Abstract:
The DRAM cell array has the triple states of "1" , "0" and "1/2". This array is effective to reduce not only the size of the layout, but also the delay time due to the low inner voltage source. This structure consists of an amplifier that detects and amplifies the voltage difference between two bit lines, transistors of MPL, MTPL, MSM and MSN that are driven by each control sygnals, two arrays that are connected simmetrically, and capacitors, as shown in the figure.
Abstract:
본 발명은 DRAM의 감지 동작시 발생하는 미세한 비트선 신호를 4배이상 증가시켜 고집적 DRAM의 안정된 정보감지를 가능하게 하고 감지 동작시 일어나는 비트선 전압스윙을 단일 비트선으로 한정함으로서 기존의 메모리 코어에서 소비되는 전력소비를 약 50% 정도로 감소시키는 고집적 DRAM용 감지 증폭기에 관한 것으로 메모셀 어레이의 저장캐패시터에 연결되는 셀-플레이트(Cell-Plate)선에 2개의 차단 트랜지스터를 채용하여 워드선 구동시 여기되는 비트선 신호를 셀-플레이트선에도 여기시켜 감지증폭기의 두입력(D,/D)사이의 전압 신호차를 감지증폭기에 대하여 약 4배 증대시킨다.
Abstract:
In the P.C.P (PMOS latch cut-off voltage level precharge scheme) sense amplifier for decreasing the size and the interconnection line of mega DRAM, the equalizing signal is applied to the equalizing transistor (Q18) and the precharge driving transistor (Q17). The source and the drain of the equalizing transistor is connected to the bit line and the bit line, respectively. The source and the drain of the precharge driving transistor is connected to the ground and the common source of PMOS latch transistor (Q14,Q15), respectively. The cut-off voltage level of PMOS latch transistor is used in t of precharging.
Abstract:
The amplifier increases the bit signal magnitude in the word line, and reduces the power consumption of memory core. The amplifier includes a sense amplifier of DRAM cell which prevecns the information destruction by rearrayment of amplifying signal, the 1st interruption transistor(MPL) which electrically isolates an 1/2 Vdd power line from a storage capacitor(CS) by control signal(PL), the 2nd transistor(MTPL) which electrically isolates the storage capacitor(CS) from the sense amplifier, and the 3rd and 4th transistors(MSM,MSN) which electrically connect to the 2nd input terminal(1D) and bit lines(BL,/BL).
Abstract:
The sense amplifier for use in a dynamic random access memory (DRAM) is disclosed. In a DRAM having a precharging and equalizing circuit for precharging and equalizing first and second bit lines, an NMOS latch connected to a first NMOS transistor of a first conductivity, and a PMOS latch, the sense amplifier includes a second NMOS transistor of a first conductivity having a drain and a source connected between the first NMOS transistor and a ground voltage, and a bipolar transistor having a base connected to a connection node between the first and second NMOS transistors, an emitter (or collector) connected to the ground voltage and a collector (or emitter) connected to a connection node between the first NMOS transistor and the NMOS latch. Thus, a stable limited voltage swing operation is obtained.
Abstract:
COSA for FIFO comprising first and second subarray (Subarray 1, Subarray 2) including a plurality of unit memory cells consisting of writing access transistor (TR1), saving capacitor (C) and reading access transistor (TR5), a plurality of writing beat lines (In0 - In7) and a plurality of writing word lines (WWL-0 - WWL-X) connected to each of said unit memory cells and writing column address selecting line, characterized in that the FIFO memory comprises a plurality of data latches saving data input from said writing beat line by SAN signal which is activated at the same time with the writing column address selecting signal and connected to the beat lines (In0 - In7) and a data drive which drives the data latches by said SAN signal to enable concurrent I/O at the same address.