公开(公告)号：JPH07114513A

公开(公告)日：1995-05-02

申请号：JP28589093

申请日：1993-10-19

Applicant: ADVANTEST CORP

Inventor： KOSUGE TAKASHI

IPC: G06F3/14 ,  G06F3/048 ,  G06F9/06 ,  G06F15/00

Abstract: PURPOSE:To make an immediate advance to a next measuring operation step by displaying the application software menu on a display device screen at the same time when the power source is turned ON at the start of measurement, when preset or set condition are recalled, or when key operation is done halfway in the measuring operation. CONSTITUTION:When a software menu that a user has registered or a software menu which is saved on a memory card is loaded by using a user defining function, if power-ON operation, presetting, or the recalling of the set conditions at the start of the measuring operation or the operation of their key halfway in the measuring operation is performed by utilizing a control circuit and a memory provided in the measuring instrument, it is recognized that key operation required for display as another step is preformed and the key operation is display on the screen of a display device, and movement to the step of next measuring operation is enabled through software.

公开(公告)号：JPH06303262A

公开(公告)日：1994-10-28

申请号：JP9128393

申请日：1993-04-19

Applicant: ADVANTEST CORP

Inventor： MIYAMAE YOSHIAKI ,  KOSUGE TAKASHI

IPC: G01R29/06 ,  H04L27/18

Abstract: PURPOSE:To obtain a digital modulating signal analizing device whereby respective symbol points and demodulation data are executed correspondance so at to be displayed in constellation display which is used at the time of evaluating the quality of a digital modulating signal. CONSTITUTION:An address generating equipment 11 which can generate an optional address within the address area of a picture memory 7, a marker display means 12 which writes a marker in the address of the picture memory 7, which is generated by the address generating equipment 11, and displays the marker M in a display equipment 9 and an address decoder 13 which converts the address of the picture memory 7 into the address of a data memory are added so as to constitute a system. Then, the marker is added to constellation display so as to be displayed and also a data display section is provided in a part of a display screen so that demodulation data of a symbol point which is indicated by the marker is displayed in the data display section.

公开(公告)号：JPH05223863A

公开(公告)日：1993-09-03

申请号：JP2363792

申请日：1992-02-10

Applicant: ADVANTEST CORP

Inventor： HIRAKOSO YOHEI ,  SATOU MITSUNORI ,  KOSUGE TAKASHI

IPC: G01R23/173

Abstract: PURPOSE:To measure the input signal waveform in zero-span mode and measure at the same time the mean of the measured waveforms. CONSTITUTION:A low pass filter 21, additional A/D converter 22, additional memory 23 path and memory means 24 are added. In zero-span mode, the integrated waveform data corresponding to the input waveform data in an amount for one picture plane (smoothened through the low pass filter 21) written in an image memory 11, is written in the additional memory 23. A CPU installed in a control circuit 12 calculates the mean of the data in additional memory 23, and value from calculation or the DC waveform corresponding to the calculation value is given on a display 14 together with the input waveform data in the image memory 11. In lieu of the additional A/D converter 22, an A/D converter 10 may be used under changing over alternately by a switching means.

公开(公告)号：JPH08233875A

公开(公告)日：1996-09-13

申请号：JP31714395

申请日：1995-11-10

Applicant: ADVANTEST CORP

Inventor： KOSUGE TAKASHI

IPC: G01R23/173

Abstract: PURPOSE: To display a spectrum of components of only a target measuring signal by removing an image spectrum generated by other higher harmonics. CONSTITUTION: A sweep offset control part 13 is provided to control a first local oscillator 56 for sweeping so that a sweep frequency fosc of the oscillator 56 is switched between a first sweep frequency fosc1 and a second sweep frequency fosc2=fosc1+2fif2/N at the sweeping time. A smaller data value of spectra data obtained with the sweep frequencies fosc1 and fosc2 by the control part 13 is selected and output by an image-removing/processing part 12.

公开(公告)号：JPH08136593A

公开(公告)日：1996-05-31

申请号：JP30319994

申请日：1994-11-11

Applicant: ADVANTEST CORP

Inventor： MIYAMAE YOSHIAKI ,  KOSUGE TAKASHI ,  OGINO YOSHIMASA

IPC: G01R23/173

Abstract: PURPOSE: To obtain a spectrum analyzer whose high measuring accuracy is enhanced with reference to only a specific frequency band by a method wherein a high-accuracy frequency-characteristic correction means is installed with reference to the specific frequency band as an object. CONSTITUTION: On the basis of a central-frequency setting operation from a setting panel 96 and on the basis of a frequency-span-setting input condition, it is judged whether a specific frequency band to which a precision frequency correction is to be executed is in a measuring state or not. When the specific frequency band is in the measuring state, the correction and arithmetic- processing operation of a frequency characteristic is performed with good accuracy and fine by means of precision-correction offset data 22a in a precision- frequency characteristic correction memory 22 so as to be output. On the other hand, when the specific frequency band is not in the measuring state, a precision-frequency correction part 20 which outputs the frequency characteristic as it is without performing the correction and arithmetic-processing operation is installed.

公开(公告)号：JPH07134151A

公开(公告)日：1995-05-23

申请号：JP27978293

申请日：1993-11-09

Applicant: ADVANTEST CORP

Inventor： YAMAGUCHI TAKAHIRO ,  FUKUI TAKAMASA ,  KASAHARA TOSHIHARU ,  YAMASHITA KOICHI ,  AOYAMA OSAMU ,  KOSUGE TAKASHI ,  MIYAMAE YOSHIAKI ,  TAKAOKU HIROAKI

IPC: G01R23/16 ,  G01R23/173

Abstract: PURPOSE:To store analytical conditions for high speed measurement and a plurality of precise measurements in an analytical condition memory means, successively store each analytical condition in each setting memory means, read the results obtained by frequency analysis according to respective analytical conditions into an image memory, and display a plurality of measurement results on one screen. CONSTITUTION:An analytical condition file for high speed measurement is stored in the memory area 200A of an analytical condition memory means 200, and analytical condition files for precise measurement are stored in the memory area 200B-200D. After the analytical conditions are stored in each memory area 200A-200D, the mode is switched to automatic measurement mode. A controller 115 successively reads the analytical condition files for high speed measurement and precise measurement, temporarily stores them in setting memory means 106, 107, 112, 117, 118, and performs frequency analysis according to the analytical conditions. The results are stored in four memory areas of an image memory 300. Thus, one or a plurality of the measurement results can be displayed in one screen of an indicator 301.

公开(公告)号：JPH0980094A

公开(公告)日：1997-03-28

申请号：JP23166295

申请日：1995-09-08

Applicant: ADVANTEST CORP

Inventor： YAMASHITA KOICHI ,  FUKUI TAKAMASA ,  YAMAGUCHI TAKAHIRO ,  AOYAMA OSAMU ,  KOSUGE TAKASHI ,  MIYAMAE YOSHIAKI ,  KASAHARA TOSHIHARU ,  TAKAOKU HIROAKI

IPC: G01R23/173 ,  G01R23/20

Abstract: PROBLEM TO BE SOLVED: To properly measure three-dimensional distortion of a low level. SOLUTION: The input attenuation is made 0dB (S2 ), thereby it is made large by step 10dB and the three-dimensional distortion level L3 at this time is measured (S3 ). Next, the quantity of the input attenuation is changed to δATT=1dB, a three-dimensional distortion level L3 ' and a fundamental wave level L1 are measured and at the time a change quantity of the three- dimensional distortion level δDis =L3 -L3 ' is found. If the δDis is not within δATT±ε, it will be returned to (S3 ), furthermore the attenuation of 10dB is increased, and the similar method is performed. If the δDis is within δATT±ε, the three-dimensional distortion L3 ' at this time is made input and L1 -L3 '=ΔL represents the level difference between the fundamental wave and the three- dimensional distortion.

公开(公告)号：JPH0980092A

公开(公告)日：1997-03-28

申请号：JP23167895

申请日：1995-09-08

Applicant: ADVANTEST CORP

Inventor： FUKUI TAKAMASA ,  YAMASHITA KOICHI ,  YAMAGUCHI TAKAHIRO ,  AOYAMA OSAMU ,  KOSUGE TAKASHI ,  MIYAMAE YOSHIAKI ,  KASAHARA TOSHIHARU ,  TAKAOKU HIROAKI

IPC: G01R23/173 ,  G01R29/26

Abstract: PROBLEM TO BE SOLVED: To automatically determine the pass band width(RBW) or the like of a spectrum analyzer by determining RBW of BPF on the basis of the frequency interval of a waveform to be displayed, the noise level or the like. SOLUTION: RBW of BPFs 19, 24 of a spectrum analyzer 15 is made a parameter, and RBW is determined from the frequency interval of the waveform to be displayed so as to satisfy the relation with the frequency interval of the waveform to be displayed and the noise level or the dynamic range of an input signal. In other words, a control part 31 reads the spectrum of the input signal from a buffer memory 29, detects a frequency with its maximum value and makes it a central frequency. The central frequency is stored in a parameter value storing part 36. When the central frequency is determined, the input signal is measured again so that the central frequency may be in the center of a display scope and stored in a buffer memory 29. A noise part to be measured is made an offset value, three times thereof a frequency span, and RBW of BPFs 19, 24 is determined.