-
公开(公告)号:CA2727778A1
公开(公告)日:2010-03-25
申请号:CA2727778
申请日:2009-06-30
Applicant: STC UNM
Inventor: KISSEL DAVID J , BRINKER CHARLES JEFFREY
IPC: C09D133/04 , B05D5/00 , B05D7/00 , C09D5/00 , C09D183/02
Abstract: Provided are polymer-aerogel composite coatings, devices and articles including polymer-aerogel composite coatings, and methods for preparing the polymer-aerogel composite. The exemplary article can include a surface, wherein the surface includes at least one region and a polymer-aerogel composite coating disposed over the at least one region, wherein the polymer-aerogel composite coating has a water contact angle of at least about 140° and a contact angle hysteresis of less than about 1°. The polymer-aerogel composite coating can include a polymer and an ultra high water content catalyzed polysilicate aerogel, the polysilicate aerogel including a three dimensional network of silica particles having surface functional groups derivatized with a silylating agent and a plurality of pores.
-
222.
公开(公告)号:AU2007313096A1
公开(公告)日:2008-04-24
申请号:AU2007313096
申请日:2007-03-09
Applicant: STC UNM
Inventor: SUN XINYU , HERSEE STEPHEN M , WANG XIN
IPC: H01L21/20
Abstract: Exemplary embodiments provide semiconductor devices including high-quality (i.e., defect free) group III-N nanowires and uniform group III-N nanowire arrays as well as their scalable processes for manufacturing, where the position, orientation, cross-sectional features, length and the crystallinity of each nanowire can be precisely controlled. A pulsed growth mode can be used to fabricate the disclosed group III-N nanowires and/or nanowire arrays providing a uniform length of about 10 nm to about 1000 microns with constant cross-sectional features including an exemplary diameter of about 10-1000 nm. In addition, high-quality GaN substrate structures can be formed by coalescing the plurality of GaN nanowires and/or nanowire arrays to facilitate the fabrication of visible LEDs and lasers. Furthermore, core-shell nanowire/MQW active structures can be formed by a core-shell growth on the nonpolar sidewalls of each nanowire.
-
公开(公告)号:AU2007224178A1
公开(公告)日:2007-09-13
申请号:AU2007224178
申请日:2007-03-01
Applicant: STC UNM
Inventor: TRUMAN CHARLES RANDALL , SMYTH HUGH
IPC: A61M15/00
-
公开(公告)号:CA2397485A1
公开(公告)日:2001-07-19
申请号:CA2397485
申请日:2001-01-16
Applicant: STC UNM
Inventor: LARSON RICHARD S
Abstract: Cyclic peptides inhibit LFA-1 interaction with ICAM-1 and are useful in treatment of hematopoietic neoplasms and in adjunct therapy in prevention of retinoic acid syndrome and diseases involving emigration of leukocytes into organ tissue.
-
公开(公告)号:ES2691485T3
公开(公告)日:2018-11-27
申请号:ES13845074
申请日:2013-10-08
Applicant: STC UNM
Inventor: TIMMINS GRAHAM , SILKS LOUIS
IPC: C12Q1/04 , A61B5/08 , A61B5/083 , A61B5/145 , A61B5/20 , A61K51/12 , C12Q1/02 , G01N33/497 , G01N33/569 , G01N33/60 , G21H5/02
Abstract: Un método para determinar la presencia o ausencia de una infección bacteriana por Clostridium difficile en un paciente que comprende: determinar la cantidad de dióxido de carbono marcado isotópicamente y/o un para-cresol marcado isotópicamente en una o más muestras recogidas de un paciente a quien se ha administrado una cantidad diagnósticamente eficaz de una tirosina marcada isotópicamente y/o un ácido p-hidroxifenilacético marcado isotópicamente; indicando dicha cantidad de dióxido de carbono marcado isotópicamente y/o un para-cresol marcado isotópicamente la presencia o ausencia de la infección bacteriana por Clostridium difficile en el paciente.
-
公开(公告)号:IL239665A
公开(公告)日:2018-08-30
申请号:IL23966515
申请日:2015-06-28
Applicant: STC UNM
IPC: B01J20060101 , H01M20060101
Abstract: A sacrificial support-based method, a mechanosynthesis-based method, and a combined sacrificial support/mechanosynthesis support based method that enables the production of supported or unsupported catalytic materials and/or the synthesis of catalytic materials from both soluble and insoluble transition metal and charge transfer salt materials.
-
227.
公开(公告)号:MA40999A
公开(公告)日:2017-10-25
申请号:MA40999
申请日:2015-12-15
Applicant: STC UNM
Inventor: PLUSQUELLIC JAMES
Abstract: Une fonction physique non clonable intégrée au «delay embedded hardware» («help puf») tire parti de l'entropie en surveillant la stabilité du trajet et en mesurant les retards du trajet à partir des macros logiques de base. Les techniques d'amélioration de la fiabilité et de la sécurité du help puf réduisent les erreurs de retournement lors de la régénération de la chaîne de bits à travers les variations environnementales et améliorent la résistance cryptographique ainsi que la difficulté correspondante de réaliser des attaques de construction de modèles. Un processus d'inscription basé sur la tension parcourt des chemins instables sur des unités fonctionnelles normalement synthétisées (glitchy) et réduit les erreurs de flip de bit en effectuant l'enrôlement à de multiples tensions d'alimentation contrôlées en utilisant des régulateurs de tension sur puce.
-
公开(公告)号:AU2013290185B2
公开(公告)日:2016-06-30
申请号:AU2013290185
申请日:2013-07-11
Applicant: STC UNM
Inventor: SEROV ALEXEY , ATANASSOV PLAMEN B
IPC: B01J37/08 , B01J23/745 , C07D235/30
Abstract: A method of preparation of M-N-C catalytic material utilizing a sacrificial support approach and using inexpensive and readily available metal precursors and carbendazim (CBDZ) as the carbon source is described.
-
229.
公开(公告)号:CA2971212A1
公开(公告)日:2016-06-23
申请号:CA2971212
申请日:2015-12-15
Applicant: STC UNM
Inventor: PLUSQUELLIC JAMES
IPC: G06F21/70
Abstract: A Hardware-Embedded Delay Physical Unclonable Function ("HELP PUF") leverages entropy by monitoring path stability and measuring path delays from core logic macros. Reliability and security enhancing techniques for the HELP PUF reduce bit flip errors during regeneration of the bitstring across environmental variations and improve cryptographic strength along with the corresponding difficulty of carrying out model building attacks. A voltage-based enrollment process screens unstable paths on normally synthesized (glitchy) functional units and reduces bit flip errors by carrying out enrollment at multiple supply voltages controlled using on-chip voltage regulators.
-
公开(公告)号:IL236335D0
公开(公告)日:2015-02-26
申请号:IL23633514
申请日:2014-12-17
Applicant: STC UNM
IPC: B01J20060101
-
-
-
-
-
-
-
-
-