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公开(公告)号:CA1057529A
公开(公告)日:1979-07-03
申请号:CA260525
申请日:1976-09-03
Applicant: IBM
Inventor: LITZ FRANK A , MATHISEN EINAR S , SCHUMANN PAUL A JR , VALENTINO CARL R
Abstract: AUTOMATIC TEST SAMPLE HANDLING SYSTEM An automatic handling system selectively conveys test samples to a test probe for analysis by an instrument. The test samples are contained in sample containers. A magazine contains sampler holders each of which contains sample containers. A transport system conveys the magazine so that the holders successively pass through an extraction station from where the holders can be taken from the magazine and placed back therein. The holders upon extraction are then conveyed past a test probe so that individual samples can be selectively presented to the probe.
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公开(公告)号:FR2327527A1
公开(公告)日:1977-05-06
申请号:FR7626309
申请日:1976-08-25
Applicant: IBM
Inventor: DEMSKY HERBERT M , MATHISEN EINAR S , SCHUMANN PAUL A JR , TONG ALVIN H , MILLEVOY ROBERT C
Abstract: The station has a table lifting the sample. a test head (2) is suspended on the device frame (1), and the sample table (3) is below it. The test head consists of an opaque case (31) and a cylindrical chamber open at the bottom and covered by a glass plate. A first optical fibre bunch (32) is inserted along the cylinder axis for the sample illunination. Several holes are made in the chamber sides for fibre bunches (34) carrying light diffusely reflected from the sample (33). Their axes intersect on the cylinder axis. The sample is pressed by the lifting table (3) to the glass plate, with the pressure controlled by a spring (29).
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