公开(公告)号：JP2007248428A

公开(公告)日：2007-09-27

申请号：JP2006076375

申请日：2006-03-20

Applicant: Fujifilm Corp ,  富士フイルム株式会社

Inventor： MURAISHI KATSUAKI ,  SHIMIZU HITOSHI

IPC: G01N21/27 ,  G01N21/05 ,  G01N21/41

CPC classification number: G01N21/553 ,  G01N21/05 ,  G01N21/11 ,  G01N2021/0346 ,  G01N2201/021

Abstract: PROBLEM TO BE SOLVED: To provide a sensor unit for surely preventing displacement in measurement, and a total reflection prism. SOLUTION: This sensor unit 10 comprises the total reflection prism 20 formed substantially into a trapezoidal columnar shape and a flow path member 30 mounted on the prism 20. On bottom parts of both side faces of a prism body of the prism 20, engagement parts 28 are provided each formed so as to project like a step. When the sensor unit 10 is mounted on a measurement stage 52, a hold part 60 provided on a measuring instrument holds the prism 20 so as to press it on a mounting surface 52a with the respective presser members 61 caused to engage with the respective engagement parts 28. COPYRIGHT: (C)2007,JPO&INPIT

Abstract translation: 要解决的问题：提供一种可靠地防止测量位移的传感器单元和全反射棱镜。 解决方案：该传感器单元10包括基本上形成为梯形柱状的全反射棱镜20和安装在棱镜20上的流路构件30.在棱镜20的棱镜体的两个侧面的底部， 设置接合部28，每个接合部28被形成为像台阶一样突出。 当传感器单元10安装在测量台52上时，设置在测量仪器上的保持部分60保持棱镜20，以将其按压在安装表面52a上，使各压紧构件61与相应的接合部分 28.版权所有（C）2007，JPO＆INPIT

公开(公告)号：JP3931111B2

公开(公告)日：2007-06-13

申请号：JP2002157941

申请日：2002-05-30

Applicant: オリンパス株式会社

Inventor： 守 安田 ,  暢夫 藤崎

IPC: G01N21/84 ,  G01M11/00 ,  G01N21/95 ,  G01N21/958 ,  G02F1/13 ,  H01L21/683

CPC classification number: G01N21/958 ,  G01N2021/9513 ,  G01N2201/021

公开(公告)号：US12038375B2

公开(公告)日：2024-07-16

申请号：US17830327

申请日：2022-06-01

Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC

Inventor： Peter Steinberg

IPC: G01N21/35 ,  G01J3/45 ,  G02B21/00

CPC classification number: G01N21/35 ,  G01J3/45 ,  G02B21/0036 ,  G01N2021/3595 ,  G01N2201/021

Abstract: An embodiment of a microscope system is described that comprises a sample stage configured to position a sample; and a spectrometer comprising an interferometer configure to provide a light beam to the sample stage and one or more detectors configured to detect light spectra in response to the light beam, wherein the spectrometer sends a notification to the sample stage after a scan comprising an acceptable measure of quality has been acquired from the detected light spectra at a first location, and the sample stage is further configured to count the notifications and initiate movement of the sample stage to a second location when a count value reaches a pre-determined number.

公开(公告)号：US11953476B2

公开(公告)日：2024-04-09

申请号：US17251570

申请日：2018-11-19

Applicant: POLYMER CHARACTERIZATION, S.A.

Inventor： Alberto Ortin Sebastian ,  Benjamin Monrabal Bas

IPC: G01N30/74 ,  G01N21/41 ,  G01N21/85 ,  G01N30/02 ,  G01N30/16

CPC classification number: G01N30/74 ,  G01N21/4133 ,  G01N21/85 ,  G01N30/16 ,  G01N2021/4153 ,  G01N2030/027 ,  G01N2201/021

Abstract: A deflection-type refractometer with extended measurement range having a light source generating a beam of light; a measuring cell with a sample chamber receiving a sample liquid; an optical sensor mounted on a movable platform for detecting the deflected beam of light; a driving unit configured to move the platform; a distance measurement unit for monitoring the displacement of the platform; a control unit configured to calculate the deflection of the beam of light based on the displacement of the platform and an output signal of the optical sensor to obtain a refractive index measure of the sample liquid using the calculated deflection.

公开(公告)号：US20240071795A1

公开(公告)日：2024-02-29

申请号：US18295802

申请日：2023-04-04

Applicant: Mitsubishi Electric Corporation

Inventor： Motoki IINUMA

IPC: H01L21/67 ,  G01N21/95 ,  G06T7/00 ,  H04N23/56

CPC classification number: H01L21/67288 ,  G01N21/9501 ,  G06T7/0004 ,  H04N23/56 ,  G01N2201/021 ,  G01N2201/062 ,  G01N2201/0636 ,  G06T2207/30148

Abstract: A semiconductor inspection apparatus of this disclosure is a semiconductor inspection apparatus that performs a visual inspection of, as an inspection target, a semiconductor module on a surface of which a plurality of semiconductor devices connected to one another by a wire is mounted. This semiconductor inspection apparatus includes a first light source that is arranged in a first casing, emits light in a specific wavelength band or white light, and constitutes a part of a coaxial vertical illumination system for the inspection target, and a second light source that obliquely irradiates the inspection target with light in at least one wavelength range among a red band, a blue band, and an infrared range from a light source that is arranged in a ring shape around an optical axis of incident light of the coaxial vertical illumination system.

公开(公告)号：US11914282B2

公开(公告)日：2024-02-27

申请号：US17509454

申请日：2021-10-25

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Donggun Lee

IPC: G03F1/24 ,  G01N21/95 ,  G03F7/00

CPC classification number: G03F1/24 ,  G01N21/9501 ,  G03F7/7085 ,  G03F7/70483 ,  G01N2201/021 ,  G01N2201/0636 ,  G01N2201/06113

Abstract: A system of measuring an image of a pattern in a scanning type EUV mask may include a high-power laser output unit including a flat mirror and a spherical mirror, which are used to focus a high-power femto-second laser on a gas cell; a coherent EUV light generating portion generating a coherent EUV light; a pin-hole, a graphene filter, and a zirconium (Zr) filter; a stage; an x-ray spherical mirror configured to focus a coherent EUV light; a zone-plate lens placed between the stage and the x-ray spherical mirror; an x-ray flat mirror placed between the zone-plate lens and the x-ray spherical mirror; an order sorting aperture (OSA) placed on the stage and configured to transmit only a first-order diffraction light of the focused coherent EUV light; and a detector portion placed on the stage.

公开(公告)号：US20240044792A1

公开(公告)日：2024-02-08

申请号：US18379312

申请日：2023-10-12

Applicant: ASM IP Holding B.V.

Inventor： Shiva K.T. Rajavelu Muralidhar ,  Youness Alvandi-Tabrizi ,  John DiSanto ,  Sam Kim

IPC: G01N21/59 ,  G01N21/958 ,  G01B11/02 ,  G01N33/207

CPC classification number: G01N21/59 ,  G01N21/958 ,  G01B11/028 ,  G01N33/207 ,  G01N2201/021

Abstract: Methods and apparatus for measuring light intensity are disclosed. The methods and apparatus can be used to verify an article, such as a reaction chamber. Exemplary apparatus include a first arm, a light source coupled to the first arm, a second arm, and a sensor coupled to the second arm. The sensor can receive light from the light source that is transmitted through at least a portion of the article.

公开(公告)号：US11859798B1

公开(公告)日：2024-01-02

申请号：US18111122

申请日：2023-02-17

Applicant: Dennis Rotim ,  Cvitan Rotim

Inventor： Dennis Rotim ,  Cvitan Rotim

IPC: F21V21/10 ,  F21V21/14 ,  B25H1/02 ,  G01N21/01 ,  G01N21/88 ,  F21S6/00 ,  F21V21/30 ,  F21V21/26 ,  F21V21/28 ,  F21V21/29

CPC classification number: F21V21/10 ,  F21V21/145 ,  A47B2220/0075 ,  A47B2220/0077 ,  B25H1/02 ,  F21S6/002 ,  F21S6/003 ,  F21S6/005 ,  F21S6/006 ,  F21V21/14 ,  F21V21/26 ,  F21V21/28 ,  F21V21/29 ,  F21V21/30 ,  G01N21/01 ,  G01N21/8803 ,  G01N21/8806 ,  G01N2021/8809 ,  G01N2021/8812 ,  G01N2021/8816 ,  G01N2201/02 ,  G01N2201/021 ,  G01N2201/022 ,  G01N2201/024 ,  G01N2201/0221 ,  G01N2201/0224 ,  G01N2201/0225

Abstract: A portable lighting device has an upright configuration and a folded configuration. In the upright configuration, the portable lighting device provides lighting directed to a workspace area. In the folded configuration, the legs of the portable lighting device are rotated into a compact position for transport or storage. The portable lighting device includes lugs to hold one or more objects, which helps increase the surface area of the workspace. The portable lighting device is suitable for different uses of tradespersons and hobbyists. For example, a user can use the portable lighting device while working on radio-controlled car or electrical or hardware repairs.

公开(公告)号：US11774364B2

公开(公告)日：2023-10-03

申请号：US17276596

申请日：2019-09-17

Applicant: THE UNIVERSITY OF NOTTINGHAM

Inventor： Ioan Notingher ,  Christopher Corden ,  Dustin Shipp

IPC: G01N21/65 ,  G02B21/02 ,  G02B21/16 ,  G02B21/26 ,  G02B21/36

CPC classification number: G01N21/65 ,  G02B21/02 ,  G02B21/16 ,  G02B21/26 ,  G02B21/365 ,  G01N2201/021 ,  G01N2201/0634 ,  G01N2201/0635 ,  G01N2201/0636 ,  G01N2201/06113

Abstract: Apparatus and methods for acquiring a Raman spectral map of a sample including a material species. The apparatus includes: a pulsed illumination source providing pulsed illumination radiation for exciting the sample and producing scattered radiation; a microscope objective focusing the pulsed illumination radiation onto a region of the sample corresponding to a data point of the map, and collecting emitted radiation from the region; a translation stage translating the sample relative to the microscope objective in at least two directions; a spectral filter spectrally filtering the emitted radiation collected by the objective to obtain a filtered portion of radiation corresponding to a characteristic Raman spectral feature of the material species; a detector receiving the filtered portion and providing output electrical pulses indicative thereof; and readout electronics applying a time gate to the output electrical pulses to distinguish detection events corresponding to the Raman scattered radiation from events associated with photoluminescence.

公开(公告)号：US11761908B2

公开(公告)日：2023-09-19

申请号：US17609156

申请日：2020-05-20

Applicant: CORNING INCORPORATED

Inventor： Julie Marie Daugherty ,  Joshua Adam Jamison ,  Russel Wayne Madara ,  Duane Otis Sellers ,  Eric Daniel Treacy ,  Xiaotian Zou

IPC: G01N21/95 ,  G01N21/956

CPC classification number: G01N21/95692 ,  G01N2201/021

Abstract: Inspection methods, apparatuses, and techniques are described herein for identifying defects in a plugged honeycomb body (100). The inspection apparatuses and methods herein utilize reduced distortion imaging to identify the defects in the plugged honeycomb body. Backlit and/or directly illuminated images (by e.g. first light source 308) of the plugged honeycomb body (100) can be captured (by e.g. camera 302) and analyzed to align (by e.g. actuators 306) the plugged honeycomb body (100) in an imaging apparatus and to identify the defects.