IMAGING SYSTEMS
    13.
    发明申请
    IMAGING SYSTEMS 审中-公开
    成像系统

    公开(公告)号:WO2004032722A3

    公开(公告)日:2005-03-24

    申请号:PCT/US0332259

    申请日:2003-10-08

    CPC classification number: G01H9/002 G01B9/04 G01H9/00 G01J2009/0265

    Abstract: An imaging system includes: an object wavefront source (12) and an optical microscope objective (4) all positioned to direct an object wavefront onto an area of a vibrating subject (6) surface encompassed by a field of view of the microscope objective (4), and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material (XTAL); and a reference wavefront source (12) and at least one phase modulator (MOD) all positioned to direct a reference wavefront through the phase modulator (MOD) and to direct a modulated reference wavefront from the phase modulator (MOD) through the photorefractive material (XTAL) to interfere with the modulated object wavefront. The photorefractive material (XTAL) has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, (XTAL) providing a full-field, real-time image signal of the encompassed surface area (6).

    Abstract translation: 一种成像系统包括:物体波前源(12)和光学显微镜物镜(4),其全部定位成将物体波前引导到由显微镜物镜(4)的视场所包围的振动对象(6)表面的区域 ),并且通过光折射材料(XTAL)引导从包围的表面区域反射的被调制物体波前; 以及参考波前源(12)和至少一个相位调制器(MOD),所述至少一个相位调制器(MOD)全部定位成将参考波前引导通过相位调制器(MOD)并且通过光折射材料(MOD)将调制的参考波阵面从相位调制器 XTAL)干扰调制对象波前。 光折射材料(XTAL)具有组成和位置,使得调制对象波前和调制参考波阵面的干涉发生在光折射材料内,(XTAL)提供包围表面积的全场实时图像信号 6)。

    Acoustic imaging microscope
    17.
    发明授权
    Acoustic imaging microscope 失效
    声像显微镜

    公开(公告)号:US07123364B2

    公开(公告)日:2006-10-17

    申请号:US10267237

    申请日:2002-10-08

    CPC classification number: G01H9/002 G01B9/04 G01H9/00 G01J2009/0265

    Abstract: An imaging system includes: an object wavefront source and an optical microscope objective all positioned to direct an object wavefront onto an area of a vibrating subject surface encompassed by a field of view of the microscope objective, and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material; and a reference wavefront source and at least one phase modulator all positioned to direct a reference wavefront through the phase modulator and to direct a modulated reference wavefront from the phase modulator through the photorefractive material to interfere with the modulated object wavefront. The photorefractive material has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, providing a full-field, real-time image signal of the encompassed surface area.

    Abstract translation: 一种成像系统包括:物体波前源和光学显微镜物镜,其全部定位成将物体波前引导到由显微镜物镜的视场所包围的振动对象表面的区域上,并且引导从 通过光折射材料包围的表面积; 以及参考波前源和至少一个相位调制器,其全部定位成将参考波前引导通过相位调制器,并且通过光折射材料引导来自相位调制器的调制参考波阵面以干扰调制对象波前。 光折射材料具有组成和位置,使得调制对象波前和调制参考波阵面的干涉发生在光折射材料内,从而提供包围的表面区域的全场实时图像信号。

    Imaging systems
    18.
    发明申请
    Imaging systems 失效
    成像系统

    公开(公告)号:US20030128366A1

    公开(公告)日:2003-07-10

    申请号:US10267237

    申请日:2002-10-08

    CPC classification number: G01H9/002 G01B9/04 G01H9/00 G01J2009/0265

    Abstract: An imaging system includes: an object wavefront source and an optical microscope objective all positioned to direct an object wavefront onto an area of a vibrating subject surface encompassed by a field of view of the microscope objective, and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material; and a reference wavefront source and at least one phase modulator all positioned to direct a reference wavefront through the phase modulator and to direct a modulated reference wavefront from the phase modulator through the photorefractive material to interfere with the modulated object wavefront. The photorefractive material has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, providing a full-field, real-time image signal of the encompassed surface area.

    Abstract translation: 一种成像系统包括:物体波前源和光学显微镜物镜,其全部定位成将物体波前引导到由显微镜物镜的视场所包围的振动对象表面的区域上,并且引导从 通过光折射材料包围的表面积; 以及参考波前源和至少一个相位调制器,其全部定位成将参考波前引导通过相位调制器,并且通过光折射材料引导来自相位调制器的调制参考波阵面以干扰调制对象波前。 光折射材料具有组成和位置,使得调制对象波前和调制参考波阵面的干涉发生在光折射材料内,从而提供包围的表面区域的全场实时图像信号。

    Phase shifting interferometry with multiple accumulation
    20.
    发明授权
    Phase shifting interferometry with multiple accumulation 失效
    具有多次积分的相移干涉测量

    公开(公告)号:US07564568B2

    公开(公告)日:2009-07-21

    申请号:US11680968

    申请日:2007-03-01

    Abstract: An interferometer system is disclosed which is configured to combine measurement light with reference light to form an optical interference pattern, where the interferometer system includes a modulator configured to repetitively introduce a sequence of phase shifts between the measurement and reference light; and a camera system positioned to measure the optical interference pattern, where the camera system is configured to separately accumulate time-integrated images of the optical interference pattern corresponding to the different phase shifts in the sequence during the repetitions of the sequence.

    Abstract translation: 公开了一种干涉仪系统,其被配置为将测量光与参考光结合以形成光学干涉图案,其中所述干涉仪系统包括被配置为在所述测量参考光和所述参考光之间重复地引入相移序列的调制器; 以及定位成测量光学干涉图案的相机系统,其中相机系统被配置为在序列的重复期间分别累积对应于序列中的不同相移的光学干涉图案的时间集成图像。

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