분광 모듈
    181.
    发明公开
    분광 모듈 无效
    光谱模块

    公开(公告)号:KR1020100017082A

    公开(公告)日:2010-02-16

    申请号:KR1020097000554

    申请日:2008-06-05

    Abstract: A spectroscopic module (1) comprises a body section (2) for transmitting lights (L1, L2), a spectroscopic section (3) for dispersing the light (L1) which has entered the body section (2) from a front face (2a) of the body section (2) and reflecting the dispersed light toward the front face (2a), a light detecting element (4) having a light detecting section (41) for detecting the light (L2) dispersed and reflected by the spectroscopic section (3) and electrically connected to wiring (9) formed on the front face (2a) of the body section (2) by face down bonding, and an underfill material (12), filled into a portion on the body section (2) side of the light detecting element (4), for transmitting the lights (L1, L2). The light detecting element (4) has a light passing hole (42) through which the light (L1) travelling to the spectroscopic section (3) passes, and a rectangular annular portion (43) is formed at a rear face (4a) on the body section (2) side of the light detecting element (4) so as to surround a light emitting opening (42b) of the light passing hole (42).

    Abstract translation: 分光模块(1)包括用于传输光(L1,L2)的主体部分(2),用于分散从前表面(2a)进入主体部分(2)的光(L1)的分光部分(3) ),并且将分散的光反射到前面(2a);光检测元件(4),具有光检测部(41),用于检测由分光部分分散和反射的光(L2) (3),并且通过面朝下接合与主体部分(2)的前表面(2a)上形成的布线(9)电连接;以及填充到主体部分(2)上的部分中的底部填充材料(12) 光检测元件(4)的一侧,用于传输光(L1,L2)。 光检测元件(4)具有通过分光部(3)的光(L1)通过的光通过孔(42),在背面(4a)上形成有矩形的环状部(43) 所述光检测元件(4)的主体部分(2)侧围绕所述光通过孔(42)的发光开口(42b)。

    분광 시스템
    182.
    发明公开
    분광 시스템 无效
    光谱系统

    公开(公告)号:KR1020070049088A

    公开(公告)日:2007-05-10

    申请号:KR1020060109313

    申请日:2006-11-07

    Inventor: 유우식

    Abstract: 개선된 분광을 위한 시스템 및 기술. 약간의 실시예에서, 기계적인 및/또는 광 줌 메카니즘은 단색분광기 시스템에 제공될 수 있다. 예컨대, 이동가능한 검출기 시스템은 제 1 해상도를 얻기 위해서 검출기가 분산 구성요소에 대해 배치되게 한다. 그 다음 검출기 시스템은 제 2 해상도를 얻기 위해서 검출기가 분산 구성요소에 대해 배치되게 할 수 있다. 약간의 실시예에서, 제 1 샘플 영역의 분광은 복수의 여기 파장을 사용하여 실행될 수 있다. 다수의 검출기는 복수의 여기 파장 중에서 다른 여기 파장들과 연관된 광을 수신하기 위해 배치될 수 있다.

    MULTI-SHELF MERCHANDISE DISPLAY UNIT AND METHOD FOR MONITORING STOCK LEVELS OF SUCH A UNIT
    184.
    发明授权
    MULTI-SHELF MERCHANDISE DISPLAY UNIT AND METHOD FOR MONITORING STOCK LEVELS OF SUCH A UNIT 有权
    多层商品展示单元和用于监控这种单元的库存水平的方法

    公开(公告)号:EP3017725B1

    公开(公告)日:2018-01-31

    申请号:EP15193172.2

    申请日:2015-11-05

    Applicant: Elstat Limited

    Abstract: Disclosed is a sensor shield (6, 6a,6b) for use in a multi-shelf merchandise display unit (1) including a plurality of sensors (5,5a,5b) mounted on a wall (4) of the unit (1) and opposite a source of illumination (2), in which each sensor (5,5a,5b) corresponds to a single shelf (3,3a,3b) and in which the shelves (3,3a,3b) are at least semi-porous to the illumination. The shield (6, 6a,6b) comprises i) a plate having a length that is sufficient substantially to reduce or prevent incident illumination from the shelf (3,3a,3b) above reaching the sensor (5,5a,5b); and ii) means (26) n to attach the plate to casing of or around the sensor (5,5a,5b) or the wall (4) of the unit (1). The plate is opaque to the illumination detected by the sensor (5,5a,5b). Also disclosed is a method to reduce the interference of light in a multi-shelf merchandise display unit (1) from shelves (3,3a,3b) above a shelf (3,3a,3b) on which stock levels are being measured and a method for monitoring stock levels in a retail display cabinet by measuring light entering the retail display cabinet.

    SPECTROMETER, SPECTROMETRY, AND SPECTROMETRY PROGRAM

    公开(公告)号:EP2381240A4

    公开(公告)日:2017-11-01

    申请号:EP09834584

    申请日:2009-09-08

    Abstract: A spectroscopic measurement apparatus 1A comprises an integrating sphere 20 in which a sample S is located, a spectroscopic analyzer 30 dispersing the light to be measured from the sample S and obtaining a wavelength spectrum, and a data analyzer 50. The analyzer 50 includes an object range setting section which sets a first object range corresponding to excitation light and a second object range corresponding to light emission from the sample S in a wavelength spectrum, and a sample information analyzing section which determines a luminescence quantum yield of the sample S, determines a measurement value ¦ 0 of the luminescence quantum yield from results of a reference measurement and a sample measurement, and determines, by using factors ², ³ regarding stray light in the reference measurement, an analysis value ¦ of the luminescence quantum yield with the effect of stray light reduced by ¦ = ²¦ 0 +³. This realizes a spectroscopic measurement apparatus, a measurement method, and a measurement program which can reduce the effect of stray light generated in a spectrometer.

    ELECTRIC FIELD VECTOR DETECTION METHOD AND ELECTRIC FIELD VECTOR DETECTION DEVICE
    190.
    发明公开
    ELECTRIC FIELD VECTOR DETECTION METHOD AND ELECTRIC FIELD VECTOR DETECTION DEVICE 审中-公开
    ELEKTRISCHES FELDVEKTORDETEKTIONS EXFAHREN UND ELEKTRISCHE FELDVEKTORDETEKTIONSVORRICHTUNG

    公开(公告)号:EP3026408A1

    公开(公告)日:2016-06-01

    申请号:EP15196379.0

    申请日:2015-11-25

    Abstract: In this electric field vector detection method, an electro-optic crystal (3), where a (111) surface (3a)of an optical isotropic medium is cut out, is used as a terahertz wave detection element (3). The method includes: causing polarization of probe light (La) of ultrashort pulsed light to be circular polarization (2); allowing the probe light (La) having circular polarization to enter the terahertz wave detection element (3) and probing the terahertz wave (T); modulating the probe light, having probed the terahertz wave, by a rotating analyzer (9) and detecting the modulated probe light by a photodetector (4, 4A); performing lock-in detection of a detection signal from the photodetector by a lock-in detector using a frequency based on a rotational frequency of the rotating analyzer (9) as a reference signal; and detecting an electric field vector of the terahertz wave (T) based on a detection signal from the lock-in detector.

    Abstract translation: 在该电场矢量检测方法中,使用光学各向同性介质的(111)面(3a)的电光晶体(3)作为太赫兹波检测元件(3)。 该方法包括:使超短脉冲光的探测光(La)的极化为圆极化(2); 允许具有圆极化的探测光(La)进入太赫兹波检测元件(3)并探测太赫兹波(T); 通过旋转分析器(9)调制探测太赫兹波的探测光并通过光电检测器(4A,4A)检测调制的探测光; 通过锁定检测器使用基于旋转分析仪(9)的旋转频率的频率作为参考信号来执行来自光电检测器的检测信号的锁定检测; 以及基于来自锁定检测器的检测信号来检测太赫兹波(T)的电场矢量。

Patent Agency Ranking