Abstract:
The continuous processing of semiconductor wafers transported through a reactor system having a series of reaction zones permitting separate process functions, with zone isolation achieved through the use of dynamically sealed vapor-purged isolation chambers. An in-line, verticaL arrangement of gas inlets and outlets and planar work supports effect a laminar flow of gaseous materials.
Abstract:
PROCESS AND APPARATUS FOR FREE POLISHING Opposite faces of a workpiece, such as a semiconductor wafer, are simultaneously free polished by contacting the faces with a pair of rotating polishing pads to which are fed a polishing slurry of an abrasive material. A pattern of perforations is provided in the surface of at least one of the pads such that the area of pad in contact with the opposite faces of the workpiece is different. FI 9-78-031