Abstract:
The photosensitivity of a photomultiplier dynode to white light or infrared radiation is greatly reduced by coating the dynode with a layer of an alkali halide material having good secondary electron emission characteristics. A method of applying the coating to the dynode is also described.
Abstract:
L'invention concerne un dispositif semiconducteur capable d'émettre des électrons dans le vide par une de ses surfaces, remarquable en ce qu'il comporte une couche semiconductrice dite active (3), affleurant la surface émettrice dont le dopage croît lorsque la distance à ladite surface émettrice diminue. Application: photocathodes, dynodes.
Abstract:
The present invention improves sensitivity of the ultraviolet band of a photoelectric surface. A photoelectric surface 1 includes a window material 2 that transmits ultraviolet rays, a conductive film 3 that is formed on the window material 2 and has conductivity, an intermediate film 4 that is formed on the conductive film 3 and is formed of MgF 2 , and a photoelectric conversion film 6 that is formed on the intermediate film 4 and is formed of CsTe. Since the photoelectric surface 1 includes the intermediate film 4 formed of MgF 2 , the sensitivity of the ultraviolet band is improved.
Abstract:
An electron beam source includes a cathode (200) having an electron emission surface including an active area (208) for emission of electrons and a cathode shield assembly (220) including a conductive shield disposed in proximity to the electron emission surface of the cathode. The shield has an opening (222) aligned with the active area. The electron beam source further includes a device for stimulating emission of electrons from the active area of the cathode (200), electron optics for forming the electrons into an electron beam and a vacuum enclosure for maintaining the cathode at high vacuum. The cathode (200) may be a negative electron affinity photocathode formed on a light-transmissive substrate (202). The shield protects non-emitting areas of the emission surface from contamination and inhibits cathode materials from contaminating components of the electron beam source. The cathode (200) may be moved relative to the opening (222) in the shield so as to align a new active area with the opening. Getter materials and sources of activation material may be incorporated into the shield assembly.
Abstract:
A phototube (10) comprises a photocathode (30) having photoelectric surface. In a sealed enclosure (20) whose inside is vacuum, the photoelectric cathode (30) and an anode (40) are opposed to each other. Voltages are applied to them through lead pins (51 and 52). The photocathode (30) includes a metallic support plate (31) to which is secured a sapphire plate (32) on which are formed an a-AlN matching layer (33), a p-type GaN active layer (34), and a CsO surface layer (35). The active layer (34) has a dopant concentration that increases from 1 x 10 cm in the surface up to 5 x 10 cm at a depth of 100 nm. The dopant concentration only at the deepest region over a thickness of several nanometers is 1 x 10 cm . The crystallinity of the active layer (34) is improved, and the diffusion length is increased, improving the quantum efficiency and sharp-cut property.
Abstract:
A photocathode comprising a laminate (10) composed of a UV glass substrate (3) and, successively formed thereof, an SiO2 layer (15), a GaAlN layer (17a), a III - V nitride semiconductor layer (18) and a Cs-O layer (19). The UV glass substrate (3) that absorbs infrared rays can be heat-treated at a high speed by heating with light and can transmit ultraviolet rays, making it possible to introduce ultraviolet rays into the III - V nitride semiconductor layer (18) that effects the photo-electric conversion.
Abstract:
An electron source includes a negative electron affinity photocathode (10) on a light-transmissive substrate (12) and a light beam generator (50) for directing a light beam through the substrate at the photocathode for exciting electrons into the conduction band. The photocathode has at least one active area for emission of electrons with dimensions of less than about two micrometers. The electron source further includes electron optics (66) for forming the electrons into an electron beam and a vacuum enclosure (14) for maintaining the photocathode at high vacuum. In one embodiment, the active emission area of the photocathode is defined by the light beam that is incident on the photocathode. In another embodiment, the active emission area of the photocathode is predefined by surface modification of the photocathode. The source provides very high brightness from an ultra-small active emission area of the photocathode.
Abstract:
An improved transferred electron III-V semiconductor photocathode (12) comprising an aluminum contact pad (40) and an aluminum grid (42) structure that improves quantum efficiency by removing a major obstacle to electrons escaping into the vacuum and controls dark spot blooming caused by overly bright photon emission sources.