Abstract:
A voltage boost device includes a first boost stage (4) and a second boost stage (5) connected to an input terminal and to an output terminal (10), the output terminal (10) supplying an output voltage higher than a supply voltage. The input terminal receives an operating condition signal (SB) having a first logic level representative of a standby operating state and a second logic level representative of an active operation state. The first boost stage (4) is enabled in presence of the second logic level of the operating condition signal (SB), and is disabled in presence of the first logic level of the operating condition signal (SB); the second boost stage (5) is controlled in a first operating condition in presence of the first logic level of the operating condition signal (SB), and is controlled in a second operating condition in presence of the second logic level of the operating condition signal (SB).
Abstract:
The invention relates to a method and a circuit for generating a pulse synchronization signal (ATD) for timing the memory cell read phase in semiconductor integrated electronic memory devices. The pulse signal (ATD) is generated upon detection of a change in logic state of at least one of a plurality of address input terminals of the memory cells. The method consists of duplicating the ATD signal into at least one pair of signals (ATD1,ATD2) and propagating such signals through separate parallel timing chains (6,9) at the ends of which the ATD signal is reinstated, the chains (6,9) being alternately active.