公开(公告)号：WO2009136901A1

公开(公告)日：2009-11-12

申请号：PCT/US2008/012931

申请日：2008-11-20

Applicant: J.A. WOOLLAM CO., INC.

Inventor： HE, Ping ,  HALE, Jeffrey, S. ,  PFEIFFER, Galen, L. ,  LIPHARDT, Martin, M.

IPC: G05B19/04

CPC classification number: G01N21/211 ,  G01J4/00 ,  G01N2021/213

Abstract: A sample investigation system (ES) in functional combination with an alignment systen (AS), and methodology of enabling very fast, (eg. seconds), sample height, angle-of-incidence and plane-of -incidence adjustments, with application in mapping ellipsometer or the like systems.

Abstract translation: 与对准系统（AS）的功能组合的样本调查系统（ES）以及启用非常快速（例如秒），样本高度，入射角和准确度调整的方法，应用于 映射椭偏仪等。

公开(公告)号：WO2008114148A3

公开(公告)日：2009-02-12

申请号：PCT/IB2008001285

申请日：2008-03-25

Applicant: UNIV PASTEUR ,  CENTRE NAT RECH SCIENT ,  FORSVARETS FORSKNINGS ,  EBBESEN THOMAS ,  SKAULI TORBJORN

Inventor： EBBESEN THOMAS ,  SKAULI TORBJORN

IPC: G01N21/55 ,  G02B5/18 ,  G02B6/122 ,  G02B27/00 ,  G03F1/00 ,  G03F7/00

CPC classification number: G02B5/008 ,  B82Y20/00 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0224 ,  G01J3/0256 ,  G01J3/18 ,  G01J4/00 ,  G01N21/21 ,  G01N21/554 ,  G02B6/1226 ,  G02B6/32

Abstract: The present invention concerns a device for sorting and concentrating electromagnetic energy impinging a surface of said device, said surface comprising at least one plasmonics-based surface structure or similar structure of periodic or quasi-periodic surface topography. Device characterised in that said surface (V) is provided with at least two such surface structures (2), acting as individual concentrator structures, which are at least partially spatially overlapped or superposed.

Abstract translation: 本发明涉及一种用于分选和集中照射所述装置的表面的电磁能的装置，所述表面包括至少一种基于等离子体激元的表面结构或周期性或准周期性表面形貌的类似结构。 装置的特征在于，所述表面（V）设置有至少两个这样的表面结构（2），其作为单独的集中器结构，其至少部分地在空间上重叠或重叠。

公开(公告)号：WO2008114148A2

公开(公告)日：2008-09-25

申请号：PCT/IB2008/001285

申请日：2008-03-25

Applicant: UNIVERSITE LOUIS PASTEUR ,  CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE ,  FORSVARETS FORSKNINGSINSTITUTT ,  EBBESEN, Thomas ,  SKAULI, Torbjorn

Inventor： EBBESEN, Thomas ,  SKAULI, Torbjorn

CPC classification number: G02B5/008 ,  B82Y20/00 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0224 ,  G01J3/0256 ,  G01J3/18 ,  G01J4/00 ,  G01N21/21 ,  G01N21/554 ,  G02B6/1226 ,  G02B6/32

Abstract: The present invention concerns a device for sorting and concentrating electromagnetic energy impinging a surface of said device, said surface comprising at least one plasmonics-based surface structure or similar structure of periodic or quasi-periodic surface topography. Device characterised in that said surface (V) is provided with at least two such surface structures (2), acting as individual concentrator structures, which are at least partially spatially overlapped or superposed.

Abstract translation: 本发明涉及一种用于分选和集中照射所述装置的表面的电磁能的装置，所述表面包括至少一种基于等离子体激元的表面结构或周期性或准周期性表面形貌的类似结构。 装置的特征在于，所述表面（V）设置有至少两个这样的表面结构（2），其作为单独的集中器结构，其至少部分地在空间上重叠或重叠。

公开(公告)号：WO2008077839A1

公开(公告)日：2008-07-03

申请号：PCT/EP2007/064057

申请日：2007-12-17

Applicant: THALES HOLDINGS UK PLC ,  HAINING, Andrew ,  CRAIG, Robert

Inventor： HAINING, Andrew ,  CRAIG, Robert

IPC: G01J4/00 ,  G01J1/42 ,  G01J1/04 ,  G02B27/28

CPC classification number: G01J1/4228 ,  G01J1/04 ,  G01J1/0429 ,  G01J4/00 ,  G02B27/285 ,  H01L27/14658

Abstract: An imager comprising a detector (14) having at least one element sensitive to radiation having a first polarisation and at least one element sensitive to radiation having a second polarisation and means for simultaneously directing (12) from the same scene or point of a scene radiation of the first polarisation onto the first polarisation element and radiation of the second polarisation onto the second polarisation element. Preferably, the detector (14) consists of a two dimensional array of elements.

Abstract translation: 一种成像器，包括具有对具有第一偏振的辐射敏感的至少一个元件的检测器（14）和对具有第二极化的辐射敏感的至少一个元件以及用于从场景辐射的相同场景或点同时引导（12）的装置 第一偏振到第一偏振元件上的第二偏振和第二偏振的辐射到第二偏振元件上。 优选地，检测器（14）由二维阵列的元件组成。

公开(公告)号：WO2008019729A8

公开(公告)日：2008-05-29

申请号：PCT/EP2007005720

申请日：2007-06-28

Applicant: RWTH AACHEN ,  MAHLMANN DANIEL MARTIN

Inventor： MAHLMANN DANIEL MARTIN

IPC: G02B21/14 ,  G02B21/00

CPC classification number: G02B21/0056 ,  G01B9/0201 ,  G01B9/02011 ,  G01B9/02024 ,  G01B2290/70 ,  G01J4/00 ,  G01J9/02 ,  G02B21/14

Abstract: The invention relates to a microscope for transmitted light examination of objects, with a beam path between an illumination apparatus and an apparatus for viewing/detecting an object image, in particular a camera, in which an interferometer is arranged in the beam path, which interferometer has means for changing the polarization (4) and means, which are independent thereof, for changing the relative phase (6) in at least one of the partial beams (II) of the interferometer. The invention relates furthermore to a method for transmitted light microscopy of objects (8, 9), in which the beam path between an illumination apparatus (1) and an apparatus (15) for viewing/detecting an object image extends through an interferometer (II, III), with at least one image of an object (8, 9), in particular a series of images, being recorded using a camera (15), in particular as a function of a position of the polarization and/or of the phase of the light in at least one of the partial beams (II, III) of the interferometer.

Abstract translation: 本发明涉及一种用于具有照明装置和一个对象图像的观看/记录装置之间的光束路径中的物体的透射光检查的显微镜，特别是照相机，干涉仪被设置在在光路中，包括用于改变偏振（4）和独立的其 具有用于改变干涉仪的部分光束（II）中的至少一个中的相对相位（6）的装置。 本发明还涉及一种用于物体的透射光显微镜（8,9），其特征在于，照明装置之间的光路（1）和一个装置（15），用于通过干涉仪观看/对象图像的记录（II，III），其特征在于，至少在 一个对象的图像（8,9），特别是通过一个照相机（15）的一系列图像被接收，尤其是在依赖于偏振和/或光的部分光束中的至少一个的相位的位置（II，III）的 干涉。

公开(公告)号：WO2004053442A1

公开(公告)日：2004-06-24

申请号：PCT/IL2003/001028

申请日：2003-12-04

Applicant: KILOLAMBDA TECHNOLOGIES LTD. ,  NEVO, Doron ,  ORON, Ram ,  ORON, Moshe

Inventor： NEVO, Doron ,  ORON, Ram ,  ORON, Moshe

IPC: G01J4/00

CPC classification number: G02F1/3525 ,  G01J4/00

Abstract: There is provided an optical power switching device, including at least one plate made of transparent dielectric material, a thin, electrically conductive, metallic material coated on one side of the plate, wherein, upon being exposed to an optical power beam having a power level exceeding a predetermined threshold focused thereon, the layer of conductive material forms a plasma, damaging the dielectric material, thereby rendering the portion of the surface of the plate under the impinging beam opaque to light. A method for reducing or interrupting optical transmission in response to the transmission of excessive optical power or energy is also provided.

Abstract translation: 提供一种光功率开关装置，其包括由透明介电材料制成的至少一个板，涂覆在板的一侧上的薄的导电金属材料，其中，在暴露于具有功率水平的光功率光束 超过其上聚焦的预定阈值，导电材料层形成等离子体，损坏电介质材料，由此使板下表面的部分在入射光束下不透光。 还提供了用于响应于过度的光功率或能量的传输而减少或中断光传输的方法。

公开(公告)号：WO2003029770A1

公开(公告)日：2003-04-10

申请号：PCT/EP2002/010476

申请日：2002-09-18

Applicant: CARL ZEISS MICROELECTRONIC SYSTEMS GMBH ,  DOBSCHAL, Hans-Jürgen ,  MASCHKE, Gunter ,  BISCHOFF, Jörg

Inventor： DOBSCHAL, Hans-Jürgen ,  MASCHKE, Gunter ,  BISCHOFF, Jörg

IPC: G01J4/00

CPC classification number: G01J4/00 ,  G01J3/28 ,  G01N21/211 ,  G01N21/47

Abstract: Bei einer Messanordnung mit einer Optikeinrichtung, in die zur Messung ein von einer Probe ausgehendes, divergierendes Strahlenbündel (10) eingekoppelt wird, und weiter mit einem der Optikeinrichtung nachgeordneten Detektor (13), der eine Vielzahl von in einer Ebene angeordneten, unabhängig voneinander auswertbaren Detektorpixeln aufweist, wobei die Optikeinrichtung (11) das divergierende Strahlenbündel (10) in einer ersten Richtung quer zur Ausbreitungsrichtung des Strahlenbündels (10) spektral zerlegt und auf den Detektor (13) lenkt, parallelisiert die Optikeinrichtung das Strahlenbündel auch noch, bevor es auf den Detektor (13) trifft, in einer zweiten Richtung quer zur Ausbreitungsrichtung derart, dass in der zweiten Richtung benachbarte Strahlen des auf den Detektor (13) treffenden Strahlenbündels zueinander parallel verlaufen.

Abstract translation: 在用光学设备的测量装置，耦合到所述测量出射的发散的辐射束（10），并且还包括在平面中布置的多个光学系统的下游检测器（13），彼此独立地评价的检测器像素的样本 ，其中所述光学装置（11）在第一方向上横向于所述辐射光束（10）的传播方向分割发散光束（10）的光谱和到检测器（13）引导所述光学装置的并行化，光束仍然检测器之前 （13）施加，在第二方向上横向于所述传播方向，以便在所述检测器（13）上的相邻波束的第二方向上的每个撞击光束平行延伸。

公开(公告)号：WO0181949A3

公开(公告)日：2002-08-29

申请号：PCT/US0113489

申请日：2001-04-26

Applicant: ARETE ASSOCIATES ,  GLECKLER ANTHONY D

Inventor： GLECKLER ANTHONY D

IPC: G01J3/02 ,  G01J3/04 ,  G01J3/28 ,  G01J3/36 ,  G01J3/447 ,  G01J4/00 ,  G01J9/00 ,  G01J11/00 ,  G01N21/21 ,  G01N21/31 ,  G01N21/64 ,  G01S7/481 ,  G01S17/89 ,  G04F13/02

CPC classification number: G01J3/02 ,  G01J3/0218 ,  G01J3/0229 ,  G01J3/0256 ,  G01J3/0294 ,  G01J3/04 ,  G01J3/2803 ,  G01J3/2823 ,  G01J3/2889 ,  G01J3/36 ,  G01J3/447 ,  G01J4/00 ,  G01J9/00 ,  G01J11/00 ,  G01N21/21 ,  G01N21/31 ,  G01N21/6408 ,  G01N21/6456 ,  G01N2021/1793 ,  G01N2021/6417 ,  G01N2021/6423 ,  G01S7/481 ,  G01S7/4817 ,  G01S17/89 ,  G04F13/02 ,  G04F13/026 ,  H01J43/00

Abstract: Plural electronic or optical images are provided in a streak optical system, as for instance by use of plural slits instead of the conventional single slit, to obtain a third, fourth, etc. dimension - rather than only the conventional two, namely range or time and azimuth. Such additional dimension or dimensions are thereby incorporated into the optical information that is to be streaked and thereby time resolved. The added dimensions may take any of an extremely broad range of forms, including wavelength, polarization state, or one or more spatial dimensions - or indeed virtually any optical parameter that can be impressed upon a probe beam. Resulting capabilities remarkably include several new forms of lidar spectroscopy, fluorescence analysis, polarimetry, spectropolarimetry, and combinations of these, as well as a gigahertz wavefront sensor.

Abstract translation: 在条纹光学系统中提供多个电子或光学图像，例如通过使用多个狭缝而不是传统的单个狭缝来获得第三，第四等尺寸，而不是仅仅是传统的两个，即范围或时间 和方位角。 因此，这样的附加尺寸或尺寸被并入要划线的光学信息中，从而被时间分辨。 增加的尺寸可以采用非常宽的范围的范围，包括波长，偏振状态或一个或多个空间维度，或实际上实际上可以施加到探测光束上的任何光学参数。 所产生的功能显着地包括激光雷达光谱，荧光分析，偏振测量，分光偏振测量及其组合的几种新形式，以及千兆赫兹波前传感器。

公开(公告)号：WO02054028A2

公开(公告)日：2002-07-11

申请号：PCT/US2001/049624

申请日：2001-12-28

IPC: G01J4/00

CPC classification number: G01J4/00

Abstract: Apparatus (1200, 1300) and accompanying methods to visualize and calculate, by direct visual measurement and interpolation, polarized light, in the form of sphere (observable polarization sphere - OPS) along with its associated spherical coordinate system consisting of latitudes and longitudes, which maps transformation of the state(s) of polarization (SOP) of an optical beam that propagates through either a single optical device (generally a "media) or a series of optical devices (mediums), e.g., phase shifters (waveplates, compensators), attenuators (polarizers), and field rotators. The OPS can be used to calculate and display phase shifting of the polarization state of an optical beam as it propagates through each such polarizing media. The OPS describes the behavior of a rotated ideal linear polarizer on a propagating polarized optical beam, as well as polarized light in many regions of the electro-magnetic spectrum.

Abstract translation: 装置（1200,1300）以及通过直接视觉测量和内插来以球体（可观察极化球 - OPS）的形式可视化和计算偏振光的装置（1200,1300）及其相关的由纬度和经度组成的球面坐标系， 映射通过单个光学器件（通常为“介质”）或一系列光学器件（介质）（例如移相器（波片，补偿器））传播的光束的偏振状态（SOP）的变换， ，衰减器（偏振器）和场旋转器，OPS可用于计算和显示光束在通过每个这样的偏振介质时传播的偏振态的相移，OPS描述旋转的理想线性偏振器的行为 传播偏振光束以及电磁光谱的许多区域中的偏振光。

公开(公告)号：WO01053786A1

公开(公告)日：2001-07-26

申请号：PCT/US2001/000504

申请日：2001-01-08

IPC: G01J4/00 ,  G01N21/21

CPC classification number: G01J4/00 ,  G01N21/211

Abstract: An improved ellipsometry method and a self-correcting simultaneous multiple angle/multiple wavelength return path ellipsometer (20) are disclosed which allow for simultaneous measurement at multiple angles of incidence in a manner which permits separation of instrument error from the measured properties. Non-sample optical system ellipsometric effects of the ellipsometer are measured and the measured changes in polarization state are corrected to eliminate errors introduced thereby. The disclosed embodiment is self-correcting by way of a convex reflector (6) which can be inserted into and removed from the optical path of the beam of polarized light between a focusing optic (5) and the sample optical system (7) under study. The convex reflector (6) when inserted into the optical path causes the light rays of the beam of polarized light in each of the plurality of angles of incidence to retrace its path through the focusing optic (5) for detection by a detector array (10) without undergoing reflection and re-reflection as during a sample measurement configuration of the ellipsometer (20) is removed from the optical path.

Abstract translation: 公开了一种改进的椭圆偏振方法和自校正同时多角度/多波长返回路径椭偏仪（20），其允许以允许将仪器误差与所测量的属性分离的方式以多个入射角同时进行测量。 测量椭圆光度计的非样本光学系统椭圆效应，并校正测量的极化状态变化，以消除由此引入的误差。 所公开的实施例通过凸面反射器（6）进行自校正，所述凸形反射器可以在被研究的聚焦光学器件（5）和样品光学系统（7）之间插入和偏离偏振光束的光路。 。 凸状反射体（6）当插入到光路中时，多个入射角中的每一个中的偏振光束的光线回扫其通过聚焦光学元件（5）的路径，以便由检测器阵列（10 ），而不会像在椭圆偏振仪（20）的样品测量配置期间从光路中移除反射和再反射。