公开(公告)号：JPH10321182A

公开(公告)日：1998-12-04

申请号：JP12759797

申请日：1997-05-16

Applicant: SEIKO INSTR INC

Inventor： ITOU TETSUMASA ,  NAKAGAWA YOSHITOMO ,  MATSUZAWA OSAMU

IPC: G01N27/62 ,  G01N1/28 ,  G01N21/73 ,  H01J49/04 ,  H01J49/10

Abstract: PROBLEM TO BE SOLVED: To preclude the possibility of mesh-clogging of the torch tip and a sampling cone by carbon C in a sample and a burst of a chamber even if oxygen gas of a quantity necessary to restrain sensitivity reduction is flowed, prevent mesh-clogging, and perform high sensitivity measurement by arranging a branch pipe in the inmost pipe of a torch, and introducing flow rate- controllable oxygen gas from its branch pipe. SOLUTION: When oxygen gas is supplied from an oxygen gas supply part 20, the oxygen gas is supplied from a branch pipe 22 arranged in the inmost pipe 5 of a torch 4 by passing through an oxygen gas supply pipe 19, and is mixed with a sample 18 by the inmost pipe 5. A flow rate of a nebulizer gas blown out of a nebulizer 13 is sufficiently more than the oxygen gas from the branch pipe 22, and since its flow flows in the tip direction of the torch 4 from a chamber 9, the oxygen gas flows in the direction of the torch 4 from the branch pipe 22, and does not flow to the chamber 9. Therefore, since the oxygen gas concentration in the chamber 9 is extremely reduced, even if a backfire is caused in the chamber 9, combustion is not caused, and it does not burst.

公开(公告)号：JPH0996624A

公开(公告)日：1997-04-08

申请号：JP25413695

申请日：1995-09-29

Applicant: SEIKO INSTR INC

Inventor： NAKAGAWA YOSHITOMO ,  HASEGAWA MASAO ,  ITOU TETSUMASA

IPC: G01N27/62 ,  H01J49/06 ,  H01J49/42

Abstract: PROBLEM TO BE SOLVED: To allow even an unskilled person to detect ions stably, by obtaining data of position and shape of ion beams entering a mass filter, and controlling voltage impressed to each electrode of an ion lens based on the data so that the beams enter the mass filter in an optimum state of the position and shape. SOLUTION: Scanning signals Dx, Dy fed to each scanning electrode 21a-21d are changed to move a position of a beam-scanning spot 24. Ions entering an entrance hole 23 are separated and detected by a mass filter 8, and counted at a data-processing part. When the counting at the data-processing part is synchronized with the signals Dx, Dy, data of a position and a shape of beams entering the filter 8 when the beams are not deflected by the signals Dx, Dy are obtained. The voltage of an electrode 7b of an ion lens 7 and then a coefficient (k) of a voltage to be impressed to a deflector 20 are sequentially changed. A value when a beam diameter becomes minimum, an asigmatism becomes minimum and a counting rate of peaks becomes maximum is set to be optimum. Accordingly, even an unskilled person can optimize easily.

公开(公告)号：JPH0862140A

公开(公告)日：1996-03-08

申请号：JP19878694

申请日：1994-08-23

Applicant: SEIKO INSTR INC

Inventor： HARADA YOICHI ,  ITOU TETSUMASA

IPC: G01N21/73

Abstract: PURPOSE: To obtain a method and apparatus for induction coupling plasma emission analysis in which a spectrometer can be selected depending on the concentration, properties, required sensitivity and accuracy of a sample or an element to be analyzed by a constitution wherein some of a plurality of spectrometers take in the light coming in a direction perpendicular to the generating direction of plasma and other spectrometers take in the light coming in the generating direction of plasma. CONSTITUTION: A spectrometer 3a receives the light coming in the generating direction (horizontal direction) of plasma 2 at the detection port 31a thereof and a spectrometer 3b receives the light coming in the direction perpendicular to the plasma generating direction reflected on a mirror 5 at the detection port 31b thereof thus spectraly analyzing the light of the plasma 2. When the concentration of a sample is low but a high sensitivity is required and the effect of coexisting substances can be neglected, light is taken in from the plasma generating direction using the spectrometer 3a. When the concentration of the sample is high and high sensitivity is not required but high accuracy is required light coming in the direction perpendicular to me plasma generating direction is taken in selectively using the spectrometer 3b.

公开(公告)号：JP2000258248A

公开(公告)日：2000-09-22

申请号：JP5857699

申请日：1999-03-05

Applicant: SEIKO INSTR INC

Inventor： ITOU TETSUMASA

IPC: G01J3/18 ,  G01N21/64

Abstract: PROBLEM TO BE SOLVED: To widen a wavelength range without loss of resolution of a quantometer using a two-dimensional array type detector. SOLUTION: In a quantometer comprising a light source 1 exciting a sample, an incidence optical system 2 condensing the emitted light, and a spectroscope spectrum-analyzing light gathered, the spectroscope is constituted of an incident slit 3, a diffraction grating 5 dispersing the light passed through the slit 3, and a two dimensional array type detector 7 detecting the light dispersed, and then a plurality of openings arranged in the two directions of a channel of the grating 5 and perpendicularity to the channel of the grating 5 so that the openings are not overlapped mutually in respective directions are placed at the slit 3.