MIKROMECHANISCHE STRUKTUR
    32.
    发明申请
    MIKROMECHANISCHE STRUKTUR 审中-公开
    微机械结构

    公开(公告)号:WO2015189046A1

    公开(公告)日:2015-12-17

    申请号:PCT/EP2015/061943

    申请日:2015-05-29

    Inventor: BENDES, David

    Abstract: Mikromechanische Struktur (100), aufweisend: wenigstens einen elastisch deformierbaren ersten Bereich (10), der wenigstens abschnittsweise einen definiert piezoelektrisch dotierten zweiten Bereich (10a) aufweist; wenigstens einen vierten Bereich (30), in den die im zweiten Bereich (10a) generierten elektrischen Ladungen leitbar sind; und wenigstens einen mit dem zweiten und dem vierten Bereich (10a, 30) elektrisch verbundenen dritten Bereich (20), in welchem ein durchfließender elektrischer Strom in thermische Energie umwandelbar ist.

    Abstract translation: 具有至少一个可弹性变形的第一区域(10),其至少部分地限定一个压电掺杂的第二区(10a);微机械结构(100)包括 至少第四区域(30),其中,所述在所述第二区(10a)中产生的电荷被进行; 和至少一个电连接到所述第二和第四区(10a,30),第三区域(20),其中流过的电流可以被转换成热能。

    A METHOD OF DOPING AND APPARATUS FOR DOPING
    33.
    发明申请
    A METHOD OF DOPING AND APPARATUS FOR DOPING 审中-公开
    一种用于掺杂的方法和装置

    公开(公告)号:WO2009075650A1

    公开(公告)日:2009-06-18

    申请号:PCT/SG2008/000319

    申请日:2008-08-27

    Abstract: A method of doping at least one element in an array of elements on a substrate is disclosed. The method comprises providing at least one microfluidic channel passing from a first location external of the at least one element to a second location in fiuidic communication with the at least one element. A dopant fluid is passed through the at least one microfluidic channel to the at least one element for doping the at least one element. A corresponding apparatus is also disclosed.

    Abstract translation: 公开了一种在衬底上的元件阵列中掺杂至少一种元素的方法。 该方法包括提供至少一个从至少一个元件外部的第一位置通过至少与一个元件流体连通的第二位置的微流体通道。 掺杂剂流体通过至少一个微流体通道至至少一个元件以掺杂至少一个元件。 还公开了相应的装置。

    PSEUDO SOI PROCESS
    35.
    发明申请
    PSEUDO SOI PROCESS 审中-公开

    公开(公告)号:WO2019033036A1

    公开(公告)日:2019-02-14

    申请号:PCT/US2018/046324

    申请日:2018-08-10

    Applicant: KIONIX, INC.

    Inventor: HELLER, Martin

    Abstract: A method of processing a semiconductor substrate having a first conductivity type includes, in part, forming a first implant region of a second conductivity type in the semiconductor substrate where the first implant region is characterized by a first depth, forming a second implant region of the first conductivity type in the semiconductor substrate where the second implant region is characterized by a second depth smaller than the first depth, forming a porous layer within the semiconductor substrate where the porous layer is adjacent the first implant region, and growing an epitaxial layer on the semiconductor substrate thereby causing the porous layer to collapse and form a cavity.

    MICROMECHANICAL STRUCTURE
    40.
    发明申请

    公开(公告)号:US20170225943A1

    公开(公告)日:2017-08-10

    申请号:US15317646

    申请日:2015-05-29

    Inventor: David Bendes

    Abstract: A micromechanical structure is described, including: at least one elastically deformable first area, which includes a defined piezoelectrically doped second area, at least in sections; at least one fourth area, into which the electrical charges generated in the second area may be conducted; and at least one third area connected electrically to the second and fourth area, in which an electrical current flowing through is convertible into thermal energy.

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