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    Energy dispersion device
    233.
    发明授权
    Energy dispersion device 有权
    能量分散装置

    公开(公告)号：US08885161B2

    公开(公告)日：2014-11-11

    申请号：US13596242

    申请日：2012-08-28

    Applicant: Alexander Scheeline ,  Thu Anh Bui

    Inventor： Alexander Scheeline ,  Thu Anh Bui

    IPC: G01J3/28 ,  G01J3/44 ,  G01J3/10 ,  G01K13/00 ,  G01J3/18 ,  G02B27/44 ,  G01J3/42

    CPC classification number: G01J3/1804 ,  G01J3/10 ,  G01J3/28 ,  G01J3/42 ,  G01J3/4406 ,  G01K13/00 ,  G02B27/4244 ,  G02B27/4272 ,  G02B27/44

    Abstract: The invention provides an energy dispersion device, spectrograph and method that can be used to evaluate the composition of matter on site without the need for specialized training or expensive equipment. The energy dispersion device or spectrograph can be used with a digital camera or cell phone. A device of the invention includes a stack of single- or double-dispersion diffraction gratings that are rotated about their normal giving rise to a multiplicity of diffraction orders from which meaningful measurements and determinations can be made with respect to the qualitative or quantitative characteristics of matter.

    Abstract translation: 本发明提供了一种能量分散装置，光谱仪和方法，可用于现场评估物质的组成，而无需专门培训或昂贵的设备。 能量分散装置或光谱仪可与数码相机或手机一起使用。 本发明的装置包括一组单分散或双分散衍射光栅，其围绕其正常旋转，产生多个衍射级，从该衍射级可以对物质的定性或定量特性进行有意义的测量和确定 。

    EFFICIENCY OF A DEEP GRATING
    234.
    发明申请
    EFFICIENCY OF A DEEP GRATING 审中-公开
    深层磨砂效率

    公开(公告)号：US20140211314A1

    公开(公告)日：2014-07-31

    申请号：US14242712

    申请日：2014-04-01

    Applicant: Optoplex Corporation

    Inventor： Yung-Chieh Hsieh

    IPC: G02B5/18

    CPC classification number: G02B5/1809 ,  G01J3/1804 ,  G02B5/1814

    Abstract: Several techniques are provided to reduce the spurious reflection generated at the exit surface of a transmission grating. In one embodiment the exit surface of the grating is not parallel with the entrance surface. In another embodiment, the first and second surfaces of the grating are parallel and a second substrate is attached to the second surface of the grating. The second substrate has an entrance surface and an exit surface having at least a wedge angle relative to the entrance surface. In another embodiment, a second substrate is fixedly connected to the second surface of a parallel plate grating, where the second substrate has an entrance surface and an exit surface. The exit surface is curved such that it will be about normal to a beam transmitted over a range of angels of incidence onto the grating region.

    Abstract translation: 提供了几种技术来减少在透射光栅的出射表面处产生的杂散反射。 在一个实施例中，光栅的出射表面不与入射面平行。 在另一个实施例中，光栅的第一和第二表面是平行的，并且第二基底附着到光栅的第二表面。 第二基板具有相对于入口表面至少具有楔角的入射表面和出射表面。 在另一个实施例中，第二基板固定地连接到平行板格栅的第二表面，其中第二基板具有入口表面和出射表面。 出射表面是弯曲的，使得其将在与在光栅区域上入射的角度范围内传播的光束大致正交。

    Sagnac fourier transform spectrometer having improved resolution
    235.
    发明授权
    Sagnac fourier transform spectrometer having improved resolution 有权
    Sagnac傅立叶变换光谱仪具有改进的分辨率

    公开(公告)号：US08736844B2

    公开(公告)日：2014-05-27

    申请号：US13154368

    申请日：2011-06-06

    Applicant: Eric Szarmes ,  Huan Ma

    Inventor： Eric Szarmes ,  Huan Ma

    IPC: G01J3/45

    CPC classification number: G01J3/453 ,  G01J3/1804 ,  G01J3/189

    Abstract: A Sagnac interferometer can include a beamsplitter arranged to receive an input beam of light of a design wavelength, to split the input beam of light into first and second beams that counter propagate around an optical path, and to recombine the first and second beams into an output beam of light. The optical path can include at least one diffraction grating that is arranged to satisfy an effective Littrow geometry.

    Abstract translation: 萨尼亚克干涉仪可以包括分束器，其布置成接收设计波长的输入光束，以将输入光束分成第一和第二光束，所述第一和第二光束在光路周围传播，并且将第一和第二光束复合到 输出光束。 光路可以包括至少一个被设置为满足有效的Littrow几何形状的衍射光栅。

    SPECTRAL CHARACTERISTIC MEASURING DEVICE AND IMAGE FORMING APPARATUS
    238.
    发明申请
    SPECTRAL CHARACTERISTIC MEASURING DEVICE AND IMAGE FORMING APPARATUS 有权
    光谱特性测量装置和图像形成装置

    公开(公告)号：US20130182251A1

    公开(公告)日：2013-07-18

    申请号：US13737157

    申请日：2013-01-09

    Applicant: Kohei Shimbo ,  Naohiro Kamijo ,  Manabu Seo ,  Yoichi Kubota

    Inventor： Kohei Shimbo ,  Naohiro Kamijo ,  Manabu Seo ,  Yoichi Kubota

    IPC: G01J3/02

    CPC classification number: G01J3/0208 ,  G01J3/0205 ,  G01J3/0229 ,  G01J3/0248 ,  G01J3/1804 ,  G01J3/2803

    Abstract: A spectral characteristic measuring device includes an illuminating unit that illuminates a medium; a light dividing unit that divides reflection light from the medium into reflection light beams; a first imaging unit that includes first lenses and second lenses arranged alternately in a staggered pattern and focuses the respective reflection light beams; a diffraction unit that includes a first diffraction region and a second diffraction region and diffracts the focused reflection light beams to form diffraction images; and a light receiving unit that includes plural pixels for receiving the diffraction images. The reflection light beams focused by the first lenses enter the first diffraction region to form first diffraction images, the reflection light beams focused by the second lenses enter the second diffraction region to form second diffraction images, and the first and second diffraction images are arranged alternately on the light receiving unit in a pixel arrangement direction.

    Abstract translation: 光谱特性测量装置包括照亮介质的照明单元; 将来自介质的反射光分成反射光束的光分割单元; 第一成像单元，其包括以交错图案交替布置的第一透镜和第二透镜，并且对各个反射光束进行聚焦; 衍射单元，其包括第一衍射区域和第二衍射区域，并衍射聚焦反射光束以形成衍射图像; 以及包括用于接收衍射图像的多个像素的光接收单元。 由第一透镜聚焦的反射光束进入第一衍射区域以形成第一衍射图像，由第二透镜聚焦的反射光束进入第二衍射区域以形成第二衍射图像，并且第一和第二衍射图像交替布置 在像素排列方向上的光接收单元上。

    Method for manufacturing information aquiring semiconductor device
    240.
    发明授权
    Method for manufacturing information aquiring semiconductor device 有权
    制造半导体器件信息的方法

    公开(公告)号：US08409907B2

    公开(公告)日：2013-04-02

    申请号：US12489636

    申请日：2009-06-23

    Applicant: Atsushi Toda ,  Hirofumi Sumi

    Inventor： Atsushi Toda ,  Hirofumi Sumi

    IPC: H01L31/18

    CPC classification number: G01J3/2823 ,  G01J3/04 ,  G01J3/1804 ,  G01J3/2803 ,  G01J3/502 ,  G01J3/51 ,  G01J3/513 ,  H01L27/14623 ,  H01L27/14625 ,  H01L27/14645 ,  H01L27/14687 ,  H01L27/14689 ,  H01L27/14831 ,  H04N5/2254 ,  H04N9/045 ,  H04N9/07

    Abstract: A method for manufacturing a semiconductor device for detecting a physical amount distribution, the semiconductor device comprising unit components arrayed in a predetermined order, the unit components each including a unit signal generation portion for detecting an electromagnetic wave and outputting the corresponding unit signal. A diffraction grating is provided on the incident light side of a spectral image sensor, the diffraction grating including scatterers, slits, and scatterers disposed in that order. An electromagnetic wave is scattered by the scatterers to produce diffracted waves, and by using the fact that interference patterns between the diffracted waves change with wavelengths, signals are detected for respective wavelengths by photoelectric conversion elements in each photodiode group.

    Abstract translation: 一种用于制造用于检测物理量分布的半导体器件的方法，所述半导体器件包括以预定顺序排列的单元组件，所述单元组件各自包括用于检测电磁波的单元信号生成部分并输出相应的单位信号。 衍射光栅设置在光谱图像传感器的入射光侧，衍射光栅包括依次布置的散射体，狭缝和散射体。 电磁波被散射体散射以产生衍射波，并且通过使用衍射波之间的干涉图案随波长变化的事实，通过每个光电二极管组中的光电转换元件检测各波长的信号。

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