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公开(公告)号:DE102006009833A1
公开(公告)日:2007-09-06
申请号:DE102006009833
申请日:2006-03-01
Applicant: LEICA MICROSYSTEMS
Inventor: DYBA MARCUS , GUGEL HILMAR
Abstract: The process involves bringing a substance of a sample in a sample region to be detected in a condition. Another condition is induced by optical signals, and spatial limited partial regions within the sample region to be detected are omitted in a selective manner. The optical signal is provided such that a vertical wave (9) with defined intensity-zero is formed in the sample region to be detected, where the vertical wave is generated by focusing coherent light rays (10,11) in a pupil of an objective (13). The coherent light rays are provided by using glass fibers. An independent claim is also included for a microscope, in particular laser-raster-fluorescence microscope for spatial high resolution examination of samples.
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公开(公告)号:DE102006011556A1
公开(公告)日:2007-03-29
申请号:DE102006011556
申请日:2006-03-10
Applicant: LEICA MICROSYSTEMS
Inventor: GUGEL HILMAR
IPC: G01N21/64
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公开(公告)号:DE102005013116A1
公开(公告)日:2006-10-05
申请号:DE102005013116
申请日:2005-03-18
Applicant: LEICA MICROSYSTEMS
Inventor: GUGEL HILMAR , SEYFRIED VOLKER
Abstract: The invention relates to a phase filter (1) for a light beam in a microscope, particularly for STED microscopy, which has at least one first section (18) and at least one second section (19) that is complementary to the at least one first section (18). Light interacting with the at least one first section (18) and light interacting with the at least second section (19) have, after the interaction, phases that differ by 180°. The phase filter is designed and improved with regard to a particularly high resolution of a microscope operated with the phase filter (1). To this end, the sections (18, 19) are arranged relative to one another so that they are axially symmetric in a complementary manner along a first axis (20), whereby the symmetry of the at least one first section (18) transitions into its complementary at least one second section (19), and that they are mirror symmetric along an axis (21) perpendicular to the first axis (20), or that the sections (18, 19) are arranged relative to one another so that they are rotationally symmetric in a complementary manner with regard to a rotation of 360°/(2*n) with n>2 about the axis of rotation (22), whereby a rotation of this type causes the at least one first section (18) to transition into its complementary at least one second section (19).
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公开(公告)号:DE10347712A1
公开(公告)日:2005-05-12
申请号:DE10347712
申请日:2003-10-14
Applicant: LEICA MICROSYSTEMS
Inventor: GUGEL HILMAR
Abstract: In a scanning microscope that impinges upon a sample with a first light pulse and a second light pulse, a dispersive medium that modifies the time offset between the first and the second light pulse is provided in the beam path of at least one of the light pulses.
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公开(公告)号:GB2372897B
公开(公告)日:2003-06-25
申请号:GB0200165
申请日:2002-01-04
Applicant: LEICA MICROSYSTEMS
Inventor: GUGEL HILMAR , BEWERSDORF JOERG , HELL STEFAN W
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公开(公告)号:DE10100247A1
公开(公告)日:2002-07-11
申请号:DE10100247
申请日:2001-01-05
Applicant: LEICA MICROSYSTEMS
Inventor: BEWERSDORF JOERG , GUGEL HILMAR
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公开(公告)号:DE112010004624A5
公开(公告)日:2012-11-15
申请号:DE112010004624
申请日:2010-11-30
Applicant: LEICA MICROSYSTEMS
Inventor: GISKE ARNOLD , GUGEL HILMAR , DYBA MARCUS , SEIFERT ROLAND , WIDZGOWSKI BERND
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公开(公告)号:DE102006009833B4
公开(公告)日:2009-01-08
申请号:DE102006009833
申请日:2006-03-01
Applicant: LEICA MICROSYSTEMS
Inventor: DYBA MARCUS , GUGEL HILMAR
Abstract: The process involves bringing a substance of a sample in a sample region to be detected in a condition. Another condition is induced by optical signals, and spatial limited partial regions within the sample region to be detected are omitted in a selective manner. The optical signal is provided such that a vertical wave (9) with defined intensity-zero is formed in the sample region to be detected, where the vertical wave is generated by focusing coherent light rays (10,11) in a pupil of an objective (13). The coherent light rays are provided by using glass fibers. An independent claim is also included for a microscope, in particular laser-raster-fluorescence microscope for spatial high resolution examination of samples.
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公开(公告)号:DE102006047816A1
公开(公告)日:2008-04-17
申请号:DE102006047816
申请日:2006-10-07
Applicant: LEICA MICROSYSTEMS
Inventor: GUGEL HILMAR
IPC: G01N21/64
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公开(公告)号:DE10311440A1
公开(公告)日:2004-09-23
申请号:DE10311440
申请日:2003-03-15
Applicant: LEICA MICROSYSTEMS
Inventor: BEWERSDORF JOERG , GUGEL HILMAR
IPC: G02B21/00
Abstract: A 4Pi microscope (1) optical length equalization procedure converts the path length difference into simultaneous wavelength specific spatial intensity distributions by tilting the phase plane using a deflecting reflector (35, 43) and objective (37, 45) movement, samples and detects (59) them and equalizes the path length by systematic variation of the interferometer arm lengths (13, 15) using tilting plate or glass wedge pair (47). Includes INDEPENDENT CLAIMs for a 4Pi optical microscope using the procedure.
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