TILT STRUCTURE
    241.
    发明申请
    TILT STRUCTURE 有权
    倾斜结构

    公开(公告)号:US20110244190A1

    公开(公告)日:2011-10-06

    申请号:US13072127

    申请日:2011-03-25

    Abstract: A tilt structure includes a shaft section formed on a substrate section, a tilt structure film having one end formed on an upper surface of the shaft section, and the other end bonded to the substrate section, and a thin film section provided to the tilt structure film, located on a corner section composed of the upper surface of the shaft section and a side surface of the shaft section, and having a film thickness thinner than the tilt structure film, the tilt structure film is bent in the thin film section, and an acute angle is formed by the substrate section and the tilt structure film.

    Abstract translation: 倾斜结构包括形成在基板部分上的轴部分,倾斜结构膜,其一端形成在轴部分的上表面上,另一端接合到基板部分;以及薄膜部分,设置在倾斜结构 薄膜,位于由所述轴部的上表面构成的角部和所述轴部的侧面之间,并且具有比所述倾斜结构膜更薄的膜厚,所述倾斜结构膜在所述薄膜部弯曲,并且 由基板部和倾斜结构膜形成锐角。

    Infrared and near-infrared camera hyperframing
    245.
    发明授权
    Infrared and near-infrared camera hyperframing 有权
    红外和近红外相机超帧

    公开(公告)号:US07634157B1

    公开(公告)日:2009-12-15

    申请号:US11388947

    申请日:2006-03-23

    Abstract: Systems and techniques for imaging spectroscopy using improved data acquisition for infrared and near-infrared imaging. A first filter corresponding to a first wavelength may be positioned in the optical path of an infrared camera, and subframe data may be acquired for different exposures. A second filter corresponding to a second different wavelength may be positioned in the optical path of the infrared camera, and subframe data acquired for different exposures. Image data for the first wavelength and the second wavelength may then be compared to reference spectroscopic data.

    Abstract translation: 用于红外和近红外成像的改进数据采集成像光谱的系统和技术。 对应于第一波长的第一滤波器可以位于红外相机的光路中,并且可以针对不同的曝光获取子帧数据。 对应于第二不同波长的第二滤波器可以位于红外相机的光路中,并且针对不同曝光获取子帧数据。 然后将第一波长和第二波长的图像数据与参考光谱数据进行比较。

    Method and system of array imaging
    247.
    发明授权
    Method and system of array imaging 有权
    阵列成像的方法和系统

    公开(公告)号:US07595473B2

    公开(公告)日:2009-09-29

    申请号:US11209432

    申请日:2005-08-22

    Abstract: The present invention relates to a method and system of array imaging that extends or maximizes the longevity of the sensor array by minimizing the effects of photobleaching. The imaging system has a light source, a variable exposure aperture, and a variable filter system. The system extends the longevity of sensors by (1) using the variable exposure aperture to selectively expose sections of the sensor array containing representative numbers of each type of sensor, and/or (2) using the variable filter system to control the intensity of the excitation light, providing only the intensity required to induce the appropriate excitation and increasing that intensity over time as necessary to counteract the effects of photobleaching.

    Abstract translation: 本发明涉及阵列成像的方法和系统,该方法和系统通过最小化光漂白的影响来延长或最大化传感器阵列的寿命。 成像系统具有光源,可变曝光孔径和可变过滤器系统。 该系统通过(1)使用可变曝光孔径来延长传感器的寿命,以选择性地暴露包含每种类型的传感器的代表数的传感器阵列的部分,和/或(2)使用可变过滤器系统来控制传感器的强度 激发光,仅提供诱导适当激发所需的强度,并根据需要随时间增加强度以抵消光漂白的影响。

    Optical microscope and spectrum measuring method
    248.
    发明授权
    Optical microscope and spectrum measuring method 有权
    光学显微镜和光谱测量方法

    公开(公告)号:US07561265B2

    公开(公告)日:2009-07-14

    申请号:US11607491

    申请日:2006-12-01

    Abstract: An optical microscope according to a first embodiment of the present invention includes: a laser light source; a Y-directional scanning unit moving the light beam in a Y direction; an objective lens; a X-directional scanning unit moving the light beam in a X direction; a beam splitter provided in an optical path from the Y-directional scanning unit to the sample, and separating outgoing light out of the light beam incident on the sample, which exits from the sample toward the objective lens from the light beam incident on the sample from the laser light source; a spectroscope having an entrance slit extending along the Y direction and spatially dispersing the outgoing light passed through the entrance slit in accordance with a wavelength of the light; and a detector detecting the outgoing light dispersed by the spectroscope.

    Abstract translation: 根据本发明第一实施例的光学显微镜包括:激光源; Y方向扫描单元,沿Y方向移动光束; 物镜; X方向扫描单元,沿X方向移动光束; 设置在从Y方向扫描单元到样本的光路中的分束器,并将入射到样品上的光束从入射到样品上的光束从样品朝向物镜离开的光束分离出来 来自激光光源; 具有沿Y方向延伸的入口狭缝的分光镜,并且根据光的波长对通过入口狭缝的出射光进行空间上的分散; 以及检测器,其检测由分光镜分散的出射光。

    Semiconductor spectroscopy system
    249.
    发明授权
    Semiconductor spectroscopy system 有权
    半导体光谱系统

    公开(公告)号:US07406107B2

    公开(公告)日:2008-07-29

    申请号:US10953048

    申请日:2004-09-29

    Abstract: An optical power control system for a semiconductor source spectroscopy system controls power fluctuations in the tunable signal from the spectroscopy system and thus improves the noise performance of the system. This general solution has advantages relative to other systems that simply detect reference power levels during the scan and then correct the detected signal after interaction with the sample by reducing the requirements for coordinating the operation of the sample detectors and power or reference detectors. The spectroscopy system comprises a semiconductor source and a tunable filter. The combination of the semiconductor source and tunable signal illuminate a sample with a tunable signal, being tunable over a scan band. The power control system comprises an amplitude detector system for detecting the power of the tunable optical signal and power control system for regulating the amplitude of the tunable optical signal in response to its detected power.

    Abstract translation: 用于半导体源光谱系统的光功率控制系统控制来自光谱系统的可调谐信号中的功率波动,从而改善系统的噪声性能。 该通用解决方案相对于在扫描期间简单地检测参考功率电平然后在与样品相互作用之后校正检测到的信号的其它系统具有优点,通过减少协调样品检测器和功率或参考检测器的操作的要求。 光谱系统包括半导体源和可调谐滤波器。 半导体源和可调信号的组合用可调信号照射样品,可在扫描带上调谐。 功率控制系统包括用于检测可调谐光信号的功率的振幅检测器系统和用于响应于其检测到的功率来调节可调谐光信号的幅度的功率控制系统。

    Methods and apparatus for calibrating an electromagnetic measurement device
    250.
    发明授权
    Methods and apparatus for calibrating an electromagnetic measurement device 失效
    用于校准电磁测量装置的方法和装置

    公开(公告)号:US07274453B2

    公开(公告)日:2007-09-25

    申请号:US10965535

    申请日:2004-10-14

    Abstract: Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate and calibrating an electromagnetic measurement device are disclosed. The methods and apparatus generate electromagnetic waves and capture a portion of the generated waves after the waves pass through a first polarized filter, reflect from a substrate, and pass through a second polarized filter arranged in a cross polar arrangement with respect to the first polarized filter. In addition, the apparatus captures electromagnetic waves that pass through an attenuating filter and reflect from one or more calibration standards. Digital data is determined from the captured electromagnetic waves. The digital data is used to recalibrate the apparatus.

    Abstract translation: 公开了用于测量与衬底相关联的电磁辐射响应特性并校准电磁测量装置的方法和装置。 所述方法和装置在波通过第一偏振滤光器之后产生电磁波并捕获所产生的波的一部分,从衬底反射并穿过相对于第一偏振滤光器布置成交叉极性布置的第二偏振滤光器 。 此外,该装置捕获通过衰减滤波器并从一个或多个校准标准反射的电磁波。 从捕获的电磁波确定数字数据。 数字数据用于重新校准设备。

Patent Agency Ranking