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    CORE FOR WINDING PLASTIC FILM
    13.
    发明专利
    CORE FOR WINDING PLASTIC FILM 失效

    公开(公告)号：JPS62222976A

    公开(公告)日：1987-09-30

    申请号：JP6484486

    申请日：1986-03-25

    Applicant: TORAY INDUSTRIES

    Inventor： OOTA TSUYOSHI ,  HANAMURA KEIICHI ,  INADA HIDEO ,  KIMATA IKUKAZU

    IPC: B65H75/18

    Abstract: PURPOSE:To make transcription from a core to a film and copying by dust restrainable, by forming a core surface into such one that maximum roughness Rt is less than the specified value and has regular unevenness whose center line mean roughness Ra is within the specified range. CONSTITUTION:A core surface is formed into such one that maximum roughness Rt is less than 10mu and has regular unevenness whose center line mean roughness Ra is within the range of 0.2-2mu. Here, when Rt>10mu or Ra>2mu is the case, it is undesirable because the unevenness itself on the core surface is transferred, and when Ra

    WINDING METHOD FOR THERMOPLASTIC RESIN FILM
    14.
    发明专利
    WINDING METHOD FOR THERMOPLASTIC RESIN FILM 失效

    公开(公告)号：JPS62222953A

    公开(公告)日：1987-09-30

    申请号：JP6484386

    申请日：1986-03-25

    Applicant: TORAY INDUSTRIES

    Inventor： OOTA TSUYOSHI ,  ASHIKI YOSHINAO ,  BANDO MASUMI

    IPC: B65H18/00

    Abstract: PURPOSE:To prevent creases on a product outer layer part from occurring without fail, by removing some length of a film from the product outer layer part according to mean roughness in a center line of a film surface after slit winding, at the time of winding the thermoplastic resin film. CONSTITUTION:When a thermoplastic resin film of less than 25mu in thickness is wound on a roll-form winding product 1 while cutting it in a strip form by a slitter, at least more than 30m of it is removed according to mean roughness Ra of a center line on a film surface after rolling the winding product. Thermoplastic resin is one that covers resin of polyester or the like, by way of example. As for film thickness, it applies to such a thin one that is liable to product creases of less than 25mu. In this connection, removal length of the film is 30m and a relationship between this removal length L[m] and the centerline mean roughness Ra[mu] is as follows. When (1) Ra>=0.022[mu] is the case, it comes to L>=30[m], and when (2) Ra 30{3.5(100Ra) -18.5(100Ra)+24.76}[m].

    PREPARATION OF POLYETHYLENE TEREPHTHALATE
    16.
    发明专利
    PREPARATION OF POLYETHYLENE TEREPHTHALATE 失效

    公开(公告)号：JPS56127626A

    公开(公告)日：1981-10-06

    申请号：JP5865080

    申请日：1980-05-06

    Applicant: TORAY INDUSTRIES

    Inventor： OOTA TSUYOSHI ,  TANAKA IWAO ,  MINAMI TOMOYUKI ,  MOGI MASAHIKO ,  FUJITA SABUROU ,  ICHIKAWA YOUEN

    IPC: C08L67/00 ,  C08G63/00 ,  C08G63/18 ,  C08G63/78 ,  C08L67/02

    Abstract: PURPOSE:To obtain polyethylene terephthalate suitable as a film for a magnetic tape, having improved slipperiness and surface conditions, by adding a soluble lithium compound, calcium compound and a phosphorus compound to the polycondensation step of the polyethylene terephthalate. CONSTITUTION:At a point of time from the completion of ester interchange reaction or esterification reaction of terephthalic acid (derivative) with ethylene glycol to an intrinsic viscosity of 0.2, preferably 0.01-0.25wt% glycol-soluble lithium compound, e.g. lithium chloride, and preferably 0.01-0.3wt% glycol-soluble calcium compound, at a molar ratio between the lithium compound and the calcium compound of preferably 1/1-10/1 are added to the polycondensation step. Furthermore, preferably 0.05-0.3wt% trivalent or pentavalent phosphorus compound, e.g. phosphoric acid, or both are added thereto to complete the polycondensation. Thus, the aimed polyethylene terephthalate is obtained.

    ELEMENT ANALYSIS
    19.
    发明专利
    ELEMENT ANALYSIS 失效

    公开(公告)号：JPS62217550A

    公开(公告)日：1987-09-25

    申请号：JP5929986

    申请日：1986-03-19

    Applicant: TORAY INDUSTRIES

    Inventor： YOSHIMURA TSUTOMU ,  OOTA TSUYOSHI

    IPC: G01N23/225 ,  H01J37/20 ,  H01J37/252

    Abstract: PURPOSE:To improve analysis accuracy by allowing an gap between a sample and the base of a recess and analyzing the elements contained in the sample in a state wherein an end-face of the sample placed on a carbon stand is positioned above the recess. CONSTITUTION:A sample 12 is placed on a carbon stand in a state being laid over a recess 13 of the carbon stand 11 while being supported in the state floating in the measurement region to be irradiated by electron rays 17 with a gap G more than a certain value from the carbon stand surface so that the electron rays on the carbon stand side of the electron rays radiated on the boundary portion of the sample end part and the carbon stand straight transmit downward with no immediate reflection or the like on the sample back portion. Accordingly, even when the electron rays are radiated on the sample end part with a certain radiation area, merely the electron rays required for measurement are radiated on the sample, generation of a noise due to the electron rays radiat ed on the other region is prevented so that the characteristic X-rays solely from the sample are distinctly detected as the images to be obtained by a scan ning type electron microscope. Thereby, the contained elements of the sample can be correctly analyzed.

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