Abstract:
PROBLEM TO BE SOLVED: To provide a microscope provided with auxiliary means which detect a change occurring in a drift, can be equilibrated and can easily and surely focus an object and a method of driving microscope. SOLUTION: This microscope is provided with at least one object supporting unit assigned to the object and is provided with at least one reference object having the known shape constitution thereof. The reference object is constituted to be detectable in the manner of optical microscope for the purpose of calibration, regulation and/or regulation operation of a raster microscope.
Abstract:
PROBLEM TO BE SOLVED: To form a low output power laser beam source which can be utilized especially as a light source for a confocal scanning type microscopic method. SOLUTION: In this device for coupling beams from at least two laser beam sources 1 and 2 related to the confocal scanning type microscopic method, the beams from the laser beam sources 1 and 2 at least have nearly the same wavelength. The device is provided with at least a beam coupling device 11 coupling light beams by a system hardly having loss.
Abstract:
PROBLEM TO BE SOLVED: To provide an interference microscope which makes it possible to obtain a phase state of light to be subjected to interference in an object region and makes it possible to easily adjust (or control) the interference microscope at a low cost in accordance therewith and a method of operation for the same. SOLUTION: The interference microscope provided with at least one test article carrier unit disposed at a test article (sample), above all, a 4Pi- microscope, a Wellenfield microscope, I2M-microscope, I3M-microscope or I5M- microscope, is constituted in such a manner that at least one surface (29)-, more preferably (29)- of the test article carrier unit (22) is opto-microscopically detectable in order to determine an illumination state in the object region of the interference microscope.
Abstract:
PROBLEM TO BE SOLVED: To provide an optical device capable of combining at least the greater part of light emitted from an object to be detected by a detecting optical path combining member without losing the light and guiding the combined light to a propagation direction. SOLUTION: In a detection object illuminating optical device including the illuminating optical path of a light source, the detecting optical path of a detector (5) and a member for combining the detecting optical path and prepared especially for a confocal or double confocal scanning microscope, light emitted from an object (1) to be detected can be combined by a member (detecting optical path combining member) (6) for combining the detecting optical path (4) as to the cross-section of a beam effective for the detector (5), at least the greater part of the combined light is superposed and transmitted in the propagation direction (19) and a member (phase adjusting member) for exerting influence upon the phase of light emitted from the object (1) is arranged at least in the divided optical path (12) of the detecting optical path (4).
Abstract:
PROBLEM TO BE SOLVED: To avoid problems caused by a reproducing method. SOLUTION: In the transparent sample illuminating method to be especially used in a double confocal scanning microscope, two light waves from a coherent light source (4) focused on the point of a transparent sample (1) from opposite directions (2 and 3) in order to illuminate the point of the sample (1) are made to interfere in one illumination pattern. In the method, at least two additional coherent light waves advancing each other are superposed to minimize the sub maximums (11 and 12) of the illumination pattern.
Abstract:
PROBLEM TO BE SOLVED: To fundamentally evade the problems of a reconstitution method. SOLUTION: The double confocal scanning microscope having an illumination beam path (1) of a light source (2) and a detecting beam path (3) of a detector (4) is provided with at least one optical constitution members (24 and 25) acting on the illumination beam path and/or the detecting beam path (1, 2). The optical constitution members are so constituted as to affect the amplitude and/or phase of light and/or polarized light. The microscope is thereby so constituted that the characteristics of the light are changed in the double confocal illumination beam path (1) and/or the detecting beam path (3).
Abstract:
PROBLEM TO BE SOLVED: To provide a double confocal scanning type microscope which can realize at least almost theoretically realizable resolution especially in association with polychromatic fluorescent use. SOLUTION: This invention relates to the double confocal scanning type microscope having an irradiation beam passage 2 of at least one light source 3 and a detection beam passage 4 of at least one detector 5. In particular, optical characteristics of elements 6, 10, 13 and 14 arranged at the beam passages are mutually adjusted so that accumulated aberration is at least as large as theoretically realizable resolution as to an optical axis 33 and/or at least one surfaces 18, 19 and 20 of a sample region.
Abstract:
The invention relates to a scanning microscope with a device for fluorescence correlation spectroscopy. The scanning microscope is characterized in that the intensity of the illumination light and/or the detection sensitivity is spatially modulated within the measuring volume.
Abstract:
Apparatus for combining light from at least two laser light sources (1, 2), such as in a confocal scanning microscope, employs laser light sources of low output power, the light from the sources having at least approximately the same wavelength. A beam combining unit (11) combines the light beams (12, 13) from the two sources in a substantially loss-free manner on the basis of at least one characteristic of the beams. This characteristic can be, for example, the light polarisation, in which case the beam combining unit (11) can be a polarisation beam splitter, phase of light, the pulse profile over time of light or the identical numerical aperture of a glass fibre (Fig 7). Master laser (24, Fig 5) may be combined with slave lasers (25-27, Fig 5). A Faraday rotator (17, Fig 2) or acousto-optical deflector (AOD) (38, Fig 6) may be used.