公开(公告)号：LU92664A1

公开(公告)日：2016-08-25

申请号：LU92664

申请日：2015-02-24

Applicant: LEICA MICROSYSTEMS

Inventor： KREMER MANUEL ,  DYBA MARCUS

IPC: G01J1/42 ,  G01J1/44 ,  G02B21/00

CPC classification number: G02B21/008 ,  G01J1/44 ,  G01J2001/4466 ,  G02B21/0096

公开(公告)号：DE112010004624A5

公开(公告)日：2012-11-15

申请号：DE112010004624

申请日：2010-11-30

Applicant: LEICA MICROSYSTEMS

Inventor： GISKE ARNOLD ,  GUGEL HILMAR ,  DYBA MARCUS ,  SEIFERT ROLAND ,  WIDZGOWSKI BERND

IPC: G02B21/06 ,  G01N21/64 ,  G02B21/00 ,  G02B21/24

公开(公告)号：DE102008058068A1

公开(公告)日：2010-05-20

申请号：DE102008058068

申请日：2008-11-18

Applicant: LEICA MICROSYSTEMS

Inventor： SIEBER JOCHEN ,  DYBA MARCUS ,  SEYFRIED VOLKER

IPC: G01N21/64

Abstract: The device comprises a feeder device (4) for components (1,2) which are adjusted or regulated by the feeder device on the basis of a measurement data of the measurement parameter determined by a microscopic method. A microscope (5) is provided for determining the measurement data which is obtained by image analysis. The measurement parameter is intensity in a medium (3). An independent claim is included for a method for preparing a concentration of components in a fluid medium, particularly in a microscopic sample.

公开(公告)号：DE102006009833B4

公开(公告)日：2009-01-08

申请号：DE102006009833

申请日：2006-03-01

Applicant: LEICA MICROSYSTEMS

Inventor： DYBA MARCUS ,  GUGEL HILMAR

IPC: G01N21/64 ,  G02B21/00

Abstract: The process involves bringing a substance of a sample in a sample region to be detected in a condition. Another condition is induced by optical signals, and spatial limited partial regions within the sample region to be detected are omitted in a selective manner. The optical signal is provided such that a vertical wave (9) with defined intensity-zero is formed in the sample region to be detected, where the vertical wave is generated by focusing coherent light rays (10,11) in a pupil of an objective (13). The coherent light rays are provided by using glass fibers. An independent claim is also included for a microscope, in particular laser-raster-fluorescence microscope for spatial high resolution examination of samples.