公开(公告)号：EP4230977B1

公开(公告)日：2024-07-24

申请号：EP23157627.3

申请日：2023-02-20

IPC: G01J3/02 ,  G01J3/10 ,  G01J3/453

CPC classification number: G01J3/0286 ,  G01J3/027 ,  G01J3/108 ,  G01J2003/453420130101 ,  G01J3/453

公开(公告)号：EP4350430A3

公开(公告)日：2024-06-12

申请号：EP24159648.5

申请日：2017-03-03

Applicant: Hamamatsu Photonics K.K.

Inventor： HIROSE, Masaki ,  SHIBAYAMA, Katsumi ,  KASAHARA, Takashi ,  KAWAI, Toshimitsu ,  OYAMA, Hiroki

IPC: G01J3/02 ,  G01J3/26 ,  G01J1/04 ,  G02B26/00 ,  G02F1/21 ,  H01L31/0232 ,  H01L31/024

CPC classification number: G01J1/04 ,  G01J3/02 ,  G02B26/00 ,  G01J3/26 ,  G02F1/21 ,  G01J3/0286 ,  G01J3/0289 ,  G01J3/0259 ,  H01L31/024 ,  H01L31/02325

Abstract: A light detection device includes a Fabry-Perot interference filter provided with a light transmitting region on a predetermined line, a light detector disposed on one side with respect to the Fabry-Perot interference filter on the line, a package having an opening positioned on the other side with respect to the Fabry-Perot interference filter on the line, a light transmitting member provided in the package such that the opening is blocked, and a temperature control element having an endothermic region thermally connected to the Fabry-Perot interference filter and the light detector. The endothermic region is positioned on one side with respect to the light detector on the line.

公开(公告)号：EP3104144B1

公开(公告)日：2018-10-03

申请号：EP15745768.0

申请日：2015-02-03

Applicant: Hamamatsu Photonics K.K.

Inventor： YOKINO, Takafumi ,  SHIBAYAMA, Katsumi

IPC: G01J3/02 ,  G01J3/18 ,  G01J3/36 ,  G01J3/04

CPC classification number: G01J3/0256 ,  G01J3/021 ,  G01J3/0286 ,  G01J3/0289 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/18 ,  G01J3/36

Abstract: A spectrometer 1A includes a light detection element 20 provided with a light passing part 21, a first light detection part 22, and a second light detection part 26, a support 30 fixed to the light detection element 20 such that a space S is formed, a first reflection part 11 provided in the support 30 and configured to reflect light L1 passing through the light passing part 21 in the space S, a second reflection part 12A provided in the light detection element 20 and configured to reflect the light L1 reflected by the first reflection part 11 in the space S, and a dispersive part 40A provided in the support 30 and configured to disperse and reflect the light L1 reflected by the second reflection part 12A to the first light detection part 22 in the space S. A plurality of second light detection parts 26 is disposed in a region surrounding the second reflection part 12A.

公开(公告)号：EP3332230A2

公开(公告)日：2018-06-13

申请号：EP16753523.6

申请日：2016-08-03

Applicant: SpectraSensors, Inc.

Inventor： FEITISCH, Alfred ,  LIU, Xiang ,  LUDLUM, Kevin ,  SCHREMPEL, Mathias

IPC: G01J3/10 ,  G01J3/28 ,  G01N21/3504 ,  G01J3/42 ,  G01J3/433 ,  G01N21/27 ,  G01J3/02

CPC classification number: G01J3/0286 ,  G01J3/10 ,  G01J3/28 ,  G01J3/42 ,  G01J3/433 ,  G01J2003/4332 ,  G01J2003/4334 ,  G01N21/274 ,  G01N21/3504

Abstract: Frequency registration deviations occurring during a scan of a frequency or wavelength range by a spectroscopic analysis system can be corrected using passive and/or active approaches. A passive approach can include determining and applying mathematical conversions to a recorded field spectrum. An active approach can include modifying one or more operating parameters of the spectroscopic analysis system to reduce frequency registration deviation.

公开(公告)号：EP3312576A1

公开(公告)日：2018-04-25

申请号：EP16194833.6

申请日：2016-10-20

Applicant: trinamiX GmbH

Inventor： VALOUCH, Sebastian ,  FEUERSTEIN, Bertram ,  HENGEN, Stefan ,  HERMES, Wilfried ,  SEND, Robert ,  BRUDER, Ingmar

IPC: G01J1/44 ,  G01J1/46 ,  G01J3/02 ,  H04N9/04 ,  G01J1/02 ,  H04N5/361

CPC classification number: G01J1/44 ,  G01J1/0252 ,  G01J1/46 ,  G01J3/0286 ,  G01J2001/444 ,  H04N5/361 ,  H04N9/045

Abstract: A photodetector compensating circuit (110) is proposed. The photodetector compensating circuit (110) comprises:
- at least one photoconductor (112) having an electrical conductivity dependent on an illumination (114) of a light-sensitive region (116) of the photoconductor (112);
- at least one transimpedance amplifier (118), wherein the transimpedance amplifier (118) comprises at least one inverting operational amplifier (120) and one or both of at least one feedback resistor (122) having a resistance R F or at least one feedback capacitor (126) having a capacity C F .

Abstract translation: 提出了一种光电探测器补偿电路（110）。 光电探测器补偿电路（110）包括： - 至少一个光电导体（112），其具有取决于光电导体（112）的光敏区域（116）的照明（114）的电导率; - 至少一个跨阻抗放大器（118），其中跨阻抗放大器（118）包括至少一个反相运算放大器（120）以及具有电阻RF的至少一个反馈电阻器（122）或者至少一个反馈电容器 （126）具有容量CF.

公开(公告)号：EP3161434A4

公开(公告)日：2018-02-28

申请号：EP15812618

申请日：2015-06-17

Applicant: SPECTRAL ENGINES OY

Inventor： ANTILA JARKKO

IPC: G01J3/12 ,  G01J3/02 ,  G01J3/26 ,  G01J3/28 ,  G02B5/20 ,  G02B26/00 ,  G02F1/21

CPC classification number: G01J3/26 ,  G01J3/0227 ,  G01J3/0286 ,  G01J3/28 ,  G01J3/45 ,  G01J9/0246 ,  G01J2003/2879 ,  G02B5/20 ,  G02F1/21

Abstract: A method for determining spectral calibration data (λcal(Sd), Sd,cal(λ)) of a Fabry-Perot interferometer (100) comprises: forming a spectral notch (NC2) by filtering input light (LB1) with a notch filter (60) such that the spectral notch (NC2) corresponds to a transmittance notch (NC1) of the notch filter (60), measuring a spectral intensity distribution (M(Sd)) of the spectral notch (NC2) by varying the mirror gap (dFP) of the Fabry-Perot interferometer (100), and by providing a control signal (Sd) indicative of the mirror gap (dFP), and determining the spectral calibration data (λcal(Sd), Sd,cal(λ)) by matching the measured spectral intensity distribution (M(Sd)) with the spectral transmittance (TN(λ)) of the notch filter (60).

公开(公告)号：EP3283860A1

公开(公告)日：2018-02-21

申请号：EP16711041.0

申请日：2016-02-11

Applicant: Raytheon Company

Inventor： ROSS, Thomas, William ,  MILES, Steven, A. ,  MANN, David, C. ,  AVILA, Marco, A. ,  MCDONALD, David, Russell ,  GALLAGHER, Jeffery, M.

IPC: G01J3/02 ,  G01S17/00 ,  G01S7/497 ,  H04N5/225 ,  H04N9/09

CPC classification number: G01B11/272 ,  G01J1/0266 ,  G01J1/0411 ,  G01J1/4228 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0286 ,  G01J3/0289 ,  G01J5/0806 ,  G01J5/089 ,  G02B7/287 ,  G02B27/34 ,  G02B27/36 ,  H04N5/2258 ,  H04N5/23212 ,  H04N17/002

Abstract: System and method for sensor alignment. In one example, a reimaging optical system includes reimaging foreoptics positioned to receive and reimage incident electromagnetic radiation to produce an intermediate image plane and output an optical beam of the received incident electromagnetic radiation, an imaging optical apparatus positioned to receive the optical beam and focus the electromagnetic radiation of the optical beam onto a first focal plane, a first imaging sensor positioned at the first focal plane and configured to produce a first image responsive to receiving the electromagnetic radiation of the optical beam, an alignment object selectively positioned at the intermediate image plane and configured to superimpose an alignment tool upon the first image, and a controller coupled to the first imaging sensor and configured to perform an alignment process for the first imaging sensor based on at least a position of the alignment tool in the first image.

公开(公告)号：EP3104145A4

公开(公告)日：2017-11-15

申请号：EP15745939

申请日：2015-02-03

Applicant: HAMAMATSU PHOTONICS KK

Inventor： YOKINO TAKAFUMI ,  SHIBAYAMA KATSUMI ,  KATO KATSUHIKO

IPC: G01J3/02 ,  G01J3/18

CPC classification number: G01J3/2803 ,  G01J3/0202 ,  G01J3/0256 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/18 ,  G01J2003/1852

公开(公告)号：EP3241002A1

公开(公告)日：2017-11-08

申请号：EP15875303.8

申请日：2015-12-18

Applicant: Teknologian Tutkimuskeskus VTT OY

Inventor： VARPULA, Aapo ,  HOLMLUND, Christer ,  RISSANEN, Anna

IPC: G01J3/26 ,  G02B26/00 ,  G02B5/28 ,  G02B5/08 ,  B81B7/00

CPC classification number: G01J3/26 ,  G01J3/0286 ,  G01J3/0297 ,  G02B5/0825 ,  G02B26/001 ,  G02B27/142

Abstract: A mirror plate (100) for a Fabry-Perot interferometer (300) comprises: - a substrate (50), which comprises silicon (Si), - a semi-transparent reflective coating (110) implemented on the substrate (50), - a de-coupling structure (DC1) formed on the substrate (50), - a first sensor electrode (G1a) formed on top of the de-coupling structure (DC1), and - a second sensor electrode (G1b), wherein the de-coupling structure (DC1) comprises an electrically insulating layer (60a), and a first stabilizing electrode (G0a), which is located between the first sensor electrode (G1a) and the substrate (50).

公开(公告)号：EP3215816A1

公开(公告)日：2017-09-13

申请号：EP15801885.3

申请日：2015-11-05

Applicant: Spectral Engines OY

Inventor： ANTILA, Jarkko ,  KANTOJÄRVI, Uula ,  MÄKYNEN, Jussi

IPC: G01J3/02 ,  G01J3/26

CPC classification number: G01J3/26 ,  G01J3/0202 ,  G01J3/0256 ,  G01J3/0286

Abstract: The present invention concerns an optical measurement system comprising an electrically tunable Peltier element, a detector for detecting radiation from a radiation source in a measurement area, the detector being in thermal connection with the Peltier element, an electrically tunable Fabry-Perot interferometer placed in the path of the radiation prior to the detector, the Fabry-Perot interferometer being in thermal connection with the Peltier element, and control electronics circuitry configured to control the Peltier element, the interferometer, and the detector. The present invention further concerns a method for analyzing the spectrum of an object.

Abstract translation: 本发明涉及包括电可调珀耳帖元件（11），用于检测来自测量区域（26）中的辐射源（25）的辐射的检测器（23）的光学测量系统（1），检测器（23） 在与珀耳帖元件（11）热连接的情况下，在检测器（23）之前放置在辐射（16）的路径中的电可调法布里珀罗干涉仪（10），法布里珀罗干涉仪（10）处于热 与珀耳帖元件（11）的连接以及配置成控制珀耳帖元件（11），干涉仪（10）和检测器（23）的控制电子电路。 本发明还涉及用于分析对象的光谱的方法。