公开(公告)号：FR2777113B1

公开(公告)日：2000-05-05

申请号：FR9804177

申请日：1998-04-03

Applicant: COMMISSARIAT ENERGIE ATOMIQUE

Inventor： BAPTIST ROBERT ,  BRUEL MICHEL

IPC: H01J33/02 ,  H01J33/00 ,  H01J33/04 ,  H01J29/48 ,  H01J1/30

公开(公告)号：FR2775797B1

公开(公告)日：2000-03-31

申请号：FR9802622

申请日：1998-03-04

Applicant: COMMISSARIAT ENERGIE ATOMIQUE

Inventor： BRUEL MICHEL ,  BAPTIST ROBERT

IPC: G03F7/20 ,  H01J37/317 ,  G01B9/02 ,  G02B5/28

公开(公告)号：DE69508804T2

公开(公告)日：1999-10-21

申请号：DE69508804

申请日：1995-01-09

Applicant: COMMISSARIAT ENERGIE ATOMIQUE

Inventor： BAPTIST ROBERT

IPC: G01L21/34 ,  H01J41/06

公开(公告)号：DE69508804D1

公开(公告)日：1999-05-12

申请号：DE69508804

申请日：1995-01-09

Applicant: COMMISSARIAT ENERGIE ATOMIQUE

Inventor： BAPTIST ROBERT

IPC: G01L21/34 ,  H01J41/06

公开(公告)号：FR2764699A1

公开(公告)日：1998-12-18

申请号：FR9707341

申请日：1997-06-13

Applicant: COMMISSARIAT ENERGIE ATOMIQUE

Inventor： BAPTIST ROBERT

IPC: G01N27/62 ,  G01N21/62 ,  H01J49/04 ,  H01J49/26 ,  G01N27/64 ,  H01J49/40

公开(公告)号：DE69205094T2

公开(公告)日：1996-05-09

申请号：DE69205094

申请日：1992-07-21

Applicant: COMMISSARIAT ENERGIE ATOMIQUE

Inventor： BAPTIST ROBERT ,  PY CHRISTOPHE

IPC: G01L21/30 ,  G01L21/34

公开(公告)号：DE3272985D1

公开(公告)日：1986-10-09

申请号：DE3272985

申请日：1982-05-06

Applicant: COMMISSARIAT ENERGIE ATOMIQUE

Inventor： BAPTIST ROBERT ,  CHAUVET GERARD

IPC: G01N23/225 ,  H01J37/252

Abstract: The invention relates to an apparatus for determining the electron states of a material. This apparatus comprises an enclosure containing a material, means for producing electrons of energy Ei such, that on then penetrating the material, they acquire an energy Ef below Ei, accompanied by an emission of photons having different wavelengths. The apparatus also comprises another enclosure equipped with a tube entering the vacuum enclosure and provided with an entrance slit and another tube provided with a regulatable exit slit. The apparatus also comprises a grating located in the other enclosure and etched with lines, whilst being able to rotate about an axis parallel to these lines in order to select photons of the same wavelength. The apparatus finally has means for detecting the selected photons. Application to the determination of the forbidden band of a semiconductor.