J3/021 , G01J3/0224 , G01J3/0256 , G01J3/0291 , G01J3/0294 , G01J3/18 , G01J3/1838 , G01J3/24 , G01J3/2803
Abstract: A spectrometer 1A includes spectroscopic units 2A, 2B, and 2C. A light passing part 21A, a reflection part 11A, a common reflection part 12, a dispersive part 40A, and a light detection part 22A included in the spectroscopic unit 2A are arranged along a reference line RL1 when viewed in a Z-axis direction. A light passing part 21B, a reflection part 11B, the common reflection part 12, a dispersive part 40B, and a light detection part 22B included in the spectroscopic unit 2B are arranged along a reference line RL2 when viewed in the Z-axis direction. A light passing part 21C, a reflection part 11C, the common reflection part 12, a dispersive part 40C, and a light detection part 22C included in the spectroscopic unit 2C are arranged along a reference line RL3 when viewed in the Z-axis direction. The reference line RL1, the reference line RL2, and the reference line RL3 intersect with one another.
Abstract translation: 光谱仪1A包括光谱单元2A，2B和2C。 沿Z轴方向观察时，分光单元2A中包括的光通过部分21A，反射部分11A，共同反射部分12，色散部分40A和光检测部分22A被布置在基准线RL1上。 在Z轴方向观察时，沿着基准线RL2配置分光单元2B中包括的光通过部分21B，反射部分11B，共同反射部分12，色散部分40B和光检测部分22B。 沿Z轴方向观察时，分光单元2C中包括的光通过部分21C，反射部分11C，共同反射部分12，色散部分40C和光检测部分22C被布置在基准线RL3上。 参考线RL1，参考线RL2和参考线RL3彼此相交。
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