公开(公告)号：DE69325027T2

公开(公告)日：1999-09-16

申请号：DE69325027

申请日：1993-12-02

Applicant: ST MICROELECTRONICS SRL ,  CONS RIC MICROELETTRONICA

Inventor： SCACCIANOCE SALVATORE ,  PALARA SERGIO ,  AIELLO NATALE

IPC: G05F3/30

Abstract: A bandgap voltage reference circuit employs a Vbe voltage multiplier network in a feedback line of an output amplifier of the bandgap reference circuit, thus permitting to independently fix the output voltage that is produced and the temperature coefficient thereof. A voltage reference having a linear negative temperature coefficient in an extended temperature variation range may be obtained, starting from a bandgap reference voltage with a positive temperature coefficient.

公开(公告)号：DE69325027D1

公开(公告)日：1999-06-24

申请号：DE69325027

申请日：1993-12-02

Applicant: ST MICROELECTRONICS SRL ,  CONS RIC MICROELETTRONICA

Inventor： SCACCIANOCE SALVATORE ,  PALARA SERGIO ,  AIELLO NATALE

IPC: G05F3/30

Abstract: A bandgap voltage reference circuit employs a Vbe voltage multiplier network in a feedback line of an output amplifier of the bandgap reference circuit, thus permitting to independently fix the output voltage that is produced and the temperature coefficient thereof. A voltage reference having a linear negative temperature coefficient in an extended temperature variation range may be obtained, starting from a bandgap reference voltage with a positive temperature coefficient.

公开(公告)号：DE69316627T2

公开(公告)日：1998-05-07

申请号：DE69316627

申请日：1993-11-29

Applicant: ST MICROELECTRONICS SRL ,  CONS RIC MICROELETTRONICA

Inventor： PALARA SERGIO ,  SUERI STEFANO

IPC: G01R31/26 ,  F02P3/05 ,  G01R19/165 ,  H03K17/08 ,  H03K17/64 ,  F02P3/04

Abstract: A diagnostic signal, indicative of the reaching of a predefined level, lower than a fixed maximum limit value, by the current flowing through a power transistor, is generated while employing a single comparator of a reference voltage with the voltage present across a sensing resistance, thus preventing problems arising from different offset characteristics of distinct comparators. By the use of current mirrors, the generation of a diagnostic signal when the current reaches a level that can be fixed very close to the limiting value, may be reliably triggered, irrespectively of the offset characteristic of the single comparator employed.