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    Spectral instrument
    165.
    发明专利
    Spectral instrument 审中-公开
    光谱仪

    公开(公告)号：JP2012063197A

    公开(公告)日：2012-03-29

    申请号：JP2010206550

    申请日：2010-09-15

    Applicant: Yokogawa Electric Corp ,  横河電機株式会社

    Inventor： KAMEI SHIN ,  SANPEI YOSHIHIRO ,  ARIHARA MAMORU ,  KAMIYA HIROAKI

    IPC: G01J3/14 ,  G01J3/18

    Abstract: PROBLEM TO BE SOLVED: To achieve a spectral instrument for optical spectrum analysis using, even for measurement light of different wavelength ranges such as C band and L band, one and the same prism by installing a rotatable mirror outside the surface facing a diffraction grating of a prism and adjusting the angle of the mirror.SOLUTION: The spectral instrument performs wavelength dispersion of the measurement light with a prism, receives the wavelength dispersed light with a light receiving part, and analyzes the optical spectrum of the measurement light, and the prism has an incidence surface where the measurement light is made incident and a diffraction grating surface adjacent to the incidence surface. In the spectral instrument, a mirror rotatable at an arbitrary angle is provided near the outside of the surface facing the diffraction grating surface. The measurement light made incident from the incidence surface of the prism is wavelength dispersed by the diffraction grating surface, emitted from the surface facing the diffraction grating surface, reflected by the mirror and made incident from the surface facing the diffraction grating surface, wavelength dispersed again by the diffraction grating surface, emitted from the incidence surface, and received by the light receiving part.

    Abstract translation: 要解决的问题：为了实现光谱分析的光谱仪器，即使对于不同波长范围的测量光，例如C波段和L波段，也可以使用同一个棱镜，通过在面向a的表面之外安装可旋转镜 棱镜的衍射光栅并调整镜的角度。 解决方案：光谱仪器用棱镜进行测量光的波长色散，用受光部分接收波长分散光，并分析测量光的光谱，并且棱镜具有入射表面，其中测量 入射光和与入射面相邻的衍射光栅表面。 在光谱仪器中，在面向衍射光栅表面的表面的外侧附近提供以任意角度可旋转的反射镜。 从棱镜的入射面入射的测量光被衍射光栅表面波长分散，从面向衍射光栅表面的表面发射，由反射镜反射并从面向衍射光栅表面的表面入射，波长再次分散 通过衍射光栅表面，从入射表面发射并被光接收部分接收。 版权所有（C）2012，JPO＆INPIT

    Photodetector
    167.
    发明专利
    Photodetector 审中-公开
    光电探测器

    公开(公告)号：JP2008172258A

    公开(公告)日：2008-07-24

    申请号：JP2008016635

    申请日：2008-01-28

    Applicant: Toshiba Corp ,  株式会社東芝

    Inventor： YONEZAWA MINORU ,  SAKURAI MASATOSHI

    IPC: H01L31/10 ,  G01J1/02 ,  G01J1/06 ,  G01J3/02 ,  G01J3/14 ,  G01J9/00 ,  G11B7/13 ,  H01L27/146

    Abstract: PROBLEM TO BE SOLVED: To provide a photodetector provided with a function for measuring the intensity distribution of light and provided with the selectivity of a measurement wavelength band, using a simple and low-cost constitution. SOLUTION: This transmission type photodetector is composed of a transparent semiconductor electrode part 11 and a counter electrode part 12, coated with sensitizing dyestuffs and a buffer layer 13 held there in between them, and the counter electrode part or the transparent semiconductor electrode part is divided into a plurality of electrode cells. According to the photodetector, photoelectric conversion is performed by using a part of the light of a wavelength band absorbed, by the sensitizing dyestuffs, and the photodetector provided with wavelength selectivity is realized in a compact constitution. COPYRIGHT: (C)2008,JPO&INPIT

    Abstract translation: 要解决的问题：提供一种具有测量光的强度分布并提供测量波长带的选择性的功能的光电检测器，其使用简单且低成本的构造。 解决方案：该透射型光电检测器由透明半导体电极部分11和对电极部分12组成，涂覆有敏化染料和保持在它们之间的缓冲层13和对电极部分或透明半导体电极 部分被分成多个电极单元。 根据光电检测器，通过使用被感光染料吸收的波长带的一部分光进行光电转换，并且以紧凑的结构实现了具有波长选择性的光电检测器。 版权所有（C）2008，JPO＆INPIT

    Polarization spectrometer
    169.
    发明专利
    Polarization spectrometer 有权
    偏振光谱仪

    公开(公告)号：JP2008051732A

    公开(公告)日：2008-03-06

    申请号：JP2006230143

    申请日：2006-08-28

    Applicant: Jasco Corp ,  日本分光株式会社

    Inventor： WADA AKIO ,  HASEGAWA KATSUJI ,  MASAGO HIROSHI ,  TAKENOUCHI TAKAHIKO ,  WATANABE MASAYUKI ,  KONDO YOSHIRO ,  FUKAZAWA TOMOYUKI

    IPC: G01J3/14 ,  G01J3/447

    CPC classification number: G01J3/14 ,  G01J3/0224 ,  G02B27/281 ,  G03F7/70566 ,  G03F7/70575

    Abstract: PROBLEM TO BE SOLVED: To provide a polarization spectrometer which can extract a linearly polarized light with a desired wavelength, with a high stray light removal rate. SOLUTION: This polarizing spectrometer 10 includes a uniaxial birefringence crystal prism 12, a collimator optical system 18 which makes incident light into the prism 20 in parallel, and a condensing optical system 22 which condenses outgoing light from the prism 2. The prism 20 is of a triangular prism shape with a triangular bottom. A side face including one side of the triangle is an incoming/outgoing surface, another side including the other side of the triangle is a reflection surface, and the optical axis of the prism is perpendicular to the bottom. The arrangement of the prism 20 and the angle of the incoming/outgoing surface are set so that normal light and abnormal light outgoing from the incoming/outgoing surface of the prism 20 are emitted in the opposite directions each other for an optical axis connecting the collimator optical system 18 and the prism 20, respectively. The condensing optical system 22 is arranged so as to condense either one of the normal light or the abnormal light. COPYRIGHT: (C)2008,JPO&INPIT

    Abstract translation: 要解决的问题：提供一种能够提取具有期望波长的线偏振光，具有高杂散光去除速率的偏振光谱仪。 解决方案：该偏振光谱仪10包括单轴双折射晶体棱镜12，将入射到平行棱镜20中的入射光的准直仪光学系统18和聚集来自棱镜2的出射光的聚光光学系统22。 20是具有三角形底部的三角形棱柱形状。 包括三角形的一侧的侧面是入射/出射表面，包括三角形的另一侧的另一侧是反射表面，并且棱镜的光轴垂直于底部。 棱镜20的配置和入射/出射表面的角度被设定为使得从棱镜20的入射/出射表面射出的正常光和异常光沿彼此相反的方向发射，用于连接准直仪的光轴 光学系统18和棱镜20。 聚光光学系统22被配置为冷凝正常光或异常光中的任一个。 版权所有（C）2008，JPO＆INPIT

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