公开(公告)号：WO2016142699A1

公开(公告)日：2016-09-15

申请号：PCT/GB2016/050630

申请日：2016-03-08

Applicant: RENISHAW PLC

Inventor： SMITH, Timothy ,  BLACKWELL-WHITEHEAD, Richard, John

IPC: G01N21/65 ,  G01J3/44 ,  G01J3/06 ,  G02B21/00

CPC classification number: G01J3/44 ,  G01J3/06 ,  G01J2003/064 ,  G01N21/65 ,  G01N2201/103 ,  G01N2201/1045 ,  G01N2201/1087 ,  G02B21/002

Abstract: This invention concerns a transmission Raman spectroscopy apparatus comprising a light source (101) for generating a light profile (110) on a sample (102), a photodetector (103) having at least one photodetector element (103a), collection optics (104) arranged to collect Raman scattered light transmitted through the sample (102) and direct the Raman light onto the at least one photodetector element (103a) and a support (109) for supporting the sample (102). The support (102) and light source (101) are arranged such that the light profile (110) can be moved relative to the sample (102) in order that the at least one photodetector element (103 a) receives Raman scattered light generated for different locations of the light profile (110) on the sample (102).

Abstract translation: 本发明涉及一种透射拉曼光谱仪，包括用于在样品（102）上产生光谱（110）的光源（101），具有至少一个光电检测器元件（103a）的光电检测器（103a），收集光学器件（104） 布置成收集透射通过样品（102）的拉曼散射光并将拉曼光引导到至少一个光电检测器元件（103a）上，以及用于支撑样品（102）的支撑件（109）。 支撑件（102）和光源（101）被布置成使得光轮廓（110）能够相对于样品（102）移动，以使得至少一个光电检测器元件（103a）接收生成的拉曼散射光， 样品（102）上的光谱（110）的不同位置。

公开(公告)号：WO2003102563A1

公开(公告)日：2003-12-11

申请号：PCT/JP2003/006805

申请日：2003-05-30

Applicant: 松下電器産業株式会社 ,  後藤 泰宏 ,  西脇 青児 ,  金馬 慶明

Inventor： 後藤 泰宏 ,  西脇 青児 ,  金馬 慶明

IPC: G01N21/95

CPC classification number: G11B7/00375 ,  G01N21/94 ,  G01N21/9506 ,  G01N2201/1045 ,  G11B19/04

Abstract: 異体検出装置において、光信号検出手段（１）は光スポットを所定方向に走査しながら被検査物体面上に光スポットを照射し、被検査物体面からの反射光を受け、反射光量に対応した光検出信号（ＨＦ）を生成する。異体検出手段（２ａ～２ｈ）は光検出信号（ＨＦ）から、被検査物体上に付着した異体の走査方向における始端部及び終端部に対応して現れる異体検出信号（Ｃ）を生成する。異体検出信号は、例えば、光検出信号（ＨＦ）と、光検出信号（ＨＦ）を所定時間遅延させた遅延信号（ＨＦ１）とを減算した差信号として求められる。異体判別手段（３）は異体検出信号（Ｃ）から異体が存在する領域を示す異体判別信号（Ｈ）を生成する。

Abstract translation: 异物检测器包括光信号检测装置（1），异物检测装置（2a至2h）和异物判断装置（3）。 光信号检测装置（1）在沿着预定方向扫描光点的同时在待检查物体的表面上施加光点，接收从物体的表面反射的光，并产生光检测信号（HF） 对应于反射的光量。 异物检测装置（2a至2h）从光检测信号（HF）产生与扫描方向上的第一和最后部分相对应的异物检测信号（C）。 异物信号被确定为表示通过将光检测信号（HF）延迟预定时间而产生的光检测信号（HF）和延迟信号（HF1）之间的差的信号。 异物判断装置根据异物检测信号（C）生成表示异物存在的区域的异物判定信号（H）。

公开(公告)号：US11835525B2

公开(公告)日：2023-12-05

申请号：US16840220

申请日：2020-04-03

Applicant: MIFTEK CORPORATION

Inventor： Masanobu Yamamoto ,  J. Paul Robinson

IPC: G01N33/58 ,  B01L3/00 ,  G01N35/00 ,  G01N15/14 ,  G01N33/49 ,  G01N21/64

CPC classification number: G01N33/582 ,  B01L3/00 ,  G01N15/1427 ,  G01N15/1429 ,  G01N15/1434 ,  G01N33/4915 ,  G01N35/00069 ,  G01N15/1456 ,  G01N15/1459 ,  G01N15/1484 ,  G01N21/645 ,  G01N2035/00881 ,  G01N2201/1045

Abstract: A measurement system includes a system for causing relative motion between a sample and an irradiation spot. The sample includes fluorescent markers having respective wavelengths. A gating system provides a gating signal based at least in part on resultant light substantially at an irradiation wavelength. A detection system detects fluorescent light from the irradiated markers and provides detection signals representing the fluorescent light detected concurrently with a gate-open signal. In some examples, the detection system detects fluorescent light at multiple wavelengths and provides respective detection signals. A spectral discriminator arranged optically between the sample and the detection system receives the fluorescent light from the sample and provides respective fluorescent light at the wavelengths to the detection system. A flow cytometer can spectrally disperse resultant fluorescent light and measure the wavelengths separately. Light from a sample disposed over a reflective phase grating can be dispersed, measured, and gated.

公开(公告)号：US20160069794A1

公开(公告)日：2016-03-10

申请号：US14846934

申请日：2015-09-07

Applicant: University of Vienna

Inventor： Alipasha Vaziri ,  Robert Prevedel

IPC: G01N21/25 ,  G01N33/483

CPC classification number: G01N33/4833 ,  A61B5/4064 ,  G01J3/4406 ,  G01N21/636 ,  G01N21/6458 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2201/0635 ,  G01N2201/0697 ,  G01N2201/1045 ,  G02B21/02 ,  G02B21/16 ,  G02B2207/114

Abstract: Devices and methods for recording dynamics of cellular and/or biochemical processes, including a device including one or more dispersive elements configured to receive a pulsed laser beam with a spectrum of different wavelengths and disperse the spectrum of the pulsed laser beam; and one or more first elements configured to receive the dispersed spectrum of the pulsed laser beam, and generate a multiphoton excitation area in a biological sample by re-overlapping in time and space the dispersed spectrum of the pulsed laser beam on an area in the biological sample, wherein the device is configured to record at high speed changes of cellular and biochemical processes of a population of cells of the biological sample based on generation of the multiphoton excitation area in the biological sample.

Abstract translation: 用于记录细胞和/或生物化学过程的动力学的装置和方法，包括包括一个或多个分散元件的装置，其被配置为接收具有不同波长的光谱的脉冲激光束并分散脉冲激光束的光谱; 以及被配置为接收脉冲激光束的分散光谱的一个或多个第一元件，并且通过在脉冲激光束的时间和空间上重新重叠生物样品中的多光子激发区域，使脉冲激光束的分散光谱在生物样品中的一个区域上 样品，其中所述装置被配置为基于所述生物样品中的多光子激发区域的产生，高速地记录所述生物样品的细胞群的细胞和生化过程的变化。

公开(公告)号：US20150041658A1

公开(公告)日：2015-02-12

申请号：US14385033

申请日：2012-04-10

Applicant: Hyang-Sook Chun ,  Sung-Wook Choi ,  Hyun-Joo Chang ,  Na-Ri Lee ,  Gyeong-Sik Ok

Inventor： Hyang-Sook Chun ,  Sung-Wook Choi ,  Hyun-Joo Chang ,  Na-Ri Lee ,  Gyeong-Sik Ok

IPC: G01N21/35 ,  G02B3/00

CPC classification number: G01N21/3581 ,  G01N21/8806 ,  G01N21/94 ,  G01N2201/06113 ,  G01N2201/1045 ,  G01N2201/105 ,  G02B3/00 ,  H01Q15/08

Abstract: An object inspection apparatus includes a terahertz wave supplying unit for generating a terahertz wave and moving a path of the terahertz wave according to time so that the terahertz wave is supplied to an object to be inspected, a focusing lens located between the terahertz wave supplying unit and the object to be inspected to focus the terahertz wave supplied by the terahertz wave supplying unit, a rotating plate having a plate shape and including a plurality of the focusing lenses with different distances from the center thereof, the rotating plate rotating in the circumferential direction so that one of the focusing lenses is located at a path of the terahertz wave according to the path movement of the terahertz wave, and a terahertz wave detecting unit for collecting and detecting a terahertz wave incident to the object to be inspected.

Abstract translation: 物体检查装置包括：太赫兹波提供单元，用于产生太赫兹波，并根据时间移动太赫兹波的路径，使得太赫兹波被提供给被检测物体;聚焦透镜，位于太赫波提供单元 以及要被检查的物体聚焦太赫兹波供给单元提供的太赫兹波，具有板形的旋转板，并且包括多个离其中心距离不同的聚焦透镜，旋转板沿圆周方向旋转 使得一个聚焦透镜根据太赫兹波的路径移动位于太赫兹波的路径，以及用于收集和检测入射到待检查对象的太赫兹波的太赫兹波检测单元。

公开(公告)号：US07595874B1

公开(公告)日：2009-09-29

申请号：US11672794

申请日：2007-02-08

Applicant: Vladimir M. Pelekhaty ,  Anatoliy Kachurin ,  William Warren ,  Kenneth Church ,  Heather Fahlenkamp ,  Russell Higbee

Inventor： Vladimir M. Pelekhaty ,  Anatoliy Kachurin ,  William Warren ,  Kenneth Church ,  Heather Fahlenkamp ,  Russell Higbee

IPC: G01J3/30

CPC classification number: G01N21/6458 ,  G01N1/36 ,  G01N15/1434 ,  G01N2201/104 ,  G01N2201/1045 ,  G01N2201/112 ,  G02B21/26 ,  G02B21/365

Abstract: Detection of a rarely occurring event within one or more biological samples includes (a) processing each biological sample to provide a gellable liquid solution comprising concentrated biological sample and a flourochrome designed to associate with a rarely occurring event within the concentrated biological sample; (b) depositing the solution in a layer on a surface of a slide; and (c) scanning the solution on the slide with energy adapted to cause fluorescence of the flourochrome to detect potential instances of the rarely occurring event within the concentrated biological sample in the solution.

Abstract translation: 在一个或多个生物样品中检测到很少发生的事件包括（a）处理每个生物样品以提供包含浓缩的生物样品和设计成与浓缩的生物样品中罕见事件相关的荧光染料的可胶凝液体溶液; （b）将溶液沉积在载玻片表面上的层中; 和（c）用适于引起荧光色素的能量扫描载玻片上的溶液以检测溶液中浓缩的生物样品内很少发生的事件的潜在情况。

公开(公告)号：US5377001A

公开(公告)日：1994-12-27

申请号：US913236

申请日：1992-07-14

Applicant: Cosmas Malin ,  Edgar F. Steigmeier ,  Thomas Nesensohn ,  Harry L. Sawatzki ,  Heinrich Auderset

Inventor： Cosmas Malin ,  Edgar F. Steigmeier ,  Thomas Nesensohn ,  Harry L. Sawatzki ,  Heinrich Auderset

IPC: G01M11/02 ,  G01N21/89 ,  G01N21/93 ,  G01N21/95 ,  G01N21/00

CPC classification number: G01M11/0278 ,  G01N21/9501 ,  G01N2021/8822 ,  G01N2021/8867 ,  G01N2021/8907 ,  G01N21/93 ,  G01N21/9503 ,  G01N2201/1045

Abstract: This apparatus permits the non-destructive examination of entire surfaces for defects and contamination, and can detect microscopically small dot-shaped and linear defects and extremely fine macroscopic non-homogeneous areas. For this purpose, an astigmatic lens system (5) is placed in the optical path between light source (2) and objective (9) which produces a cigar-shaped intermediate image (31), in which the feed offset in scanning the surface (10) depends on the intermediate image (31) and is equal to the length of the intermediate image (31) projected upon this surface (10). A dark-field stop assembly (18) with an adjustable dark-field deflection system (8) is placed in the optical path between the lens system (5) and the objective (9), which projects the light beam (1) after deflection exactly centered at right angles through the objective (9) upon the surface of the object (10). The light reflected by the surface (10) and collected by the objective (9) is projected to a photo detector. An electronic analysis system (21) breaks down the amplified output signals from the photo detector (19) into measured values due to dot-shaped, linear, and planiform defects. The electronic analysis system (21) is connected via a computer unit (22) to peripheral equipment (23, 24, 25) which permits the representation of all the measured values obtained in a measuring cycle.

Abstract translation: 该装置允许对整个表面进行无损检测以用于缺陷和污染，并且可以检测微小的点状和线性缺陷以及极细的宏观非均匀区域。 为此目的，将散光透镜系统（5）放置在光源（2）和物镜（9）之间的光路中，产生一个雪茄形中间图像（31），其中扫描表面的进给偏移 10）取决于中间图像（31）并且等于投影在该表面（10）上的中间图像（31）的长度。 具有可调暗场偏转系统（8）的暗场停止组件（18）被放置在透镜系统（5）和物镜（9）之间的光路中，其在偏转之后突出光束（1） 在物体（10）的表面上通过物镜（9）以正交的角度准确地居中。 由表面（10）反射并由物镜（9）收集的光被投射到光电探测器。 电子分析系统（21）由于点状，线性和平面状缺陷将放大的从光检测器（19）输出的信号分解为测量值。 电子分析系统（21）经由计算机单元（22）连接到外围设备（23,24,25），其允许表示在测量周期中获得的所有测量值。

公开(公告)号：US4822165A

公开(公告)日：1989-04-18

申请号：US062182

申请日：1987-06-15

Applicant: Harald Schmalfuss ,  Friedel Sinsel ,  Reinhold Bolz

Inventor： Harald Schmalfuss ,  Friedel Sinsel ,  Reinhold Bolz

IPC: G01M11/00 ,  G01N21/88 ,  G01N21/95 ,  G01N21/958 ,  G02B26/10

CPC classification number: G01N21/8806 ,  G01N2021/9511 ,  G01N2201/1045

Abstract: A device for illuminating components of transparent material by dot-scanning so that the components may be tested for surface irregularities and occlusions which comprises a component rotatably mounted so that the component may be rotated on its axis at a predetermined speed, a light source for generating a parallel light beam for illuminating the component, and a mechanism for periodically linearly deflecting the light beam at a frequency greater than the predetermined rotational speed of the component. The periodically linearly deflecting mechanism is disposed in the path of the light beam between the parallel light beam generating source and the component. The device also includes a focusing lens for focusing the light beam in a testing plane, where the focusing lens is disposed between the periodically linearly deflecting mechanism and the component at a location whereby the focal point of the focusing lens is at the edge of the periodically linearly deflecting mechanism. The device further includes an adjustable tilting mirror disposed between the focusing lens and the component for deflecting the light beam onto the component, whereby the dot-scanning light beam can then be detected by a testing device.

Abstract translation: 一种用于通过点阵扫描来照亮透明材料的部件的装置，使得可以测试这些部件的表面不规则性和遮挡物，其包括可旋转地安装的部件，使得部件可以以其预定速度在其轴线上旋转，用于产生光源 用于照亮部件的平行光束，以及用于以大于部件的预定旋转速度的频率周期性地线性偏转光束的机构。 周期性线性偏转机构设置在平行光束产生源和部件之间的光束的路径中。 该装置还包括用于将光束聚焦在测试平面中的聚焦透镜，其中聚焦透镜设置在周期性线性偏转机构和位置之间的部件处，由此聚焦透镜的焦点位于周期性 线性偏转机制。 该装置还包括设置在聚焦透镜和部件之间的可调节倾斜镜，用于将光束偏转到部件上，由此可以由测试装置检测点扫描光束。

公开(公告)号：US4747684A

公开(公告)日：1988-05-31

申请号：US89893

申请日：1987-08-27

Applicant: Sidney Weiser

Inventor： Sidney Weiser

IPC: G01N21/55 ,  G01N21/01 ,  G01N21/47

CPC classification number: G01N21/55 ,  G01N2201/1045 ,  G01N2201/1087

Abstract: A specific small area of a crystal sample is scanned by a laser beam which rotates about an axis substantially perpendicular to the sample surface such that the intersection of the beam with a plane above and parallel to the surface describes a true spiral or a stepwise spiral pattern. The laser beam is reflected different amounts for different beam positions to produce a reflectance pattern indicative of crystallographic orientation.

Abstract translation: 晶体样品的特定小区域被激光束扫描，激光束围绕基本上垂直于样品表面的轴线旋转，使得光束与平面在平面上方并且平行于表面的交叉描述了真正的螺旋或逐步螺旋图案 。 对于不同的光束位置，激光束被反射不同的量以产生指示晶体取向的反射率图案。

公开(公告)号：EP1553406B1

公开(公告)日：2013-02-13

申请号：EP04028745.0

申请日：2004-12-03

Applicant: Candela Instruments

Inventor： Meeks, Steven W.

IPC: G01N21/47 ,  G01N21/21 ,  G01N21/95 ,  G01B11/06 ,  G01B11/30

CPC classification number: G01N21/9506 ,  G01B11/0616 ,  G01B11/0641 ,  G01B11/065 ,  G01B11/303 ,  G01B11/306 ,  G01N21/21 ,  G01N21/47 ,  G01N21/9501 ,  G01N21/958 ,  G01N2021/8427 ,  G01N2021/8841 ,  G01N2201/103 ,  G01N2201/104 ,  G01N2201/1045 ,  H01L22/12 ,  H01L2924/0002 ,  H01L2924/00