Abstract:
A composition represented by the formula Si1nullxGexO2(1nully)N1.33y, wherein x is from about 0.05 to about 0.6 and y is from about 0.14 to about 0.74 exhibits properties highly suited for use in fabricating waveguides for liquid crystal based optical devices. In particular, the compositions have an index of refraction of from about 1.6 to about 1.8 for light at a wavelength of 1550 nm, and/or a coefficient of thermal expansion of from about 2.5null10null6null C.null1 to about 5.0null10null6null C. null1. The compositions also have inherently low hydrogen content, and a high hydrogen permeability which allows better hydrogen removal by thermal annealing to provide a material which exhibits low optical losses and better etching properties than alternative materials.
Abstract:
A composition represented by the formula Si1−xGexO2(1−y)N1.33y, wherein x is from about 0.05 to about 0.6 and y is from about 0.14 to about 0.74 exhibits properties highly suited for use in fabricating waveguides for liquid crystal based optical devices. In particular, the compositions have an index of refraction of from about 1.6 to about 1.8 for light at a wavelength of 1550 nm, and/or a coefficient of thermal expansion of from about 2.5×10−6° C.−1 to about 5.0×10−6° C.−1. The compositions also have inherently low hydrogen content, and a high hydrogen permeability which allows better hydrogen removal by thermal annealing to provide a material which exhibits low optical losses and better etching properties than alternative materials.
Abstract:
PROBLEM TO BE SOLVED: To provide quartz glass used for semiconductor manufacture and having excellent corrosion resistance to plasma, a quartz glass tool, a method of manufacturing the quartz glass, mixed quartz powder suitably used for the manufacture of the quartz glass and a method of manufacturing the mixed quartz powder. SOLUTION: The quartz glass contains 0.1 to 20 mass% in total of two or more of dope elements. The dope element contains one or more of first elements selected from the group composed of N, C and F and one or more of second elements selected from the group composed of Mg, Ca, Sr, Ba, Sc, Y, Ti, Zr, Hf, lanthanoids, and actinoids. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
A new material is provided that can be used for the fabrication of planar optical waveguides. The material includes silicon, oxygen and nitrogen and additionally deuterium. Also provided is a method for fabricating planar optical waveguides based on this new material, which uses deuterated gaseous precursors.
Abstract:
Die Erfindung geht von einem optischen Bauteil aus synthetischem Quarzglas zur Verwendung in der ArF-Excimerlaser-Lithographie mit einer Einsatzwellenlänge von 193 nm aus, mit einer Glasstruktur im Wesentlichen ohne Sauerstoffdefektstellen, einem Wasserstoffgehalt im Bereich von 0,1 x 10 16 Molekülen/cm 3 bis 1,0 x 10 18 Molekülen/cm 3 und einem Gehalt an SiH-Gruppen von weniger als 2 x 10 17 Molekülen/cm 3 und mit einem Gehalt an Hydroxylgruppen im Bereich zwischen 0,1 und 100 Gew.-ppm, wobei die Glasstruktur eine fiktive Temperatur von weniger 1070 °C aufweist. Um ausgehend von einer Messung des Kompaktierungsverhaltens bei einer Messwellenlänge von 633 nm eine verlässliche Prädiktion zum Kompaktierungsverhalten beim Einsatz mit UV-Laserstrahlung der Einsatzwellenlänge ermöglicht, wird eine Ausgestaltung des optischen Bauteil vorgeschlagen, bei der es auf Bestrahlung mit Strahlung einer Wellenlänge von 193 nm mit 5x10 9 Pulsen mit einer Pulsbreite von 125 ns und einer Energiedichte von jeweils 500µJ/cm 2 sowie einer Pulswiederholfrequenz von 2000 Hz mit einer laserinduzierten Brechzahländerung reagiert, deren Betrag bei Vermessung mit der Einsatzwellenlänge von 193 nm einen ersten Messwert M 193nm und bei Vermessung mit einer Messwellenlänge von 633 nm einen zweiten Messwert M 633nm ergibt, wobei gilt: M 193nm /M 633nm
Abstract:
To provide an optical component of quartz glass for use in a projection objective for immersion lithography at an operating wavelength below 250 nm, which component is optimized for use with linearly polarized UV laser radiation and particularly with respect to compaction and birefringence induced by anisotropic density change, it is suggested according to the invention that the quartz glass should contain hydroxyl groups in the range of from 1 wtppm to 60 wtppm and chemically bound nitrogen, and that the mean hydrogen content of the quartz glass should be in the range of 5 x 10 15 molecules/cm 3 to 1 x 10 17 molecules/cm 3 .
Abstract translation:为了提供石英玻璃的光学部件,用于在250nm以下的工作波长下用于浸没式光刻的投影物镜,该成分被优化用于线偏振UV激光辐射,特别是关于由各向异性密度变化引起的压实和双折射 根据本发明,建议石英玻璃应含有1wt%至60wtppm的羟基和化学键合的氮,并且石英玻璃的平均氢含量应在5×10 分子/ cm 3至1×10 17分子/ cm 3以上。
Abstract:
The present invention relates to increasing the photosensitivity of optical fibers. One aspect of the present invention comprises a method for rapidly diffusing hydrogen or deuterium into an optical fiber from a gas mixture having a low total hydrogen content to generate changes in the refractive index of the optical fiber. The resulting photosensitive fiber may be used to create optical devices including Bragg gratings and Bragg grating-based devices.
Abstract:
The invention relates to a method for the production of opaque quartz glass wherein a blank is made from synthetic SiO2 crystals and heated to form a blank body made of opaque quartz glass at a given vitrification temperature. A method for the production of pure, opaque quartz glass is disclosed wherein said quartz glass has a homogeneous pore distribution and a high density, a high viscosity and a lower tendency to devitrify. According to the invention, the SiO2 crystals are formed from an at least partially porous agglomerate of SiO2 primary particles (21; 31) having a specific surface (according to BET) between 1.5 m /g and 40 m /g with a stamping density of at least 0.8 g/cm . SiO2 granulate (21; 31) suitable for use in performing the procedure is characterized in that it is composed of an at least partially porous agglomerate of SiO2 primary particles and has a specific surface (according to BET) between 1.5 m /g and 40 m /g in addition to a stamping density of at least 0.6 g/cm .
Abstract:
Alkali-free glasses are disclosed having (in weight %) 50≦SiO2≦80%, 2≦Al2O3≦17%, 8≦B2O3≦36%, and greater than or equal to 2% and less than or equal to 25% of at least one of CaO, MgO, BaO, SrO or ZnO. The alkali-free glasses can have a surface layer with greater than 0.2 weight % N. Such alkali-free glasses are achieved by nitriding processes and exhibit increased strength, scratch resistance and chemical durability.
Abstract translation:公开了无碱玻璃,其具有(重量%)50%nEE,SiO 2,nEE,80%,2E nE,Al 2 O 3,nEE,17%,8&nE; B 2 O 3&nE; 36%,以及大于或等于2%且小于或等于25% CaO,MgO,BaO,SrO或ZnO中的至少一种。 无碱玻璃可以具有大于0.2重量%N的表面层。这样的无碱玻璃通过氮化过程实现并且表现出增加的强度,耐刮擦性和化学耐久性。