Abstract:
The present invention relates generally to functional pathway configurations at the interfaces between integrated circuits (ICs) and the circuit assemblies with which the ICs communicate. More particularly, the present invention relates generally to the functional pathway configuration at the interface between a semiconductor chip including an IC (e.g., computer chips like microcontrollers and microprocessors) and the circuitry of a system including the chip. Even more particularly, the present invention relates to a 20-pin microcontroller functional pathway configuration for the interface between the microcontroller and a system in which the microcontroller is embedded.
Abstract:
A direct sensor interface (DSI) module which allows a microcontroller to directly interface to sensors having at least one of a resistive, capacitive, and/or current source characteristic. The DSI module is coupled directly to a sensor device, which could be a reference resistor, which generates a sensor current. A current mirroring circuit outputs a charging current proportional to the sensor current. A capacitive sensor and/or a capacitive device is coupled to the current mirroring circuit and generates a voltage when charged by the charging current. Using a comparator and a threshold voltage source, the time it takes the capacitive sensor and/or a capacitive device to ramp up from zero to the threshold voltage can be measured. The charging time is proportional to the sensor reading.
Abstract:
A direct sensor interface (DSI) module which allows a microcontroller to directly interface to sensors having at least one of a resistive, capacitive, and/or current source characteristic. The DSI module is coupled directly to a sensor device, which could be a reference resistor, which generates a sensor current. A current mirroring circuit outputs a charging current proportional to the sensor current. A capacitive sensor and/or a capacitive device is coupled to the current mirroring circuit and generates a voltage when charged by the charging current. Using a comparator and a threshold voltage source, the time it takes the capacitive sensor and/or a capacitive device to ramp up from zero to the threshold voltage can be measured. The charging time is proportional to the sensor reading.
Abstract:
A comparator is used as a microcontroller peripheral and is programmable for either high-speed or low-power operation. High-speed operation requires higher operating current than the operating current required in the low-power mode, but enables much faster response to changes in input signals. When in the low-power mode, the quiescent current of the comparator circuit is minimal but the response is slower to changing input signals. Current control is used on the first input stage, which affects the current consumption of the subsequent stages. The current consumption is adjusted by switching in and out different current sources for the differential input stage of the comparator.
Abstract:
An auto-calibration circuit minimizes input offset voltage in an integrated circuit analog input device. The auto-calibration circuit may also calibrate a plurality of analog input devices on an integrated circuit die or in a multi-chip package (MCP). The auto-calibration circuit and analog input device(s) may be fabricated in combination with a microcontroller system on an integrated circuit die or in an MCP. The auto-calibration circuit controls input offset voltage compensation circuit that counteracts or compensates for input offset voltage so as to minimize voltage error at the output of the analog input device. A digital control circuit applies a digital word to the input offset voltage compensation circuit for generating the required input offset voltage compensation. A linear search or binary search of various values of the digital word may be used by the digital control circuit. The digital control circuit switches the inputs, the output and feedback-gain determining resistors for the analog input device during a calibration mode. A voltage comparator compares the output of the analog input device and a voltage reference. When the output of the analog input device is equal to or greater than the voltage reference, the comparator output signals the digital control circuit by changing its output logic level. The input offset voltage compensation circuit of the analog input device has a storage register or memory that retains the digital word which compensates for the input offset voltage.
Abstract:
A configurable operational amplifier (200) which is programmed to specific characteristics and parameters for various requirements in the measurement of analog signals. These programmable characteristics and parameters are gain bandwidth product (GBWP), selection of operational amplifier (op-amp) or comparator modes of operation, input offset zero calibration, ultra low bias current, rail-to-rail input operation, and rail-to-rail output operation. The configurable operational amplifier (200) is used in combination with a microcontroller system (102), and may be fabricated on an integrated circuit die or in a multi-chip package.
Abstract:
A configurable mixed analog and digital mode controller may be fabricated as a single monolithic device such as an integrated circuit semiconductor die or a multi-chip package (MCP). The configurable mixed analog and digital mode controller may be a microcontroller and/or a digital signal processor (DSP) in combination with both analog and digital peripherals that may be configured and connected together, both before and during operation thereof, to function as a complete controller system.