公开(公告)号：US3655457A

公开(公告)日：1972-04-11

申请号：US3655457D

申请日：1968-08-06

Applicant: IBM

Inventor： DUFFY MICHAEL C ,  SCHUMANN PAUL A JR ,  YEH TSU-HSING

IPC: H01L21/76 ,  H01L21/00 ,  H01L21/265 ,  H01L21/322 ,  H01L21/331 ,  H01L21/337 ,  H01L21/74 ,  H01L21/761 ,  H01L21/82 ,  H01L21/822 ,  H01L21/8222 ,  H01L27/00 ,  H01L27/04 ,  H01L29/08 ,  H01L29/167 ,  H01L29/73 ,  H01L29/808 ,  H01L7/00

CPC classification number: H01L29/167 ,  H01L21/00 ,  H01L21/26506 ,  H01L21/26513 ,  H01L21/26586 ,  H01L21/3221 ,  H01L21/74 ,  H01L21/761 ,  H01L21/82 ,  H01L21/8222 ,  H01L27/00 ,  H01L29/0821 ,  Y10S148/062 ,  Y10S148/085 ,  Y10S148/151 ,  Y10S438/904

Abstract: Monolithic integrated circuits are made utilizing various ion implantation techniques for making diodes, transistors, resistors, capacitors, underpass connections, sub-collector junctions, etc., and for altering impurity profiles, gold doping, trimming resistance values, altering junctions depth, and isolating regions.

Abstract translation: 使用各种离子注入技术制造单片集成电路，用于制造二极管，晶体管，电阻器，电容器，地下通道连接，子集电极结等，并且用于改变杂质分布，金掺杂，修整电阻值，改变接合深度和隔离 地区。

公开(公告)号：US3623818A

公开(公告)日：1971-11-30

申请号：US3623818D

申请日：1969-12-15

Applicant: IBM

Inventor： GARDNER EDWARD E ,  KEENAN WILLIAM A ,  SCHUMANN PAUL A JR

IPC: H01L21/66 ,  G01N21/21 ,  G01N21/55 ,  G01N21/84 ,  G01R31/26 ,  G01N21/48 ,  G01T1/16

CPC classification number: G01R31/2637 ,  G01N21/21 ,  G01N21/55 ,  G01N2021/8461

Abstract: Carrier concentration of a semiconductive material is measured by directing monochromatic light at the material. The light is polarized with its electric vector in the plane of incidence. The angle of incidence is varied until a minimum in reflectivity occurs. The angle at which the minimum occurs, referred to as the pseudo-Brewster angle theta B, is related to the carrier concentration, whence the carrier concentration may be determined by comparison with a series of standards or by calculation.

公开(公告)号：US3590372A

公开(公告)日：1971-06-29

申请号：US3590372D

申请日：1968-12-26

Applicant: IBM

Inventor： DESANTIS DOMINIC P ,  DESSAUER RALPH G ,  GOREY EDWARD F ,  POPONIAK MICHAEL R ,  SCHNEIDER CHRISTIAN P ,  SCHUMANN PAUL A JR

IPC: G01R27/00 ,  G01N27/04 ,  G01R1/067 ,  G01R31/28 ,  H01L21/66 ,  G01R27/14

CPC classification number: G01R31/2831 ,  G01N27/041 ,  G01R1/06705

Abstract: A three-point probe is employed to determine the spreading resistance of a material with the spreading resistance probe, which is common to both the current source and a voltage measuring means, being moved into engagement with the material after the other two probes are in engagement with the material. The velocity with which each of the probes engages the material is controlled and is variable. To ascertain that a good contact has been made by the spreading resistance probe and the magnitude of the current flowing through the material from the current source, the voltage measuring means is connected across resistance means in the wire from the current source to the spreading resistance probe and current is directed through the resistance means in opposite directions by flowing through the material between the spreading resistance probe and one of the other two probes. After the magnitude of the current has been determined, the voltage measuring means is connected to the spreading resistance probe adjacent its contact to the material and to the other of the two probes, which is not connected to the current source, to determine the voltage drop through the material due to current from the current source flowing in opposite directions through the material. The amount of difference between the two voltage readings on the specimen indicates if good contact is achieved.

公开(公告)号：US3487301A

公开(公告)日：1969-12-30

申请号：US3487301D

申请日：1968-03-04

Applicant: IBM

Inventor： GARDNER EDWARD E ,  GOREY EDWARD F ,  SCHUMANN PAUL A JR ,  YEH TSU-HSING

IPC: G01N27/04 ,  G01R31/26 ,  G01R27/14

CPC classification number: G01N27/041 ,  G01R31/2644

公开(公告)号：CA1058904A

公开(公告)日：1979-07-24

申请号：CA263202

申请日：1976-10-08

Applicant: IBM

Inventor： DEMSKY HERBERT M ,  MATHISEN EINAR S ,  SCHUMANN PAUL A JR ,  TONG ALVIN H

IPC: G01J3/51 ,  G01J1/04 ,  G01J3/46 ,  G01J3/50 ,  G01N21/47

Abstract: APPARATUS FOR TEXTILE COLOR ANALYSIS USING REFLECTED LIGHT In a textile color analyzer, a sample of textile is supported on the pad of an elevator mechanism that holds the sample against an instrument head. The head has an opaque housing provided with a chamber having an opening therein. A glass plate is mounted in the head and covers the opening and presses against the textile sample to provide a stable reference plane. The head includes an illuminating fiber optic bundle that directs light substantially perpendicular to the textile sample. A plurality of additional fiber optic bundles are mounted to receive diffuse light reflected from the sample. The elevator includes a pad of translucent polyethelene material that backs up the textile sample and takes on the color of the sample so that there are no adverse effects due to light showing through the sample and reflecting from the plate.

公开(公告)号：CA1066085A

公开(公告)日：1979-11-13

申请号：CA263200

申请日：1976-10-08

Applicant: IBM

Inventor： DEMSKY HERBERT M ,  MATHISEN EINAR S ,  MILLEVOY ROBERT C ,  SCHUMANN PAUL A JR ,  TONG ALVIN H

IPC: G01J3/50 ,  G01N21/47 ,  G01J3/46

Abstract: APPARATUS FOR TEXTILE COLOR ANALYSIS USING REFLECTED LIGHT In a textile color analyzer, a sample of textile is supported on the pad of an elevator mechanism that holds the sample against an instrument head. The head has an opaque housing provided with a chamber having an opening therein. A glass plate is mounted in the head and covers the opening and presses against the textile sample to provide a stable reference plane. The head includes an illuminating fiber optic bundle that directs light substantially perpendicular to the textile sample. A plurality of additional fiber optic bundles are mounted to receive diffuse light reflected from the sample. The elevator includes a pad of translucent polyethelene material that backs up the textile sample and takes on the color of the sample so that there are no adverse effects due to light showing through the sample and reflecting from the plate.

公开(公告)号：FR2327524A1

公开(公告)日：1977-05-06

申请号：FR7626308

申请日：1976-08-25

Applicant: IBM

Inventor： SCHUMANN PAUL A JR ,  TON ALVIN H

IPC: G01J3/51 ,  G01J3/00 ,  G01J3/02 ,  G01J3/50 ,  G01N21/27 ,  G01N21/55 ,  G01J3/34 ,  G01J3/46 ,  G01N21/48 ,  G01N33/36

Abstract: A spectrophotometer is operative to measure or analyze the colors of materials such as textiles. A test sample is held by a holder and is illuminated by polychromatic light. Diffuse light reflected from the sample is collected and converted to variable monochromatic light and detected. The system is calibrated by using a secondary white standard calibrated against a primary white standard, by using a black standard to compensate for dark current and internal reflectance from a pressure plate, and by using a mirror to obtain internal wall reflectance used in a correction factor.

公开(公告)号：CA911528A

公开(公告)日：1972-10-03

申请号：CA911528D

Applicant: IBM

Inventor： SANTIS DOMINIC P DE ,  DESSAUER RALPH G ,  GOREY EDWARD F ,  SCHUMANN PAUL A JR ,  POPONIAK MICHAEL R ,  SCHNEIDER CHRISTIAN P

公开(公告)号：CA1059338A

公开(公告)日：1979-07-31

申请号：CA263204

申请日：1976-10-08

Applicant: IBM

Inventor： SCHUMANN PAUL A JR ,  TONG ALVIN H

IPC: G01J3/51 ,  G01J3/00 ,  G01J3/02 ,  G01J3/50 ,  G01N21/27 ,  G01N21/55 ,  G01N21/48

Abstract: TEXTILE COLOR ANALYZER CALIBRATION A spectrophotometer is operative to measure or analyze the colors of materials such as textiles. A test sample is held by a holder and is illuminated by polychromatic light. Diffuse light reflected from the sample is collected and converted to variable monochromatic light and detected. The system is calibrated by using a secondary white standard calibrated against a primary white standard, by using a black standard to compensate for dark current and internal reflectance from a pressure plate, and by using a mirror to obtain internal wall reflectance used in a correction factor.

公开(公告)号：FR2323184A1

公开(公告)日：1977-04-01

申请号：FR7623633

申请日：1976-07-27

Applicant: IBM

Inventor： LITZ FRANK A ,  MATHISEN EINAR S ,  SCHUMANN PAUL A JR ,  VALENTINO CARL R ,  NIELSEN THOMAS C ,  SIRICO ET JAMES L

IPC: B65G1/10 ,  G01N35/02 ,  G05B19/00

Abstract: The test sample container manipulation system transports and presents several contains at a test position. The system has several container supports and a magazine designed to hold sevral of the container supports. It has a first conveyor system which displaces the magazine along a first path. A second conveyor system displaces the container supports along a second path which crosses the first in a predetermined position. The second conveyor extends up to the test position the conveyors function being to position; in incremental steps the magazine in the test position. A transfer system transfers, at the test position, the container supports inside the magazine to the second conveyor.