Scanning microscope
    11.
    发明专利
    Scanning microscope 审中-公开
    扫描显微镜

    公开(公告)号:JP2006113593A

    公开(公告)日:2006-04-27

    申请号:JP2005301271

    申请日:2005-10-17

    Abstract: PROBLEM TO BE SOLVED: To provide a scanning microscope in which (configuring elements of) the microscope are efficiently cooled by a simply structured means. SOLUTION: Such a scanning microscope as a confocal scanning microscope is composed by including a scanning unit (1), a detecting unit (2), an electronic unit (3) for operating the scanning microscope, and a cooling unit for at least one configuring element of the scanning microscope. The cooling unit (4) is characterized in that the unit is composed so as to be operated with a liquid cooling medium. COPYRIGHT: (C)2006,JPO&NCIPI

    Abstract translation: 要解决的问题:提供一种扫描显微镜,其中通过简单的结构化方式有效地冷却显微镜的(构成元件)。 解决方案:作为共聚焦扫描显微镜的这种扫描显微镜由包括扫描单元(1),检测单元(2),用于操作扫描显微镜的电子单元(3)和用于在扫描显示器 扫描显微镜的至少一个配置元件。 冷却单元(4)的特征在于,该单元构成为与液体冷却介质一起操作。 版权所有(C)2006,JPO&NCIPI

    Device and method for adjusting beam in optical beam path
    14.
    发明专利
    Device and method for adjusting beam in optical beam path 有权
    光束路径调整光束的装置和方法

    公开(公告)号:JP2014098920A

    公开(公告)日:2014-05-29

    申请号:JP2013273064

    申请日:2013-12-27

    CPC classification number: G02B21/06

    Abstract: PROBLEM TO BE SOLVED: To provide a device and method for adjusting a beam in an optical beam path.SOLUTION: A device for beam adjustment in optical beam paths having at least two mutually independent light sources (1 and 2), preferably, in beam paths (8 and 9) of a high resolution or super high resolution microscope requires superposition of beams of the light sources (1 and 2) in a common illuminating beam path (10). In the device, a calibration sample (22) for assisting so as to check pupil positions and/or focus positions of the beams is put in the illuminating beam path (10) and can be taken out from the illuminating beam path (10).

    Abstract translation: 要解决的问题:提供一种用于调整光束路径中的光束的装置和方法。解决方案:一种用于光束路径中的光束调节的装置,其具有至少两个相互独立的光源(1和2),优选地在光束 高分辨率或超高分辨率显微镜的路径(8和9)需要在公共照明光束路径(10)中叠加光源(1和2)的光束。 在该装置中,将用于辅助以检查光束的瞳孔位置和/或聚焦位置的校准样本(22)放入照明光束路径(10)中并且可以从照明光路(10)中取出。

    Scanning microscope
    15.
    发明专利
    Scanning microscope 审中-公开
    扫描显微镜

    公开(公告)号:JP2014052660A

    公开(公告)日:2014-03-20

    申请号:JP2013252811

    申请日:2013-12-06

    Abstract: PROBLEM TO BE SOLVED: To provide a scanning microscope in which a configuring element of the microscope can be efficiently cooled by simply structured means.SOLUTION: A scanning microscope such as a confocal scanning microscope comprises: a scanning unit (1); a detecting unit (2); an electronic unit (3) for operating the scanning microscope; and a cooling unit (4) for at least one configuring element of the scanning microscope. In the scanning microscope, the cooling unit (4) is composed so as to be operated with a liquid cooling medium.

    Abstract translation: 要解决的问题:提供一种扫描显微镜,其中可以通过简单的结构化装置有效地冷却显微镜的构成元件。解决方案:扫描显微镜如共焦扫描显微镜包括:扫描单元(1); 检测单元(2); 用于操作扫描显微镜的电子单元(3) 以及用于扫描显微镜的至少一个配置元件的冷却单元(4)。 在扫描显微镜中,冷却单元(4)构成为与液体冷却介质一起操作。

    Detection device
    16.
    发明专利
    Detection device 审中-公开
    检测装置

    公开(公告)号:JP2013040939A

    公开(公告)日:2013-02-28

    申请号:JP2012180130

    申请日:2012-08-15

    CPC classification number: H01L31/024 H01J40/02 H01J40/16 H01J43/02 H01J43/28

    Abstract: PROBLEM TO BE SOLVED: To provide a detection device.SOLUTION: The detection device is embodied so as to receive light and generate an electric signal, and has an optical sensor having a light incident surface and a cooling element. The cooling element comes into direct contact with the optical sensor on the light incidence surface of the optical sensor and/or a substrate that carries the optical sensor.

    Abstract translation: 要解决的问题:提供一种检测装置。 解决方案:检测装置被实现为接收光并产生电信号,并且具有具有光入射表面和冷却元件的光学传感器。 冷却元件与光学传感器的光入射表面上的光学传感器和/或承载光学传感器的基板直接接触。 版权所有(C)2013,JPO&INPIT

    Method for correcting image distortions in confocal scanning microscope
    17.
    发明专利
    Method for correcting image distortions in confocal scanning microscope 有权
    用于校正协同扫描显微镜中的图像失真的方法

    公开(公告)号:JP2012141608A

    公开(公告)日:2012-07-26

    申请号:JP2011279603

    申请日:2011-12-21

    Inventor: BIRK HOLGER

    CPC classification number: G02B21/0036 G02B21/0048 G02B21/365 G02B21/367

    Abstract: PROBLEM TO BE SOLVED: To provide a method for identifying scan coordinate values or corrected scan coordinate values for operating a scanning unit of a confocal scanning microscope, or a method for creating an image of a sample with the aid of a confocal scanning microscope, which enable the creation of a precise image of the sample, in particular at image edges, using simple means.SOLUTION: For Cartesian image coordinates (X, Y) of image points of an image to be created of a sample 32, spherical scan coordinate values (φ, θ) are identified with the aid of a coordinate transformation of the Cartesian image coordinate values into a spherical coordinate system in order to determine scan coordinate values (φ, θ) for operating a scanning unit 28 of a confocal scanning microscope 20. The scanning unit 28 is operated in accordance with the spherical scan coordinate values (φ, θ).

    Abstract translation: 要解决的问题:提供一种用于识别用于操作共焦扫描显微镜的扫描单元的扫描坐标值或校正的扫描坐标值的方法,或者借助于共焦扫描来产生样品的图像的方法 显微镜,其能够使用简单的手段创建样品的精确图像,特别是在图像边缘。

    解决方案:要创建的图像的图像点的笛卡尔图像坐标(X n ,Y n ) 样本32,球形扫描坐标值(φ n ,θ n )通过坐标变换 将笛卡尔图像坐标值转换成球面坐标系,以确定用于操作a的扫描坐标值(φ n ,θ n ) 扫描单元28根据球面扫描坐标值(φ n ,θ n )。 版权所有(C)2012,JPO&INPIT

    Apparatus and method for detection with scanning microscope
    18.
    发明专利
    Apparatus and method for detection with scanning microscope 有权
    用于扫描显微镜检测的装置和方法

    公开(公告)号:JP2007114764A

    公开(公告)日:2007-05-10

    申请号:JP2006255840

    申请日:2006-09-21

    CPC classification number: G02B21/008 G02B21/0036

    Abstract: PROBLEM TO BE SOLVED: To provide an apparatus and a method for detection with a scanning microscope.
    SOLUTION: The apparatus and the method for detection with the scanning microscope (1) are disclosed. The scanning microscope (1) encompasses a scanning device (7) that guides an illuminating light beam (3) through a scanning optical system (12) and a microscope optical system (13) and over or through a specimen (15). A digital circuit (30), which periodically interrogates the detected signals within a pixel (P
    x, y ) and calculates an average therefrom, is placed after a detection unit (19).
    COPYRIGHT: (C)2007,JPO&INPIT

    Abstract translation: 要解决的问题:提供一种用扫描显微镜检测的装置和方法。 解决方案:公开了用扫描显微镜(1)进行检测的装置和方法。 扫描显微镜(1)包括通过扫描光学系统(12)和显微镜光学系统(13)引导照明光束(3)并穿过或穿过样本(15)的扫描装置(7)。 在检测单元(19)之后放置数字电路(30),其周期性地询问像素内的检测信号(P x,y )并计算其平均值。 版权所有(C)2007,JPO&INPIT

    Microscope
    19.
    发明专利
    Microscope 审中-公开
    显微镜

    公开(公告)号:JP2006235629A

    公开(公告)日:2006-09-07

    申请号:JP2006043887

    申请日:2006-02-21

    CPC classification number: G02B21/0036

    Abstract: PROBLEM TO BE SOLVED: To constitute a scanning microscope so that, above all, it can be adjusted very easily.
    SOLUTION: The scanning microscope or a raster microscope has a system, provided with a scan head (2) having a scanner (1) for a light beam and a scanning barrel lens (3), where the scanning barrel lens (3) is coupled to the scanning head (2).
    COPYRIGHT: (C)2006,JPO&NCIPI

    Abstract translation: 要解决的问题:为了构成扫描显微镜,首先它可以非常容易地调节。 解决方案:扫描显微镜或光栅显微镜具有系统,其具有扫描头(2),扫描头(2)具有用于光束的扫描仪(1)和扫描镜筒(3),其中扫描筒镜 )耦合到扫描头(2)。 版权所有(C)2006,JPO&NCIPI

    Apparatus for determining light power level, microscope, and method for microscopy
    20.
    发明专利
    Apparatus for determining light power level, microscope, and method for microscopy 审中-公开
    用于确定光功率级别,显微镜和显微镜方法的装置

    公开(公告)号:JP2003075764A

    公开(公告)日:2003-03-12

    申请号:JP2002152540

    申请日:2002-05-27

    CPC classification number: G02B27/108 G02B21/00 G02B27/144 G11B7/00

    Abstract: PROBLEM TO BE SOLVED: To provide an apparatus for determining a light power level by a sufficiently precise and reproducible method.
    SOLUTION: The apparatus for determining the light power level of a light beam (7) has a beamsplitter (1) and a detector (11) associated with the beamsplitter (1). The apparatus is characterized in that the beamsplitter (1) splits measuring light (23) from the light beam and conveys it to the detector (11), and that the ratio between the light power level of the light beam (7) and the light power level of the measuring light (23) measured at the detector (11) is constant over time.
    COPYRIGHT: (C)2003,JPO

    Abstract translation: 要解决的问题:提供一种通过足够精确和可再现的方法来确定光功率水平的装置。 解决方案:用于确定光束(7)的光功率电平的装置具有与分束器(1)相关联的分束器(1)和检测器(11)。 该装置的特征在于分束器(1)从光束分离测量光(23)并将其传送到检测器(11),并且光束(7)的光功率级与光 在检测器(11)处测量的测量光(23)的功率电平随时间变化是恒定的。

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