Ultraviolet ray-transparent optical glass material and method of producing same
    171.
    发明授权
    Ultraviolet ray-transparent optical glass material and method of producing same 有权
    紫外线透明光学玻璃材料及其制造方法

    公开(公告)号:US06376401B1

    公开(公告)日:2002-04-23

    申请号:US09387773

    申请日:1999-09-01

    Abstract: A synthetic silica glass having a high transmittance for vacuum ultraviolet rays, for example F2 excimer laser beam with a wavelength of 157 nm, a high uniformity and a high durability and useful for ultraviolet ray-transparent optical glass materials is produced from a high-purity silicon compound, for example silicon tetrachloride, by heat treating an accumulated porous silica material at a temperature not high enough to convert the porous silica material to a transparent silica glass in an inert gas atmosphere for a time sufficient to cause the OH groups to be condensed and removed from the glass, and exhibits substantially no content of impurities other than OH group a difference between highest and lowest fictional temperatures of 50° C. or less and a transmittance of 157 nm ultraviolet rays through a 10 mm optical path of 60% or more, and optically a OH group content of 1 to 70 ppm, a Cl content less than 1 ppm, a total content of impurity metals of 50 ppb or less, a content of each individual impurity metal less than 10 ppb, and an ultraviolet ray-transmittance at 172 to 200 nm of 40% or more even after the glass is exposed to an irradiation of ultraviolet rays at 160 to 300 nm for one hour.

    Abstract translation: 对于真空紫外线具有高透射率的合成二氧化硅玻璃,例如波长为157nm的F2准分子激光束,高均匀性和高耐久性并且可用于紫外线透明光学玻璃材料由高纯度 硅化合物,例如四氯化硅,通过在不足够高的温度下热处理积聚的多孔二氧化硅材料,以在惰性气体气氛中将多孔二氧化硅材料转化为透明的石英玻璃足以使OH基团冷凝的时间 并且从玻璃中除去,并且基本上不含OH基团中的杂质含量,最高和最低虚构温度之间的差别为50℃或更低,通过10mm光路的157nm紫外线的透射率为60%或 更多地,光学地含有1至70ppm的OH基含量,小于1ppm的Cl含量,50ppb以下的杂质金属的总含量, 即使玻璃暴露于160〜300nm的紫外线照射1小时,每一种杂质金属小于10ppb,而在172〜200nm的紫外线透射率为40%以上。

    Synthetic silica glass used with uv-rays and method producing the same
    172.
    发明授权
    Synthetic silica glass used with uv-rays and method producing the same 有权
    与紫外线一起使用的合成石英玻璃及其制造方法

    公开(公告)号:US6143676A

    公开(公告)日:2000-11-07

    申请号:US214894

    申请日:1999-01-14

    Abstract: An object of the present invention is to provide a synthetic silica glass optical material which exhibits excellent transmittance as well as durability for high output power vacuum ultraviolet rays, being emitted from, for example, ArF excimer lasers and Xe.sub.2 excimer lamps, and to provide a method for producing the same. A synthetic silica glass optical material for high output power vacuum ultraviolet rays made from ultra high purity synthetic silica glass for use in the wavelength region of from 165 to 195 nm, containing OH groups at a concentration of from 5 to 300 wtppm with a fluctuation width in OH group concentration (.DELTA.OH/cm) of 10 wtppm or less, containing hydrogen molecules at a concentration of from 1.times.10.sup.17 to 1.times.10.sup.19 molecule/cm.sup.3 with a fluctuation width in hydrogen molecule concentration (.DELTA.H.sub.2 /cm) of 1.times.10.sup.17 molecule/cm.sup.3 or lower, and containing chlorine at a concentration of 50 wtppm or lower. Also claimed is a method for producing the same.

    Abstract translation: PCT No.PCT / EP98 / 02965 Sec。 371日期1999年1月14日第 102(e)日期1999年1月14日PCT提交1998年5月20日PCT公布。 第WO98 / 52879号公报 日期:1998年11月26日本发明的目的是提供一种合成石英玻璃光学材料,其表现出优异的透射率以及从例如ArF准分子激光器和Xe2准分子灯发射的高输出功率真空紫外线的耐久性 并提供其制造方法。 一种用于高浓度合成石英玻璃的高输出功率真空紫外线的合成二氧化硅玻璃光学材料,用于波长范围为165至195nm的OH基,其浓度为5至300重量ppm,具有波动宽度 OH分子浓度(DELTA OH / cm)为10重量ppm以下,含有浓度为1×10 17〜1×10 19分子/ cm 3的氢分子,氢分子浓度的波动宽度(DELTA H2 / cm)为1×10 17分子/ cm 3, 较低,含有浓度为50重量ppm以下的氯。 还要求保护其的方法。

    QUARTZ GLASS SUBSTRATE AND PROCESS FOR ITS PRODUCTION
    180.
    发明公开
    QUARTZ GLASS SUBSTRATE AND PROCESS FOR ITS PRODUCTION 审中-公开
    石英玻璃基板及其制造方法

    公开(公告)号:EP2041036A1

    公开(公告)日:2009-04-01

    申请号:EP07791789.6

    申请日:2007-07-26

    Abstract: For a substrate having fine convexoconcave patterns on its surface, the dimensions of the convexoconcave patterns in a vertical direction of a quartz glass substrate are controlled to be uniform with extreme accuracy and over the entire substrate surface. The quartz glass substrate is made to have a fictive temperature distribution of at most 4O°C and a halogen concentration of less than 400 ppm, or a fictive temperature distribution of at most 4O°C, a halogen concentration of at least 400ppm and a halogen concentration distribution of at most 400ppm and the etching rate of the surface of the quartz glass substrate is made uniform, whereby the dimensions of the convexoconcave patterns in a vertical direction of the quartz glass substrate are controlled to be uniform with good accuracy and over the entire substrate surface.

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