Terahertz wave measuring apparatus and terahertz wave measuring method
    191.
    发明专利
    Terahertz wave measuring apparatus and terahertz wave measuring method 有权
    TERAHERTZ波测量装置和TERAHERTZ波测量方法

    公开(公告)号:JP2012002793A

    公开(公告)日:2012-01-05

    申请号:JP2010175824

    申请日:2010-08-05

    Inventor: ITSUJI TAKEAKI

    CPC classification number: G01N21/3586 G01J3/42 G01N2201/06113 G01N2201/066

    Abstract: PROBLEM TO BE SOLVED: To provide an apparatus and a method for obtaining a time waveform of a terahertz wave which can suppress, in a measurement of the terahertz wave, a signal component with low relevance to the terahertz wave.SOLUTION: In an apparatus and a method which are for obtaining a time waveform of a terahertz wave, a first time waveform is obtained by driving a delay optical unit 103 with a first speed pattern, and a second time waveform is obtained by driving the delay optical unit 103 with a second speed pattern different from the first speed pattern. A final time waveform is then obtained by averaging the first time waveform and the second time waveform.

    Abstract translation: 解决的问题:提供一种用于获得太赫兹波的时间波形的装置和方法,该太赫兹波可以在太赫兹波的测量中抑制与太赫兹波相关性低的信号分量。 解决方案:在用于获得太赫兹波的时间波形的装置和方法中,通过以第一速度模式驱动延迟光学单元103获得第一时间波形,并且通过以下方式获得第二时间波形: 以与第一速度模式不同的第二速度模式驱动延迟光学单元103。 然后通过对第一时间波形和第二时间波形进行平均来获得最终时间波形。 版权所有(C)2012,JPO&INPIT

    Light absorption measuring method, light absorption measuring instrument and optical waveguide usable in them
    193.
    发明专利
    Light absorption measuring method, light absorption measuring instrument and optical waveguide usable in them 有权
    光吸收测量方法,光吸收测量仪器和可用于其中的光波导

    公开(公告)号:JP2006064405A

    公开(公告)日:2006-03-09

    申请号:JP2004244032

    申请日:2004-08-24

    Inventor: TAKAHASHI KOZO

    CPC classification number: G01N21/552 G01N2201/066 G01N2201/08

    Abstract: PROBLEM TO BE SOLVED: To provide a light absorption measuring method which enables the minimization of a necessary amount of a sample to be measured and capable of arbitrarily setting the number of times of total reflections by an optical waveguide minimum in size, a light absorption measuring instrument and the optical waveguide usable in them. SOLUTION: In the light absorption measuring method, the light absorbing intensity or light absorbing spectrum in the sample is measured from emitted light using the optical waveguide having one reflecting surface, equipped with a plurality of paired incident and emitting points crossing the reflecting surface at a right angle and symmetrically arranged so as to hold the axial line passing a scheduled one or plurality of reflection points on the reflecting surface, the light entering from the incident point is totally reflected on the sample provided so as to be overlapped with the scheduled reflecting point of the reflecting surface to be emitted from the emitting point present at the position symmetric to the incident point, beams of the emitted light from certain paired emitting points are re-incident at least once from the other paired incident points and the light absorbing intensity or light absorbing spectrum from the emitted light from the final predetermined emitting point is measured. COPYRIGHT: (C)2006,JPO&NCIPI

    Abstract translation: 要解决的问题:提供一种光吸收测量方法,其能够使待测量的样本的必需量最小化,并且能够任意地设定光波导的总反射次数最小的尺寸, 光吸收测量仪器和可用于其中的光波导。 解决方案:在光吸收测量方法中,使用具有一个反射表面的光波导从发射光测量样品中的光吸收强度或光吸收光谱,该光波导配备有多个成对的入射和发射点穿过反射 表面以直角对称地对称地设置,以将轴线保持在反射表面上经过预定的一个或多个反射点,从入射点入射的光在被提供的样品上被全反射以与其重叠 从位于与入射点对称的位置处的发射点发射的反射表面的预定反射点,来自某些成对发射点的发射光束从另一个成对入射点再次入射至少一次,并且光 从最终预定发射点i的发射光吸收强度或光吸收光谱 测量。 版权所有(C)2006,JPO&NCIPI

    OPTICAL INSPECTION SYSTEM AND METHOD INCLUDING ACCOUNTING FOR VARIATIONS OF OPTICAL PATH LENGTH WITHIN A SAMPLE
    195.
    发明公开
    OPTICAL INSPECTION SYSTEM AND METHOD INCLUDING ACCOUNTING FOR VARIATIONS OF OPTICAL PATH LENGTH WITHIN A SAMPLE 审中-公开
    光学检测系统和方法,包括考虑样品内光程长度的变化

    公开(公告)号:EP3213053A1

    公开(公告)日:2017-09-06

    申请号:EP15825998.6

    申请日:2015-12-22

    Applicant: Apple Inc.

    Abstract: An illuminator/collector assembly can deliver incident light to a sample and collect return light returning from the sample. A sensor can measure ray intensities as a function of ray position and ray angle for the collected return light. A ray selector can select a first subset of rays from the collected return light at the sensor that meet a first selection criterion. In some examples, the ray selector can aggregate ray intensities into bins, each bin corresponding to rays in the collected return light that traverse within the sample an estimated optical path length within a respective range of optical path lengths. A characterizer can determine a physical property of the sample, such as absorptivity, based on the ray intensities, ray positions, and ray angles for the first subset of rays. Accounting for variations in optical path length traversed within the sample can improve accuracy.

    Abstract translation: 照明器/收集器组件(104)可以将入射光(106)传送到样本(102)并且收集从样本(102)返回的返回光(112)。 传感器(114)可以测量作为收集的返回光(112)的射线位置和射线角度的函数的射线强度。 光线选择器可以选择来自传感器(114)处收集的符合第一选择标准的返回光(112)的第一射线子集。 在一些示例中,光线选择器可以将光线强度聚合成箱,每个箱对应于在光学路径长度的相应范围内的估计光学路径长度内在收集的返回光(112)内穿过样本(102)内的光线。 表征器可以基于射线强度,射线位置以及射线第一子集的射线角度来确定样本(102)的物理属性,例如吸收率。 考虑样本内穿过的光程长度变化可以提高精度。

    COUNTING COMPARTMENT AND METHOD FOR SAMPLE ANALYSIS
    196.
    发明公开
    COUNTING COMPARTMENT AND METHOD FOR SAMPLE ANALYSIS 审中-公开
    计数分区和样本分析方法

    公开(公告)号:EP3199937A1

    公开(公告)日:2017-08-02

    申请号:EP16153189.2

    申请日:2016-01-28

    Applicant: Minitüb GmbH

    Abstract: The present invention relates to a counting compartment or counting chamber for analyzing samples comprising cells or particles, said counting compartment or chamber comprising at least two different depths provided by the bottom and top measurement window. The present invention further relates to a counting device comprising the counting compartment or counting chamber of the present invention. The present invention further relates to a method for analyzing samples comprising cells or particles, comprising the step of determining the difference between the value measured at the at least two different depths of a counting compartment or counting chamber. The present invention further relates to a method for analyzing samples comprising cells or particles, comprising the step of controlling the depth of a counting compartment.

    Abstract translation: 本发明涉及用于分析包含细胞或颗粒的样本的计数室或计数室,所述计数室或室包括由底部和顶部测量窗提供的至少两个不同深度。 本发明还涉及包括本发明的计数室或计数室的计数装置。 本发明进一步涉及分析包含细胞或颗粒的样品的方法,包括确定在计数室或计数室的至少两个不同深度处测量的值之间的差异的步骤。 本发明进一步涉及分析包含细胞或颗粒的样品的方法,包括控制计数隔室深度的步骤。

    SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT AND EVAPORATION RATE MEASUREMENTS
    198.
    发明公开
    SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT AND EVAPORATION RATE MEASUREMENTS 审中-公开
    系统和方法实现泪膜结构测量和扩展率测试

    公开(公告)号:EP3113668A2

    公开(公告)日:2017-01-11

    申请号:EP15753474.4

    申请日:2015-03-04

    Abstract: Apparatus and methods are described for performing structure measurement on a tear film of an eye of a subject. At least a portion of a surface of the tear film is illuminated using a broadband light source. A spectrum of light of the broadband light that is reflected from at least one point of the tear film is measured, using a spectrometer. Color information for a plurality of points of the tear film is obtained, by imaging a field of view of the tear film using a color camera. Using a processing unit, data from the color camera and data from the spectrometer that are indicative of characteristics of the tear film are received, and based upon a combination of the data received from the color camera and the data received from the spectrometer, an output is generated that is indicative of a structure of the tear film.

    Abstract translation: 一种系统和方法被描述用于执行泪膜结构的测量。 宽带光源照亮撕裂电影。 从撕裂成膜中的至少一个点的反射光的光谱仪的措施respectivement光谱。 彩色相机执行视图撕裂电影的成像的大视场,从而获得用于撕裂由彩色摄像机薄膜成像的所有点的颜色信息。 处理单元校准所述照相机在由光谱仪测量所以没有在点由照相机获得的颜色光谱仪在相同点处的颜色相匹配的点。 该处理单元确定的地雷,从校准的相机的respectivement点的颜色,撕裂的一个或多个层的厚度的膜在respectivement点。 其他的应用是如此描述。

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